Transcript Role of IBIS in EMC

IEC 47A – WG2 Toulouse – Nov 2007
Immunity Prediction of Integrated
Circuits using IC-EMC
Etienne SICARD, Alexandre BOYER
[email protected]
http://www.ic-emc.org
IEC 47A- WG2, 2007 – [email protected] - www.ic-emc.org
Credits



European project MEDEA+ “Parachute” (2005-2007)
European project PIDEA+ “EMCPack” (2006-2008)
French project Aerospace-Valley “EPEA” (2007-2010)
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
Summary
1. IC Immunity issues
2. What is IC-EMC
3. Susceptibility Prediction
4. Case Study – S12X
5. Conclusion
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
1. IC Immunity Issues
Application
More
interference
sources
Ultra-High
Frequencies
Very-High
Frequencies
Super High
Frequencies
Tremendously
High Frequencies
Multimedia
FM
DVB
GSM
DCS
UMTS
UWB
4.2-6.0 GHz
UNII band
(5.8GHz)
Wireless
Tire
Pressure
433 MHz
GPS
1.2 GHz
WiFi,
Bluetooth
2.45GHz
IEEE 802.11a
(5.4GHz)
Future RF
systems
Radars for
cruise control
24, 48, 66 GHz
Clock
data rate
PCA ?
100 MHz
Serial-ATA ?
1 GHz
Frequency
10 GHz
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
100 GHz
1. IC Immunity Issues
Supply voltage
10V
External voltage
90nm
0.25m
1V
45nm
0.18m 0.13m
32nm
22 nm
18 nm
65nm
Internal voltage
10% Noise margin
0.1V
Year
1995
2000
2005
2010
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
2015
1. IC Immunity Issues
Immunity level
very high
IC Customer request
Customer
pressure
high
medium
IC provider –
customer gap
IC perf with guidelines
R&D needed
10 dB
low
IC perf without guidelines
very low
2000
2005
2010
2015
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
2020
Technology
scale down
1. IC Immunity Issues
Immunity must be validated before fabrication
DESIGN
Architectural
Design
Tools
Models
Design Guidelines
Training
Design Entry
Design Architect
EMC Simulations
Compliance ?
NO GO
GO
17/07/2015
FABRICATION
EMC compliant
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
7
2. What is IC-EMC
A demonstrator for predicting EMC of integrated circuits

A simple tool dedicated to predict EMC of ICs
•
An electric circuit schematic editor
•
An interface to WinSpice analog simulator
•
A set of post-processing tools

A library of EMC/IC elements

A set of EMC-related goodies
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
2. What is IC-EMC
Why is it free?

Developed within MEDEA+ “Parachute” (2005-2007), PIDEA+
EMCPack (2006-2008), EPEA (2007-2010)

IC foundries & customers support the tool development and
publishing

Promotes and defends the “European” vision of EMC of ICs
Why is it non-confidential?

Standard-based tool : IBIS (IEC 62014-1), ICEM (IEC 62014-3), SPICE

Integrated Circuit parameters & models from ITRS roadmap

Eases industrial exchanges between IC customers and providers
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
2. What is IC-EMC
Post-processing tools
Electric circuit schematic editor
Spice
Near-field
Simulation
Main analysis
simulation
IC, package and PCB model
Spectrum
analysis
Impedance
simulation
Immunity
simulation
Basic
symbols
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
IBIS
interface
3. Susceptibility Prediction
Target Measurement Methods
Direct Power Injection
Radiated immunity in GTEM
Near-field Immunity
• Only for harmonic disturbances, not for transient immunity
• Should predict conducted, radiated mode and near-field
susceptibility
• Should use one single core and IO model for all methods
• Should be non-confidential and based on standards
• Recently added to IC-EMC
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
3. Susceptibility Prediction
Susceptibility Simulation flow
Aggressed IC
Model (ICEM)
IC-EMC
Package
and IO model (IBIS)
RFI and coupling
path model (Z(f))
Set RFI frequency
Increase V aggressor
WinSPICE
Time domain simulation
Criterion analysis
Increase RFI
frequency
Susceptibility
threshold simulation
IC-EMC
Extract forward power
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
3. Susceptibility Prediction
Key role of Coupler : from I,V to power
Measurement of the
incident power
(-20dB of forward
power)
Signal generator
and amplifier
Coupler
Vforward
Coupler with
characteristic
impedance Zc
Iin
Device
under test
Vload
Vin
ZloadZc
Vreflected
Measurement of
the reflected
power (-20dB of
reflected power)
 1   realV   Z  realI   2  imagV   Z  imagI   2 
in
c
in
in
c
in
Pforward  10  log   
 
   30
2
2
 
 
 Z c  
 1   realV   Z  realI   2  im agV   Z  im agI   2 
in
c
in
in
c
in
Preflected  10  log   
 
   30
2
2


 
 Z c  
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
3. Susceptibility Prediction
Example : DPI on 330 ohm load, 1V criterion
Signal generator
Printed Circuit
Board
To
oscilloscope
Coupling
Capacitance
IEEE
Bus
10W
Amplifier
Oscilloscope
Dout
DPI
1 nF
330  load
330
Ohm
To
GND
PC
Monitoring
Power increase loop
until 1 V reached
Frequency from 1 MHz to 3 GHz
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
3. Susceptibility Prediction
Step-by-step procedure
RFI source
control
Generate
the Spice file
Failure criterion
control
Extract power
from simulation
Step
Details
1. Set the RFI source
parameters
100-MHz frequency, a voltage
from 0 to 10 V, duration of 1 µs.
2. Set the susceptibility
criterion
Fail Criterion : 1.0V in the
control interface.
3. Simulate
Click “Generate Spice”. Launch
WinSPICE .
4. Extract the power
Click “Get Power” to extract the
forward power.
Add the result to
simulation
5. Save the power
value
Click “Add Forward Power” to
add the extracted value
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
3. Susceptibility Prediction
Measurement/Simulation on 330 ohm load, 1V criterion
Over 1.0V
Measured
forward power
Simulated
forward power
Measured
reflected power
Iterative, time-consuming
approach
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
4. Case Study – S12X
S12X Structure and PDN model
RAM
Memory
Flash
Memory
S12X CPU
XGATE
Timer
PWM
VREG
Power
PLL
ADC
EEPROM Memory
Dual Port RAM
16-bit automotive microcontroller with interrupt
coprocessor
VREG Regulation
ICEM model including IA, PDN
and external decoupling
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
4. Case Study – S12X
DPI setup, testboard and macromodel
Signal synthesizer
Test board
Injection path
to the IC pin
“PT3” (N°14)
SMA
connector
Pforw
Prefl
Microcontroller
DPI
capacitor
connector
External LED
Directional coupler
10 W power
amplifier Forward
Power
6.8 nF DPI
capacitor
Input buffer
Coupler
RF source and
Amplifier
Coupling
path
Package
model
Susceptibility
criterion
Led
Vdd
Vss
dd
Supply network
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
External
leds
4. Case Study – S12X
Injection Path Model and Impedance Validation
Total
capacitance
20 pF
LC
resonance
Lsma, Csma
Total
inductance
12 nH
Total
resistance 2 
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
4. Case Study – S12X
DPI measurement/Simulation comparison
DPI on IO model
simulation
measurement
16 bit
microcontroller
Susceptibility
threshold simulation
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
Conclusion

An environment for immunity prediction at IC level has been developed

The tool includes the coupler and injection path model

Conducted susceptibility successfully predicted on several ICs

The model model is based on the ICEM approach

The demonstration tool and manual are online at www.ic-emc.org

Demos at EmcCompo 07, EMC Europe 08, EMC Asia Pacific 08
www.ic-emc.org
www.emccompo.org
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org
Publications
•
•
•

•
E. Sicard "Issues in Electromagnetic Compatibility of integrated circuits: Emission
and Susceptibility", in Microelectronics Reliability, Volume 45, Issues 9-11 ,
September-November 2005, Pages 1277-1284
S. Bendhia, M. Ramdani, E. Sicard, Electromagnetic Compatibility of Integrated
Circuits, book published by Springer, Dec. 2005, 0-387-26600-3 (More information
on www.springeronline.com.
A. Boyer, S. Bendhia, E. Sicard, “Modeling of a Mixed Signal Processor
Susceptibility to Near-Field Aggression”, proceedings of the IEEE International
Symposium on EMC, Hawaii, Jul 2007.
A. Boyer, S. Bendhia, E. Sicard "Modelling of a Direct Power Injection Aggression
on a 16 bit Microcontroller Input Buffer", EMC Compo 07 Torino, Nov 2007, Italy
E. Sicard, A. Boyer "IC-EMC v1.5 User's Manual", INSA editor, ISBN 978-2-87649052-9, June 2007, 160 pp
INSA – Toulouse FRANCE – [email protected] - www.ic-emc.org