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A Method for Current Spreading Analysis and Electrode Pattern Design in LightEmitting Diodes Sungmin Hwang and Jongin Shim, Member, IEEE IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 55, NO. 5, MAY 2008 報告者:B.J.Hu Outline I. II. III. IV. V. Introduction Experimental Results and Discussion Conclusion References Introduction We report a method that informs both the 2-D light emission pattern on an entire LED surface and a 3-D current flow in a LED structure. The current crowding effect is directly related to the LED chip reliability.