Transcript 專題報告指導教授曾王道961428 陳映蓉961556 賴亭文

專題報告
指導教授 曾王道
961428 陳映蓉
961556 賴亭文
THE COMPITITION
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教育部主辦「九十八學年度大學校院積體電路電腦
輔助設計(CAD)軟體製作競賽」
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題目：定題組
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題目內容：Multi-Core ATPG
Ａ２組
ATPG
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acronym for both Automatic Test Pattern
Generation and Automatic Test Pattern
Generator
electronic design automation
method/technology
To find faulty circuit behaviors.
PARALLEL ATPG
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As the size and complexity of ICs continue to
grow, ATPG time is getting longer.
multi‐core processors to make Parallel ATPG
ATPG V.S. Parallel ATPG
GOAL
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develop an ATPG program
fast run time
 few generated patterns
 high fault coverage
 under the given multi‐core computing environment.
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FAULT COLLAPSING
FAULT COLLAPSING
EXAMPLE
THE RESULTS OF THE
EXAMPLE
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PI G0 PI
PI G7
0
1
1
0
1
0
1
1
0
0
0
0
1
0
0
1
1
0
G1 PI G2 PI G3 PI G5 PI G6
1
0
1
1
1
1
0
1
0
0
1
1
1
0
1
1
0
0
0
0
0
0
1
1
1
0
0
1
0
0
0
1
0
0
0
1
0
1
0
0
1
0
0
0
0
OUR INPLEMENTATION
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We use fork() to create a new process to
implement the multicore ATPG.
fork()
The fork() function shall create a new process.
 then we have a child process, and a parent process.
The two process would run by the same time to
implement the multicore ATPG.
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執行結果
THE END