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Design Review AVI1005 A1 Sean Wang 2010/10/21 Item 1. 2. 3. 4. 5. 6. 7. 8. 9. Driver FET floor plans and layout sizes Bias Circuit Analysis with Equation Comparator Offset Analysis & Sensitivity to Tail Current Condition to Cause Initial Latch Problem & Solutions Hystersis Comparator to Replace Latch? Chip simulation results (open-loop simulation) Rbias, Raout Determine VDS (Derive Equation) Loss of Power MOSFET Meas System, in Particular Base Noise 1. Driver FET floor plans and layout sizes Iso-Asy-NMOS Asy-PMOS 1000 um 1000 um 820 um 780 um Floor Plan 85um x 245um Vcc GATE Pre-Driver PGND 180um x 250um 2. Bias Circuit Analysis with Equation I2 VB VGS 1 R2 R2 Vt R2 2I1 Vt Vvov R2 VDD ,min VGS 1 VGS 2 I1 R1 If VDD Variation [VVDD (VVDD VVDD R2 VVDD gmmn 2 R2 gmmn1 R1 )] /( R1 gmmn1 R2 ) 1 gmmn 2 R2 3.1 Comparator Offset Analysis & Sensitivity to Tail Current IMPD1 IMPD2 VSP1 VOUT VN VP Vth Avt W L M offrdn Vth pd 1, pd 2 2 2 2 2 2 g g m nc 2,nc 2 Vthnc 3,nc 4 g m pc1, pc 2 g mnc 1,mnc 2 Vth pc1, pc 2 m nc1, nc 2 Vthnc1, nc 2 g m pd 1, pd 2 g g g mpd 1, pd 2 mp 1, p 2 mnc 3, mnc 4 3.2 Comparator Offset Analysis & Sensitivity to Tail Current IMPD1 IMPD2 VSP1 VOUT VN VP T_Rise_ comp T_Fall_ comp ppg_r_comp ppg_f_comp ppg_r_totall ppg_f_totall Origin (nS) 6.87 6.94 56.98 126.70 282.40 106.20 Improve (nS) 6.52 5.49 49.09 18.20 145.10 119.80 4.1 Condition to Cause Initial Latch Problem & Solutions Problem A. 假如使用Latch的方式,則在上述情況下,會發生Initial Latch的情形 Rising time is too slow 4.2 Condition to Cause Initial Latch Problem & Solutions Solution A. 讓AOUT的Rising Time加快 B. 設計電源進來時產生Blanking Time,時間內不判斷Aout訊號,並導通POWERMOS Use for improve rising time High Side : PMOS Use for Blanking 5. Hystersis Comparator to Replace Latch? A. 考慮Drain電壓在DCM T3時會造成Ringing,使得AOUT = Vdrain x gm x Raout AOUT變化過大,因此使用Hysister無法解決此現象 B. 可考慮使用Latch或Blanking的方式,解決此問題 6. Chip simulation results (open-loop simulation) Zoon In VDRAIN dc 0.1V 7.1 Rext, Rint Determine VDS (Derive Equation) VB ,Q1 VCC I E ,Q1 Rext VCC VB ,Q1 I E ,Q1 Rext I E ,Q1 I E ,Q 2 I E ,Q 2 IS e VBC ,Q 1 / VT IS e VBE ,Q 2 / VT I E ,Q1 eVBE 2 / VT VBC ,Q 1 / VT e VCC VB ,Q1 VCC VB ,Q1 e VB ,Q1 / VT I E ,Q 2 Rext V e VB ,Q1 / VT /V Rext 2 VCC RINT (VB ,Q1 VDR ) / VT 3 e if VBE VB ,Q 2 0.7v, VCC 12V, R 10k e BC ,Q1 T VC ,Q1 I out Ron VDR VDR 8.97m v I E ,Q 2 VCC VB ,Q1 e VB ,Q1 / VT Rext eVB1 VDR / VT 8.1 Loss of Power MOSFET 8.2 Loss of Power MOSFET