Negative Bias Temperature Instability (NBTI) in pMOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (Part 1 of 3) Souvik Mahapatra Department of Electrical Engineering Indian.
Transcript Negative Bias Temperature Instability (NBTI) in pMOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (Part 1 of 3) Souvik Mahapatra Department of Electrical Engineering Indian.