Transcript Document 7717994

Quality Assurance Test Stand
University of Rochester
o QTC at Rochester, NY
• What’s new compared to KSU


Vacuum Base Chuck Positioner
Extra switch to decouple guard box
o Test crosscheck
• 5 Test Structures

Tested by Vienna, Karlsruhe QTC

Tested by Perugia QTC
• 2 OB2 sensors
o Handling the results
• Data Base
o Conclusion, plans
October 7, 2003
US Silicon Tracker group
Sergey Korjenevski
University of Rochester
1
Setup is completed
 Hardware is in
October 7, 2003
US Silicon Tracker group
Sergey Korjenevski
University of Rochester
place and
operational.
 Software is
working as well, test results are
consistent with
other testing
centers (more
details later).
 Clean room is to
be completed by
20th of October.
2
Personnel
•
•
•
•
•
•
Regina Demina (585) 275-7357
Thomas Ferbel (585) 275-4396
Elizabeth A. Groves (585) 275-4001
Sergey Korjenevski (585) 275-8550
David R. Martell (585) 275-5938
Daniel Schwaab (585) 275-4394
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US Silicon Tracker group
Sergey Korjenevski
University of Rochester
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List of the Equipment
• Probe Station Alessi REL-6142 8 in. guarded
chuck, Semi-Auto
• Microscope Mitutoyo 2x 10x 20x, 10x
• Vacuum base positioners with 4 coax probes
• Needles diameter 5 m
• LCR HP 4284A
• V-source/Ammeter Keithley 237 and Keithley 487
• Switching Matrix Agilent 34970A with two 8x4
switch 34904A
• Vibration-free table Kinetics 1201
• Custom made dark box
October 7, 2003
US Silicon Tracker group
Sergey Korjenevski
University of Rochester
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New Features
• Solid stable
location of the
chuck positioner.
• Significant to
ensure safety and
helps to
minimize noise
October 7, 2003
US Silicon Tracker group
Sergey Korjenevski
University of Rochester
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New Features
• New switch is
added to discharge
decoupling
capacitors.
• Significant to
ensure safety and
helps to minimize
noise.
October 7, 2003
US Silicon Tracker group
Sergey Korjenevski
University of Rochester
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Cross Check, - Full strip tests
• Two OB2 sensors, ST, tested by Perugia
– 30210420275924
– 30210414739923
• 5 Test Structures, HPK
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–
–
–
–
60548-050
60548-051
60549-055
60550-065
60551-087
October 7, 2003
from
from
from
from
from
Karlsruhe
Karlsruhe
Vienna
Vienna
Vienna
US Silicon Tracker group
Sergey Korjenevski
University of Rochester
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IV Test
IV Test St 60548-050
18
16
14
Current, nA
12
10
UR
KRLS
8
6
4
2
0
0
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200
300
400
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University of Rochester
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600
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IV Test
IV TestSt 60550-065
12
10
Current, nA
8
Rochester
Vienna
6
4
2
0
0
100
200
300
400
500
600
Volt
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University of Rochester
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CV Test
1/C^2, ST 30210414739923
0.00000045
0.0000004
0.00000035
0.0000003
Vdepl=150V
UofR
Perugia
UofR 10-03
0.00000025
0.0000002
0.00000015
0.0000001
0.00000005
0
0
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Volt
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CV Test
1/C^2 Test St 60548-050
0.00004
0.000035
0.00003
0.000025
UR
KRLS
0.00002
0.000015
0.00001
0.000005
0
0
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University of Rochester
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Strip tests - Leakage
Strip Leakage, Test St 60548-050
0.4
0.35
0.3
Current, nA
0.25
UR
KRLS
0.2
0.15
0.1
0.05
0
0
20
40
60
80
100
120
140
Strip #
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University of Rochester
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Strip tests - Leakage
Strip Leakage, Test St 605551-087
0.12
0.1
Current, nA
0.08
vienna
Rochester
0.06
0.04
0.02
0
0
20
40
60
80
100
120
140
Strip #
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University of Rochester
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Strip tests - Rpoly
Rpoly, Test Structure 60548-050
1.96
1.95
1.94
1.93
1.92
UR
KRLS
1.91
1.9
0
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40
60
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140
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Strip tests - Rpoly
Rpoly, ST 30210414739923
1.34
1.32
1.3
R, MOhm
1.28
1.26
Perigua
UofR
1.24
1.22
1.2
1.18
1.16
0
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University of Rochester
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Strip tests - Cac at 100Hz
Coupling AC, ST 30210414739923
600
580
560
540
C, pF
520
UofR
Perugia
500
480
460
440
420
400
0
100
200
300
400
500
600
Strip #
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University of Rochester
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Strip tests - Cac at 100Hz
Coupling AC, Test St 60548-050
99
98
C, pF
97
KRLS
UR
96
95
94
93
0
20
40
60
80
100
120
140
Strip #
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University of Rochester
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Strip tests - Idiel
Pinhole Test, ST 30210414739923
10
9
8
Current, nA
7
6
Perugia
UofR
5
4
3
2
1
0
0
100
200
300
400
500
600
Strip #
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University of Rochester
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Strip tests - Idiel
Pinhole Test, ST 30210414739923
0.2
0.18
0.16
Current, nA
0.14
0.12
Perugia
UofR
0.1
0.08
0.06
0.04
0.02
0
0
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Strip
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University of Rochester
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Data Base
• We were not able to simulate data handling with
fictitious names though we believe our .xml
format is correct. The problem may disappear as
we proceed with real actions.
• Error:
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–
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“DB: ERROR: fatal error: 0RA-02291: integrity constraint (CMSTRKDB.REF_INPUT14)
violated – parent key not found
ORA-06512: at “CMSTRKDB.STORED_FUNCTIONS”, line 788
ORA-06512: at line 1
– …error goes on to list the text in the file. It is not just
IV_TEST in particular. If this test is deleted and it goes
straight to CV, the problem basically is repeated.
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Sergey Korjenevski
University of Rochester
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Conclusions and Plans
• QTC at University of Rochester complies with
CMS requirements to test Si detectors.
• Rate of the testing is estimated to be 2 OB2
sensors per day.
• Data Base remains an issue. The problem may
disappear if everything is done in proper order
using appropriate bar codes and all.
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Sergey Korjenevski
University of Rochester
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