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הפקולטה למדעי ההנדסה Faculty of Engineering Sciences Lecture Contents • • • • • Introduction SRAM Overview Novel SRAM bitcell Test Chip Architecture Summary Introduction 6T SRAM Bitcell Design Architecture Summary Memory Classification Memory is classified by 4 major categories Volatility, Access Speed, Capacity and Cost Introduction 6T SRAM Bitcell Design Volatile Non Volatile SRAM DRAM REGISTER CACHE FLASH EEPROM HARD DISK Architecture Summary Motivation & Goal • Minimum energy point in digital circuits is achieved at subthreshold voltages (Vdd < Vt). • Low-voltage operation of SRAM memories in the subthreshold region offers substantial power and energy savings at the cost of speed. • This project focuses on the design and implementation of a novel SRAM bitcell for use in the subthreshold region. Introduction 6T SRAM Bitcell Design Architecture Summary SRAM OVERVIEW Introduction 6T SRAM Bitcell Design Architecture Summary Overview Bistability Principle (Q, QB) Differential Read (Sense Amp) Fast Access Speeds (read, write) Differential Write Large Noise Margins Large Area (6 transistors) Prechargable Bitlines Power Consuming Introduction 6T SRAM Bitcell Design Architecture Summary Bistability – Butterfly Curve • Positive feedback creates two stable points “1” and “0”. • Regenerative property ensures a noisy cell converges back to nominal values. Introduction 6T SRAM Bitcell Design Architecture Summary SRAM – Read Access 1. 2. 3. 4. Bitlines (BL, BL’) are precharged to VDD Wordline signal (WL) is asserted One of the bitlines is pulled down toward GND. Differential signal (BL-BL’) is amplified to accelerate the process. WL V DD M4 BL Q= 0 M5 V DD M1 Q= 1 V DD Cbit Introduction BL M6 V DD Cbit 6T SRAM Bitcell Design Architecture Summary SRAM – Write Access 1. Bitlines are precharged to complementary values. 2. Worldline signal (WL) is asserted. 3. Q is pulled down to GND while Q’ is driven to VDD. WL V DD M4 M5 M6 Q= 0 Q= 1 M1 V DD BL = 1 Introduction 6T SRAM BL = 0 Bitcell Design Architecture Summary SRAM – Subthreshold Challenges • In general, ratioed digital circuits are more likely to fail in subthreshold voltages. • 6T Bitcells cannot operate below 600mV – 700mV. • Read SNM problem - degraded read noise margins decrease bitcell stability. • Write fails under 600mV due to the increase of the pMOS drive in sub-threshold. Introduction 6T SRAM Bitcell Design Architecture Summary NOVEL 9T SRAM BITCELL Introduction 6T SRAM Bitcell Design Architecture Summary The Research Work • Numerous novel low-power SRAM memories have been proposed in recent years. • We studied and analyzed many of the important proposals which include : 6T, 7T, 8T, 9T, 10T bitcells, Virtual VDD, Virtual GND, DCVSL, Voltage Boost, Read Buffer, Read Assist, Voltage Boost, and more ……. Introduction 6T SRAM Bitcell Design Architecture Summary Brain Storming Introduction 6T SRAM Bitcell Design Architecture Summary Major Achievements • Two innovative SRAM 9T bitcells, named PSRAM and SFSRAM , aimed at eliminating static power consumption and operated in the subthreshold region were fully designed and analyzed. • Three types of 8-kb 40 nm SRAM test chips, nicknamed RAMBO, were designed for operation at 600mV and below. • We are the first academic research team in Israel to fully design and fabricate a state-of-the-art 40nm CMOS silicon chip. Introduction 6T SRAM Bitcell Design Architecture Summary Chip Design Workflow MC Functionality Simulations MC Performance Tests MC optimizations Full Chip(8-kb Array) Layout Test Chip Architecture Design MC layout Post Layout Simulations TAPEOUT! Introduction 6T SRAM Bitcell Design Architecture Summary Standard 8T – Schematic and Layout NWELL WBL RBL WBLB GND WBL_ WBL Schematic Stick Diagram of a of standard a standard 8T SRAM 8T SRAM bitcell bitcell VDD GND PQ PQ_ WWL Q NQ WBLB TQ TQB WBL QB VVDD Q VVDD TQ_ TQ Q Q WWL QB GND RWL VDD QB NFB Q PQ RBL NRB QB Q NQ Q_ QB VVDD NQ_ NQB QB Q PQB QB NFB VDD NRWL QB RWL RWL NRWL RBL RB WWL RB WWL_ Q NRB Introduction 6T SRAM Bitcell Design Architecture Summary Pseudo SRAM (PSRAM) Pseudo static behavior - A novel bitcell mechanism disposes of both data node charges while holding a logical “1”. Leakage current is practically eliminated during this low-power standby mode. Up to 3.75X less static power consumption than a standard 8T cell at 0.9V. Introduction 6T SRAM Bitcell Design Architecture Summary PSRAM – Write “1” Operation CLK synchronizes write access [V] CLK [V] WWL time(s) [V] Q,QB time(s) [V] WBL, WBLB time(s) 1.1 0.0 0.6 Write wordline (enable) is asserted 0.0 Q is driven to “1” and QB to “0” Q is discharged to during standby 0.6 0.0 0.6 WBL is driven to “1” and WBLB to “0” 0 time(s) Introduction 6T SRAM Bitcell Design Architecture Summary PSRAM – Power Reduction Data node Holdvoltages “1" Standby “0" at process Powercorners 16.0 6.00 200 (Normalized) Power Leakage (Normalized) Power Leakage 1.35X 12.0 150 3.75X Q, QB [mV] 4.00 8.0 100 2.00 4.0 2.5X 50 0 SS 0.00 0.0 0.4 V SF 0.5 V FS 0.6 V FF 0.7 V TT 0.8 V 0.9 V PSRAM Q T8 QB SFSRAM Introduction 6T SRAM Bitcell Design Architecture Summary SFSRAM (Supply Feedback SRAM) Enables subthreshold write with a VirtualVDD technique – weakening the Supply VDD during write operation. A new approach for the design of the VirtualVDD scheme reduces periphery and thus, reduces write power. Operates at ultra-low voltages, down to 200mV. Introduction 6T SRAM Bitcell Design Architecture Summary Standard 8T – Revisited NWELL WBL RBL WBLB GND WBL_ WBL Schematic Stick Diagram of a of standard a standard 8T SRAM 8T SRAM bitcell bitcell VDD GND PQ PQ_ WWL Q NQ WBLB TQ TQB WBL QB VVDD Q VVDD TQ_ TQ Q Q WWL QB GND RWL VDD QB NFB Q PQ RBL NRB QB Q NQ Q_ QB VVDD NQ_ NQB QB Q PQB QB NFB VDD NRWL QB RWL RWL NRWL RBL RB WWL RB WWL_ Q NRB Introduction 6T SRAM Bitcell Design Architecture Summary SFSRAM – Power Reduction Hold “1" Standby Power 16.0 Leakage Power (Normalized) 12.0 3.75X 8.0 2.5X 4.0 0.0 0.4 V 0.5 V 0.6 V PSRAM Introduction 6T SRAM 0.7 V 8T 0.8 V 0.9 V SFSRAM Bitcell Design Architecture Summary 40NM TEST CHIP Introduction 6T SRAM Bitcell Design Architecture Summary GND CLK VDD WR2SRAM RD2SRAM DIN2SRAM[31:0] RD DIN[31:0] CLK DVDD DVSS CLK DVDD DVSS SVDD VDD DVDD SVDD WR GND CLK GND CLK CLK DVDD 32 x Precharge + Write Driver Units WBL[31:0] WBLB[31:0] 32 WBL[31:0] GND SVDD PC 32 WBLB[31:0] PC WWL[63:0] WWL[63:0] WWL[63:0] WWL[63:0] RWL[63:0] RWL[63:0] RWL[63:0] 256 RWL[63:0] WWL [255:0] 256 RWL [255:0] Level Shifting Wordline Drivers x256 WL [255:0] 256 DVSS GND CS CS CS2SRAM RD WL_out [255:0] ADD_in[7:0] 7 Row Decoder (8 :256) ADD2SRAM[7:0] Block 0 SVDD SVDD SRAM Array 64x32 RBL[31:0] RBL[31:0] RBL[31:0] RBL[31:0] 32 RBL[31:0] 32 x Sensing Unit + Level Shifter DOUT[31:0] CLK DVDD GND SVDD 32 SRAM2DOUT[31:0] PASS_FAIL DOUT[31:0] 32 DOUT[31:0] Introduction 6T SRAM CLK DVDD DVSS SVDD Block 3 Block 2 Block 1 RD WR DATA[31:0] 32 ADD[7:0] 8 ADD[7:0] BIST_CNTRL BIST WR 8-kb Array Read-Bitline division Level Shifters Row Decoder Sense-Amps Precharge Units Write Drivers BIST DIN[31:0] 32 CS • • • • • • • • CLK DVDD DVSS Chip Architecture Bitcell Design Architecture Summary CLK DVDD DVSS SVDD 40nm Test Chip - Periphery RBL_1 SA SVDD GND SVDD GND SA RBL_0 DVDD DATA OUT DATA IN SA SVDD SVDD ENABLE GND RBL_4 SVDD GND SVDD SA GND GND ENABLE GND RBL_3 Schematic of Sensing Unit + Up Shifter WBL_L WBL_R RD CLK WL Selected SVDD DVDD SVDD Schematic of Write Driver DVDD SVDD GND WR RWL Selected CLK WWL Selected WL Selected Schematic of WL Driver + Down Shifter Introduction 6T SRAM Bitcell Design Architecture Summary 2.90 um 1.40 mm Test Chip Top Level Layout 1.40 mm Introduction 6T SRAM 1.40 um Bitcell Design Architecture Summary Chip Timing Diagrams CLK ADDR WR_DATA WR RD Selected WL Selected WWL Selected RWL Selected WBL Selected WBLB Selected RBL RD_DATA SRAM access is synchronized by a clock. Bitline Precharge, write driving and digital logic execute during the high phase and read/write take place during the low phase. Introduction 6T SRAM Bitcell Design Architecture Summary SUMMARY Introduction 6T SRAM Bitcell Design Architecture Summary Summary A fully functional 8-kb array was layed out and designed for the 40nm lp TSMC process. SFSRAM Memory successfully operates at subthreshold voltages - no additional periphery required. Additional power savings can be achieved in the PSRAM with a majority bit algorithm. Introduction 6T SRAM Bitcell Design Architecture Summary Summary – Continued PSRAM consumes up to 3.75X less static power than a standard 8T cell. We Are The first academic research team in Israel to fully design and fabricate a state-of-the-art 40nm chip. Introduction 6T SRAM Bitcell Design Architecture Summary Questions?? Chocolate Chip Digital Chip Introduction 6T SRAM Bitcell Design Architecture Summary