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Creep of Thermally Aged
SnAgCu-Solder Joints
S . Wiese, M. Roellig, K.-J. Wolter
Dresden University of Technology, Electronic Packaging Laboratory, Germany
TU Dresden, Fak. Ed, IAVT, D-01062 Dresden
[email protected], +49 35146333172
日
期:2 0 1 1 . 0 3 . 0 8
指導老師:林 克 默 、 黃 文 勇
學
生:陳
立
偉
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Outline
1.
2.
3.
4.
5.
6.
Introduction
Experiments on Bulk Samples
Experiments on PCB Samples
Experiments on Flip-Chip Joints
Comparison between different specimen types
Conclusions
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Introduction
• In order to characterise the mechanical behaviour
of SnAgCu solders, there have been a myriad of
creep tests conducted on bulk solder specimens.
Performing these tests is not complicated and the
results are easy to interpret.
• These smaller test vehicles do not necessarily
represent the physics found in real solder joints
because they are manufactured differently than
solder joints in electronic packages.
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• Investigations by Stormswold [1] showed the
dependence of creep resistance on the volume fraction
of Ag in SnAg solders and the cooling rate during
solidification
• Yan et al. [2] showed the influence of the soldering
process on the mechanical properties
• Berck et al. [3] proved the existence of the Orowan
bowing as a basic deformation mechanism
• Kerr and Chawla [4] proved the existence of
nanometer-sized precipitates as the major obstacles for
dislocation movement in SnAgCu solders.
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the creep research activities on the Sn-Ag-Cu
system into two branches. The first branch follows
the idea of a double power creep law, which has
broad fundamental aspects of material physics. The
other branch prefers a sinh creep law, which has no
physical basis but fits well into several FEM codes
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The research presented in this paper follows the
first branch and focuses on the physics behind the
measured creep deformations. The major goal is to
correlate detected deformation kinetics with
processes and operating conditions that can be
found in typical environments for electronic
packages.
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• another question concerning the decline of creep
resistance over time is when the solder is
exposed to higher temperatures.
• To address these issues an experimental method
was chosen that is based on investigations on
different specimen types.
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Experiments on Bulk Samples
Figure 1: Design and microstructure (SnAgCu) of bulk specimen; Load frame for creep tests on
bulk specimens
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SnAg3.5
SnAg3.8Cu0.7
Figure 2: Creep data for bulk specimens
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Experiments on PCB Samples
Figure3: Design and microstructure (SnAgCu) of PCB specimen; Test fmture for creep tests on
PCB specimens
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Figure 4: Creep data for PCB specimens
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• The results of the creep experiments on PCB
samples is shown in diagrams in Figure 4. The
steady state creep rate is plotted versus the
applied stress. The upper diagram shows the
results for SnAg3.5 solder. The creep data
indicates a simple power law behaviour.
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• However, it needs to be assumed that in both, a
low stress behaviour might not have been
detected because the creep rates that were
achieved during the creep tests were too high.
The lower diagram shows the results for
SnAg3.8Cu0.7 solder. The data indicates a
double power law creep behaviour. No difference
could be found between as-cast specimens and
thermally stored specimens.
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Experiments on Flip-Chip Joints
Figure 5: Design and microshucture (SnAgCu, stored 24W125℃) of flip chip specimen
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Figure 6: Test setup for experiments on flip-chip joints
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Figure 7: Creep data for flip-chip joints
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• In order to compare the creep behaviour between
different specimen types, the raw creep data was
fit using Equation 1.
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Conclusions
實驗的結果表示,短時間的焊條儲熱現象明顯,
但使用更長時間的再儲熱,並不會改變焊條的
潛熱現象。
實驗結果發現銅、金,金屬間化合物能明顯加
強SnAg焊料和SnAgCu焊料。然而,最終強化效
果取決於焊料種類,所以其強度優於小體積的
倒晶接合。
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