Low Power Design
Download
Report
Transcript Low Power Design
Micro transductors ’08
Low Power VLSI Design 1
Dr.-Ing. Frank Sill
Department of Electrical Engineering, Federal University of Minas Gerais,
Av. Antônio Carlos 6627, CEP: 31270-010, Belo Horizonte (MG), Brazil
[email protected]
http://www.cpdee.ufmg.br/~frank/
Agenda
Recap
Why do we worry about power?
Metrics
Where does power go in CMOS?
How can we reduce the power dissipation? (1st
part)
Copyright Sill, 2008
Micro transductors ‘08, Low Power
2
Recap: Transistor Geometrics
Gate
Drain
Source
polysilicon
gate
W
Gate-width
tox
L
Bulk
tox – thickness of oxide layer
Copyright Sill, 2008
Gate length
Micro transductors ‘08, Low Power
3
Recap: Logic Gates
Task (e.g. calculation)
Transfer into Logic Gates
(Synthesis)
Gate characteristics:
Delay
Power dissipation
more ...
Y = A+B
Gates realized by transistors
Copyright Sill, 2008
Micro transductors ‘08, Low Power
4
Recap: CMOS Scheme
VDD
PUN
IN1
…
INx
(supply voltage)
PUN – Pull-up Network
PDN – Pull-down Network
OUT
PDN
GND
Copyright Sill, 2008
(ground)
Micro transductors ‘08, Low Power
5
Transistor as Water-tap cont’d
Voltage (Volt, V)
Water pressure (bar)
Current (Ampere, A)
Water quantity per second (liter/s)
0 Volt
1 Volt
1 Volt
1 Volt
1 Volt
1 Volt
0 Volt
1 Volt
1 Volt
1 Volt
0 Volt
0 Volt
0 Volt
1 Volt
-
-
-
-
Source: Timmernann, 2007
Copyright Sill, 2008
Micro transductors ‘08, Low Power
6
Recap: RC-Delay Model
Simple but effective delay model
Use equivalent circuits for MOS transistors
Ideal switch
Transistor capacitances
ON resistance ( = when transistor is conducting (=ON)
channel between Drain to Source acts as resistor)
Delay t ~ R*C
CP,gate
CP,gate
Cout
CN,gate
Copyright Sill, 2008
CN,gate
Micro transductors ‘08, Low Power
X
RN,DS
Cout
7
Sizing
Increasing Width
Resistance get down
Increasing current
Decreasing delay
BUT
Capacitance increase too
Internal capacitances increase
+ Output load of previous gates increases
Chain of Inverters: Optimum result (for speed) at equal
fanout!
Copyright Sill, 2008
Micro transductors ‘08, Low Power
8
Trend: Performance
1000000
100000
Pentium® 4 proc
10000
1 TIPS
1000
MIPS
100
10
1
386
Pentium® proc
8086
0,1
0,01
1970
8080
1980
1990
2000
2010
2020
Source: Moore, ISSCC 2003
Copyright Sill, 2008
Micro transductors ‘08, Low Power
9
Trend: Power
Source: Moore, ISSCC 2003
Copyright Sill, 2008
Micro transductors ‘08, Low Power
10
Trend: Power Density
Sun’s
Surface
Power Density (W/cm2)
10000
Rocket
Nozzle
1000
100
Nuclear
Reactor
Prescott
Pentium®
8086 Hot Plate
10 4004
P4
8008 8085
Pentium®
386
286
486
8080
1
1970
Copyright Sill, 2008
1980
1990
Year
Micro transductors ‘08, Low Power
2000
2010
Source: Moore, ISSCC 2003
11
Problems of High Power Dissipation
Continuously increasing
performance demands
Increasing power dissipation of
technical devices
Today: power dissipation is a main
problem
High Power dissipation leads to:
Reduced time
of operation
High efforts for cooling
Higher weight (batteries)
Increasing operational costs
Reduced mobility
Reduced reliability
Copyright Sill, 2008
Micro transductors ‘08, Low Power
12
Problems: Cooling
Copyright Sill, 2008
Micro transductors ‘08, Low Power
13
Problems: Cooling cont’d
Solution?
Copyright Sill, 2008
Micro transductors ‘08, Low Power
14
Chip Power Density Distribution
Power Map
On-Die Temperature
Power density is not uniformly distributed across the chip
Silicon is not a good heat conductor
Max junction temperature is determined by hot-spots
Impact on packaging, cooling
Copyright Sill, 2008
Micro transductors ‘08, Low Power
15
„The Internet is an Electricity Hog“
Badische Zeitung, 2003
Energy for the internet in 2001 in Germany:
6.8 Bill. kWh = 1.4 % of total energy consumption
2.35 Bn. kWh for 17.3 Mill. Internet-PCs
1.91 Bn. for servers
1.67 Bn. for the network
0.87 Bn. for USV
Rate of growth (at the moment): 36 % per year
Prognosis: 2010 33 Bn. kWh
> 6 % total energy consumption
> 3 medium nuclear power plants
World: 400 Mill. PCs 0.16 PW (P = Peta=1015)
Copyright Sill, 2008
Micro transductors ‘08, Low Power
16
Dissipation in a Notebook
Peripherals
Processing
ASICs
Disk
Display
Power supply
Battery
Copyright Sill, 2008
programmable µPs
or DSPs
Memory
Communication
DC-DC
converter
WLAN
Micro transductors ‘08, Low Power
Ethernet
17
Examples for Energy Dissipation
Energy dissipation in a notebook
Copyright Sill, 2008
Energy dissipation a PDA
Micro transductors ‘08, Low Power
18
Battery Capacity
Generalized Moore‘s Law
Intel beats Varta
Capacity of batteries
2% - 6% Increase per year
(up to year 2000)
Source: Timmernann, 2007
Copyright Sill, 2008
Micro transductors ‘08, Low Power
19
Current Progresses
Batter.
20 kg
Factor 4 in the last 10 years still much too less
Copyright Sill, 2008
Micro transductors ‘08, Low Power
20
Metrics: Energy and Power
Energy
Measured in Joules or kWh
“Measure of the ability of a system to do work or produce a
change”
“No activity is possible without energy.”
Power
Measured in Watts or kW
“Amount of energy required for a given unit of time.”
Average power
Average amount of energy consumed per unit time
Simplified to "power" in clear contexts
Instantaneous power
Energy consumed if time unit goes to zero
Copyright Sill, 2008
Micro transductors ‘08, Low Power
21
Metrics: Energy and Power cont’d
Instantaneous Electrical Power P(t)
P(t)
= v(t) * i(t)
v(t): Potential difference (or voltage drop) across
component
i(t): Current through component
Electrical Energy
E
= P(t) * t = v(t) * i(t) * t
Electrical Energy in CMOS circuits
Energy
= Power * Delay
Why?
Copyright Sill, 2008
Micro transductors ‘08, Low Power
22
Consumption in CMOS
Voltage (Volt, V)
Water pressure (bar)
Current (Ampere, A)
Water quantity per second (liter/s)
Energy
Amount of Water
1
CL
0
Energy consumption is proportional to capacitive load!
Copyright Sill, 2008
Micro transductors ‘08, Low Power
23
Consumption in CMOS cont’d
Voltage (Volt, V)
Water pressure (bar)
Current (Ampere, A)
Water quantity per second (liter/s)
Energy
Amount of Water
1
CL
0
Energy for calculation only consumed at 0→1 at output
Copyright Sill, 2008
Micro transductors ‘08, Low Power
24
Energy and Instantaneous Power
INV1:
High instantaneous
Power (bigger width)
CL
Same Energy (Cin ingnored)
INV1 is faster
INV2:
Low instantaneous
power
CL
Copyright Sill, 2008
Micro transductors ‘08, Low Power
td1 td2
25
Metrics: Energy and Power cont’d
Power is height of curve
Watts
Approach 1
Approach 2
time
Energy is area under curve
Watts
Approach 1
Approach 2
time
Energy = Power * time for calculation = Power * Delay
Copyright Sill, 2008
Micro transductors ‘08, Low Power
26
Metrics: Energy and Power cont’d
Energy dissipation
Determines
Sets
battery life in hours
packaging limits
Peak power
Determines
Impacts
power ground wiring designs
signal noise margin and reliability
analysis
Copyright Sill, 2008
Micro transductors ‘08, Low Power
27
Metrics: PDP and EDP
Power-Delay Product
Power
Quality
P, delay tp
criterion PDP = P * tp [J]
P and tp have some weight
Two designs can have same PDP, even if tp = 1 year
Energy-Delay Product
EDP
= PDP * tp = P * tp2
Delay tp
Copyright Sill, 2008
has higher weight
Micro transductors ‘08, Low Power
28
Energy and Power
Average Power direct proportional to Energy
In Following: Power means average power
Copyright Sill, 2008
Micro transductors ‘08, Low Power
29
Where Does Power Go in CMOS?
Dynamic Power Consumption
Short Circuit Currents
Charging and Discharging Capacitors
Short Circuit Path between Supply Rails during Switching
Leakage
Leaking diodes and transistors
Copyright Sill, 2008
Micro transductors ‘08, Low Power
30
Dynamic Power Consumption
VDD
Vin
Vout
CL
f01= α * f
Pdyn = CL * VDD2 * P01 * f
P01 : probability for 0-to-1 switch of output
f : clock frequency
α : activity
Data dependent - a function of switching activity!
Copyright Sill, 2008
Micro transductors ‘08, Low Power
31
Short Circuit Power Consumption
VDD
Vin
Isc
Vout
CL
tsc
GND
Finite slope of input signal
During switching: NMOS and PMOS transistors are conducting for
short period of time (tsc)
Direct current path between VDD and GND
Psc = VDD * Isc * (P01 + P10 )
Copyright Sill, 2008
Micro transductors ‘08, Low Power
32
Leakage Power Consumption
VDD
Gate
Igate
Source
Igate
Isub
Drain
SiO2
Isub
L
CL
GND
Copyright Sill, 2008
Most important Leakage currents:
Subthreshold Leakage Isub
Gate Oxide Leakage Igate
Pleak = Ileak * VDD ≈ (Isub + Igate)* VDD
Micro transductors ‘08, Low Power
33
Power Equations in CMOS
P = α f CL VDD2 + VDD Ipeak (P01 + P10 ) + VDD Ileak
Dynamic power
(≈ 40 - 70% today
and decreasing
relatively)
Copyright Sill, 2008
Short-circuit power
(≈ 10 % today and
decreasing
absolutely)
Micro transductors ‘08, Low Power
Leakage power
(≈ 20 – 50 %
today and
increasing)
34
Levels of Optimization
Speed
> 70 %
Seconds
> 50 %
40-70 %
Minute
25-50 %
25-40 %
Minutes
15-30 %
Gate
15-25 %
Hour
10-20 %
Transistor
10-15 %
Hours
5-10 %
MEM
System
ALU
MP3
Algorithm
Architecture
Copyright Sill, 2008
MEM
Savings
T1
T
T
S
+
Micro transductors ‘08, Low Power
Error
nach Massoud Pedram
35
Lowering Dynamic Power
Reducing VDD has a quadratic effect!
Has
a negative effect on performance especially as VDD
approaches 2VT
Lowering CL
Improves
Keep
performance as well
transistors minimum size
Reducing the switching activity, f01 = P01 * f
A function
Impacted
Copyright Sill, 2008
of signal statistics and clock rate
by logic and architecture design decisions
Micro transductors ‘08, Low Power
36
Transistor Sizing for Power Minimization
Lower Capacitance
Higher Voltage
Small W’s
To keep
performance
Large W’s
Higher Capacitance
Lower Voltage
Larger sized devices: only useful only when interconnects dominate
Minimum sized devices: usually optimal for low-power
Source: Timmernann, 2007
Copyright Sill, 2008
Micro transductors ‘08, Low Power
37
Logic Style and Power Consumption
Voltage decreases:
Power-delay product
improves
Best logic style
minimizes power-delay
for a given delay
constraint
New Logic style can
reduced Power
dissipation
(if possible / available !)
Source: Timmernann, 2007
Copyright Sill, 2008
Micro transductors ‘08, Low Power
38
Transistor Reordering
Logically equivalent CMOS gates may not have
identical energy/delay characteristics
y (a1 a2)b
a2
a1
b
b
a1
y
b
A
Copyright Sill, 2008
a2
B
y
y
a1
a2 a1
a1
a2
y
b
a1
b
b
a2
a2
a1
a2
b
a1
a2
b
C
Micro transductors ‘08, Low Power
D
39
Transistor Reordering cont’d
Normalized Pdyn
Activity (transitions / s)
(A)
(B)
(C)
(D)
max. savings
0.81
0.84
0.98
1.0
19%
0.58
0.53
0.53
0.48
10%
Aa1 = 10 K
(1)
Aa2 = 100 K
Ab = 1 M
Aa1 = 1 M
(2)
Aa2 = 100 K
Ab = 10 K
For given logic function and activity:
Signal with highest activity → closest to output
to reduce charging/discharging internal nodes
Copyright Sill, 2008
Micro transductors ‘08, Low Power
40
Impact of rise/fall times on short-circuit currents
VDD
VDD
ISC
Vin
ISC IMAX
Vout
CL
Large capacitive load
Vout
Vin
CL
Small capacitive load
Source: Timmernann, 2007
Copyright Sill, 2008
Micro transductors ‘08, Low Power
41
Isc as a Function of CL
2,5
x 10-4
At small load capacitance
CL large Isc
But: large CL increases
Pdyn
CL = 20 fF
2
1,5
1
2nd Possibility:
Minimization of short
circuit dissipation by
matching the rise/fall times
of input and output signals
CL = 100 fF
0,5
CL = 500 fF
0
0
2
4
-0,5
500 ps input slope
Copyright Sill, 2008
6
x 10-10
Slope engineering
time (sec)
Micro transductors ‘08, Low Power
42
Transition Probabilities for CMOS Gates
Example: Static 2 Input NOR Gate
If A and B with same input signal probability:
Truth table of NOR2 gate
A
B
Out
1
1
0
0
1
0
1
0
0
0
0
1
PA=1 = 1/2
PB=1 = 1/2
Then:
POut=0 = 3/4
POut=1 = 1/4
P0→1
= POut=0 * POut=1
= 3/4 * 1/4 = 3/16
Ceff = P0→1 * CL = 3/16 * CL
Source: Timmernann, 2007
Copyright Sill, 2008
Micro transductors ‘08, Low Power
43
Transition Probabilities cont’d
A and B with different input signal probability:
PA and PB : Probability that input is 1
P1
: Probability that output is 1
Switching activity in CMOS circuits: P01 = P0 * P1
For 2-Input NOR: P1 = (1-PA)(1-PB)
Thus: P01 = (1-P1)*P1 = [1-(1-PA)(1-PB)]*[(1-PA)][1-PB] (see next slide)
P01 = Pout=0 * Pout=1
NOR
(1 - (1 - PA)(1 - PB)) * (1 - PA)(1 - PB)
OR
(1 - PA)(1 - PB) * (1 - (1 - PA)(1 - PB))
NAND
PAPB * (1 - PAPB)
AND
(1 - PAPB) * PAPB
XOR
(1 - (PA + PB- 2PAPB)) * (PA + PB- 2PAPB)
Copyright Sill, 2008
Micro transductors ‘08, Low Power
44
Transition Probabilities cont’d
Transition Probability of NOR2 Gate as a Function of Input Probabilities
Probability of input signals → high influence on P01
Source: Timmernann, 2007
Copyright Sill, 2008
Micro transductors ‘08, Low Power
45
Logic Restructuring
Logic restructuring: changing the topology of a logic
network to reduce transitions
AND: P01 = P0 * P1 = (1 - PAPB) * PAPB
0.5
A
B
0.5
(1-0.25)*0.25 = 3/16
W
7/64 = 0.109
X
15/256
C
F
0.5
D
0.5
0.5 A
0.5 B
0.5
C
0.5 D
3/16
Y
15/256
F
Z
3/16 = 0.188
Chain implementation has a lower overall switching activity than
tree implementation for random inputs
BUT: Ignores glitching effects
Source: Timmernann, 2007
Copyright Sill, 2008
Micro transductors ‘08, Low Power
46
Input Ordering
(1-0.5x0.2)*(0.5x0.2)=0.09
0.5
A
B
0.2
X
C
0.1
F
(1-0.2x0.1)*(0.2x0.1)=0.0196
0.2
B
X
C
F
0.1
A
0.5
AND: P01 = (1 - PAPB) * PAPB
Beneficial: postponing introduction of signals with
a high transition rate (signals with signal
probability close to 0.5)
Source: Timmernann, 2007
Copyright Sill, 2008
Micro transductors ‘08, Low Power
47
Glitching
A
B
X
Z
C
ABC
101
000
X
Z
Unit Delay
Copyright Sill, 2008
Micro transductors ‘08, Low Power
48
Example 1: Chain of NAND Gates
out1
out2
out3
out4
out5
1
...
V (Volt)
6.0
4.0
out2
out4
out6
out8
VDD / 2
2.0
out1
out3
out5
out7
0.0
0
Copyright Sill, 2008
1
t (nsec)
2
Micro transductors ‘08, Low Power
3
49
Example 2: Adder Circuit
Cin
S14
S15
S0
S1
S2
S Output Voltage (V)
3
S3
2
S4
Cin
S2
S15
VDD / 2
S5
1
S10
S1
S0
0
0
2
4
6
8
10
12
Time (ps)
Copyright Sill, 2008
Micro transductors ‘08, Low Power
50
How to Cope with Glitching?
0
F1
0
1
F2
0
0
2
F3
0
0
F1
1
F3
0
0
F2
1
Equalize Lengths of Timing Paths Through Design
Copyright Sill, 2008
Micro transductors ‘08, Low Power
51