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Meeting~ Ultraviolet band-pass photodetectors formed by Ga-doped ZnO contacts to n-GaN Postgraduate: K.H. Chang Advisor: M.L. Lee, J. K. Sheu Electro-Optical Semiconductor Device & Solid-State Lighting Lab Outline Experiment Process. Result and Discussions. - Characterization of GZO contact to n-GaN photodetector. Conclusion. Electro-Optical Semiconductor Device & Solid-State Lighting Lab Experiment Process Electro-Optical Semiconductor Device & Solid-State Lighting Lab Result and Discussions Schematic structure of GZO/n-GaN Schottky barrier PD. Electro-Optical Semiconductor Device & Solid-State Lighting Lab Result and Discussions Typical dark I-V characteristics of the n-GaN/GZO Schottky barrier PDs with LTG GaN cap layer. The inset shows the typical I-V characteristic measured from two adjacent Cr/Au metal contacts with spacing of 5 m. Electro-Optical Semiconductor Device & Solid-State Lighting Lab Result and Discussions Typical bias-dependent spectral response of the n-GaN/GZO Schottky barrier PDs. The inset shows the typical transmittance of GZO films annealed at different temperatures. Electro-Optical Semiconductor Device & Solid-State Lighting Lab Conclusions We have demonstrated a UV band-pass GaN Schottky barrier PD using a GZO top contact layer. With an unbiased condition, the peak responsivity was estimated to be 0.10 A/W at 365 nm, corresponding to the quantum efficiency of about 34%. When the reverse biases were below 10 V, the dark currents of the PDs were well below 30 pA. Electro-Optical Semiconductor Device & Solid-State Lighting Lab Thank you for your attention ! Electro-Optical Semiconductor Device & Solid-State Lighting Lab