Transcript Actel A54SX-A and RTSX-SU Reliability Testing Update Antony Wilson, Minal Sawant, and Dan Elftmann.

Actel A54SX-A and RTSX-SU
Reliability Testing Update
Antony Wilson, Minal Sawant, and Dan
Elftmann
S-Antifuses
 S-antifuses connect the output track of one logic module
to the input track of another logic module
Cross Antifuse
(“X-antifuses”)
Logic Module
Logic Module
Input Antifuses
(“I-antifuses”)
Logic Module
Logic Module
Semi-Direct Antifuses
(“S-antifuses”)
Freeway Antifuses
(“F-antifuses”)
Single S-antifuse Net
 Single S-antifuse nets do not use freeways
 No horizontal or vertical freeway connection
 Much lower capacitive loading than other types of nets
 Much faster edge rates and higher peak operational current
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
2
Programming Roadmap (1)
 UMC Modified Algorithm (UMA)
 UMA will provide low programming current antifuses longer
soaking pulses, in order to ensure no weak links
 Includes S, B, I and K-antifuses
 UMA will be included in Silicon Sculptor II
 Version 3.90 (DOS) / 4.53 (Windows)
 Shipping since July 2005
 UMA uses the new AFM format
 Introduced in Designer 6.1-SP1
 Shipping since March 2005
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
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Programming Roadmap (2)
 S-Antifuse Loading (SAL)
 Adds capacitive loading by connecting a freeway
track
 Reduces IPEAK in single S-antifuse nets by a
minimum of 33%
 No measurable increase in routing delay of single
S-antifuse nets
 Requires design re-compilation
Logic
Module
 Placement will not change,
only routing capacitance is added
 Timing changes are minimal
 Timing analysis encouraged
Logic
Module
 AFM checksum changes
 SAL Availability
 Designer / Libero version 6.2-SP1
 Shipping since August, 2005
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
Freeway track adds
capacitive loading
Single
S-Antifuse
Net
September 7th - 9th, 2005
4
Aerospace Space Qualification
 Reliability testing to be done by Aerospace Corporation in Space
Qualification
RTSX72SU-CQ208
RTSX32SU-CQ208
125°C
75-UMA+SAL
150-Standard– Started 5/2/2005
-55°C
75-Standard
150-UMA+SAL
 Additionally
 Actel donating 80 A54SX72A-PQ208I units to Aerospace Corp. for testing of SAL
& UMA in Long Term Life Experiment (LTLE)
 Actel donating 80 RTSX72SU-CQ208B units to Aerospace Corp. for testing of
SAL & UMA in Long Term Reliability experiment
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
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High Single S-Antifuse
Design Objective
Create a reliability test vehicle design that
approaches, if not achieves, the maximum
number of Single S-Antifuses in a ’72 size device
Nets must be capable of being toggled on a
Burn In Board (BIB) at a high toggle rate
Delay line time should be ~100 ns (short) to
reduce thermal influence on measurement
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
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High Single S-Antifuse Design
Combinatorial Circuit(s)
 Combinatorial (C-Cells) logic utilization to achieve high S-antifuse count
 S-antifuse used in every routing path between c-cells
ccell_in
ccell_out(1)
ccell1 ccell2
Cluster & Super-Cluster Arrangement
CLKA
ccell_out(2)
Cluster
C
R
C
C
R
C
ccell_out(n-1)
Super-Cluster
ccell_out(n)
ccell_in
C
R
C
C
Timing diagram
Device Top
C-Cell Routing
ccell_in
R
ccell_in
C
ccell_out1
C
R
C
C
R
C
delay
measurement
C
R
C
Single S-Antifuse net segment
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
ccell_out(n)
C
ccell_out(n-1)
R
ccell_out2
C
ccell_out1
ccell_out1
delay
measurement
September 7th - 9th, 2005
7
High Single S-Antifuse Design
Sequential Circuit(s)
 Sequential (R_Cells) logic utilization to achieve high S-antifuse count
 S-antifuse is only on nets routed within a super-cluster
 Circuit acts like dominoes; CLKB sets up the dominoes and HCLK knocks them down
Set
R-Cell Routing
CLKB
HClock
rcell_in
rcell_out(1)
D
HCLK
SET
CLR
Q
Q1
D
Q
SET
CLR
Q
Q2
D
Q
SET
CLR
Q
D
Q
SET
CLR
Q
Q96
rcell_out(2)
D
SET
CLR
Q
D
Q
SET
CLR
Q
D
Q
SET
CLR
Q
D
Q
SET
CLR
C
R
C
C
R
C
C
R
C
C
R
C
C
R
C
C
R
C
Q
Q
Q
rcell_out1
Single S-Antifuse net segment
F-X-I Antifuse net segment
rcell_out(n-1)
D
SET
CLR
Q
D
Q
SET
CLR
Q
D
Q
SET
CLR
Q
D
Q
SET
CLR
Q
Timing diagram
Q
Set
rcell_out(n)
D
SET
CLR
Q
Q
D
SET
CLR
Q
Q
D
SET
CLR
Q
Q
D
SET
CLR
Q
HClock
1st clock edge
Qn
Q
Q1
1 ff time later
Q2
2 ff time later
Q3
96 ff time later
Q96
Delay Measurement
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
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HiSS A54SX72A-PQ208
Antifuse Utilization
B=>
I=>
S=>
K=>
0
987
5007
2033
Antifuse
Antifuse
Antifuse
Antifuse
between
between
between
between
Local Track and input
horizontal segment & input
output track & input (semi-direct)
input & horizontal NCLK0 or NCLK1, or QCLK
8027 Total Low Programming Current Antifuses
F=>
X=>
V=>
H=>
W=>
G=>
1029
1026
0
0
31
UMA Algorithm
applies to all B, I,
S & K antifuses
All 5,007 S-Antifuses are
S-Antifuse nets
Antifuse between freeway & output track
Single
Antifuse between horizontal segment & freeway
Antifuse between two vertical tracks
Antifuse between two horizontal tracks
Antifuse between horizontal segment & 2nd freeway on the net
(old-style freeway)
0 Antifuse between output track & 2nd, 3rd, & 4th freeway
on the net
2086 Total High Programming Current Antifuses
10113 Total Dynamic Antifuses
J=> 45116 Antifuse between input & horizontal NVCC or NGND
M=>
46 Antifuse for I/O configuration options
Q=>
10 Silicon Signature antifuse in silicon signature words
T=>
0 Antifuse between output track & input used early
in programming sequence to tie off floating output track
Y=> 15769 Antifuse between horizontal segment & vertical NVCC or NGND
Z=> 9074 Antifuse between freeway & horizontal NVCC or NGND
70015 Total Static Antifuses
80128 Total Antifuses
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
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High S-Antifuse Stress Qualification
SX72A-PQ208 UMC 24MHz D1JJT1
Experiment
STD w/HiSS
Designer /
Sculptor
VCCA
TA/TJ
(V)
(ºC)
6.0 / 3.87
2.50
85/121
T0
110/110
168
Hours
108/108
3rd Read
Point
108/108
1000
Hours
108/108
714 hours
6.0 / 3.87
2.50
85/121
132
Due 9/14/05
Due 9/23/05
500 hours
Due 10/12/05
Due 11/9/05
STD w/HiSS
6.0 / 3.87
3.00
100/145
99/100
98/99
97/98
813 hours
1 single
S-Antifuse
97/97
UMA w/HiSS
6.1 SP1 / 3.90
3.00
100/145
101/101
101/101
100/101
788 hours
1 single
S-Antifuse
100/100
UMA
w/HiSS+SAL
6.2 SP1 / 3.90
3.00
100/145
102/102
102/102
102/102
651 hours
102/102
STD
w/HiSS+SAL
6.2 SP1 / 3.87
108/108
108/108
625 hours
108/108
UMA
w/HiSS+SAL
6.2 SP1 / 3.90
3.00
-55/-21
110/110
108/108
108/108
645 hours
108/108
UMA P7 Design
6.1 SP1 / 3.90
2.75
110/145
208/208
204/204
204/204
668 hours
203/203
3.00
100/145
116/117
1 continuity
failure
50MHz 3000S
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
108
Due 9/23/05
STD w/HiSS
1 single
S-Antifuse
2000
Hours
Due 1/4/05
102
Due 9/21/05
Device
59050 not
uploaded
September 7th - 9th, 2005
10
High S-antifuse Stress Qualification
Next Steps
Continue 108 HiSS units w/STD algorithm to
2000 hrs
 VCCA = 2.50 V
TA = 85ºC
Will add 132 HiSS units w/STD algorithm
 VCCA = 2.50 V
TA = 85ºC
Continue 108 HiSS units w/UMA algorithm & SAL
to 2000 hrs
 VCCA = 3.00 V
TA = 100ºC
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
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NASA Test Based on Shape Factor of
Aerospace 72SXAU Long Term
Experiment
S Antifuse NASA Design Weibull
0.01
0.009
0.008
Percent Failure
0.007
0.006
0.005
0.004
0.003
0.002
0.001
0
1
10
100
1000
10000
100000
Hours
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
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S Antifuse FIT CALC for NASA
32S Test
0.0091 in 100K Hours = 91 FIT
5X for 0.2eV
 TJ = 150ºC
10X for Voltage Acceleration
 VCCA = 2.75 V
2X for Utilization
 Single S-Antifuse utilization 251 vs. 832
5X for Visibility
 If delay >10ns no visibility factor
FITs = 91/500 = .182 FIT in 10 Years
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
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B-Antifuse within the Device
Architecture
 The B-Antifuse is driven by the
dedicated DB-Inverter in each
C-Cell
 4,126 unique functions exist in
the RTSX-SU library
I3277 Macro Implementation
DBInverter
 3,730 of these macro library
configurations utilize BAntifuses
D3
3
2
D2
1
D1
1
0
1
Y
D0
1
0
Y
0
0
0
X
X
X
1
0
0
1
X
X
X
0
0
1
X
0
X
X
0
0
1
X
1
X
X
1
1
0
X
X
0
X
0
1
0
X
X
1
X
1
1
0
X
X
X
0
0
1
0
X
X
X
1
1
0
A0
S0
 16,879 different configurations
S0 S1 D0 D1 D2 D3
No output resistor
0
S1
B0
A1
D0
0
D1
1
D2
2
D3
3
Y
B1
S0
Six B-Antifuses
available per C-Cell
driven by DB-Inverter
S1
Un-programmed Antifuse (no connection)
Programmed Antifuse (connection)
 3,001 Macros have single B-Antifuse
configurations
 2,565 have no other option
XOR3 Macro Implementation Example
DBInverter
No output resistor
C
D3
C
D2
 337 Can be implemented without the
B-Antifuse map string configurations
 99 have a multiple B-Antifuse map
string option for macro implementation
0
1
Y
D1
D0
C
1
0
B
C
Y
0
0
0
0
0
0
1
1
0
1
0
1
0
1
1
0
1
0
0
1
1
0
1
0
1
1
0
0
1
1
1
1
0
A0
B
 None of the 3,730 have a don’t care
input available for additional loading
1
A
A
B0
A
B
C
Y
A1
A
B1
Six B-Antifuses
available per C-Cell
driven by DB-Inverter
B
=1
Y
C
Un-programmed Antifuse (no connection)
Programmed Antifuse (connection)
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
14
B-Antifuse Usage Statistics
Number of Single B-Antifuse Nets
vs. Aerospace ASQ
'32 Customer Designs
Raw Average ->
302
Raw Geometric Mean ->
222
Min ->
15
Max ->
572
3.7
5.1
75.2
2.0
'72 Customer Designs
Raw Average ->
673
Raw Geometric Mean ->
637
Min ->
314
Max ->
1,172
4.8
5.1
10.3
2.8
All Customer Designs
Normalized Average ->
645
5.0
Normalized Geometric Mean ->
527
Reliability Test Vehicle (RTV) Designs
RT54SX32SU-CQ208 ASQ
1,128
RT54SX32SU-CQ208 Colonel
35
RT54SX32SU-CQ208 General
21
RT54SX32SU-CQ208 NASA
29
RT54SX72SU-CQ208 ASQ
RT54SX72SU-CQ256 QBI
RT54SX72SU-CQ208 P7
A54SX72A-PQ208 QBI
A54SX72A-PQ208 P7
A54SX72A-PQ208 ALTE
A54SX72A-PQ208 HiSS
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
3,232
1,241
23
1,164
28
40
Paper #1028
6.1
1.0
32.2
53.7
38.9
1.0
2.6
140.5
2.8
115.4
80.8
n/a
September 7th - 9th, 2005
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HiBS
 Design Concept
 Maximize B-Antifuse utilization using CM8INV macros
 Maximize S-Antifuse utilization by routing c-cells in serial chain within
supercluster
S-Antifuse
ccell_in
I-Antifuse
B-Antifuse '1'
'0' '0'
B-Antifuse '1'
0
1
2
3
CLKA
'0' '0'
B-Antifuse '1'
0
1
2
3
'0' '0'
B-Antifuse '1'
0
1
2
3
'0' '0'
ccell_out[1]
0
1
2
3
S-Antifuse
I-Antifuse
B-Antifuse '1'
'0' '0'
B-Antifuse '1'
0
1
2
3
'0' '0'
B-Antifuse '1'
0
1
2
3
'0' '0'
B-Antifuse '1'
0
1
2
3
'0' '0'
ccell_out[2]
0
1
2
3
S-Antifuse
I-Antifuse
B-Antifuse '1'
'0' '0'
B-Antifuse '1'
0
1
2
3
'0' '0'
B-Antifuse '1'
0
1
2
3
'0' '0'
B-Antifuse '1'
0
1
2
3
'0' '0'
ccell_out[N-1]
0
1
2
3
S-Antifuse
I-Antifuse
B-Antifuse '1'
'0' '0'
B-Antifuse '1'
0
1
2
3
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
'0' '0'
B-Antifuse '1'
0
1
2
3
'0' '0'
0
1
2
3
Paper #1028
B-Antifuse '1'
'0' '0'
0
1
2
3
ccell_out[N]
September 7th - 9th, 2005
16
HiBS
 Routing within a supercluster to maximize S-Antifuse utilization
C-Cell Routing
S-Antifuse
ccell_in
Basic R and C Cells
FXI-Antifuses
C
R
C
C
R
C
C
R
C
C
R
C
C
R
C
C
R
C
Cluster
C
R
C
C
R
C
Super-Cluster
ccell_out1
 Routing technique on a device
Device Top
ccell_out(n)
ccell_out(n-1)
ccell_out2
ccell_out1
ccell_in
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
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HiBS A54SX72A-PQ208
Antifuse Utilization
B=>
4900
Antifuse between Local Track and input
S=>
2248
Antifuse between output track & input(semi-direct)
I=>
1755
Antifuse between horizontal segment & input
K=>
21
Antifuse between input & horizontal NCLK0 or NCLK1, or QCLK
8924 Low Programming Current Dynamic Antifuses
Antifuse between freeway & output track
UMA Algorithm
applies to all B, I,
S & K antifuses
All 4,900 B-Antifuses are
Single B-Antifuse nets
F=>
4024
G=>
0
Antifuse between output track & 2nd, 3rd, & 4th freeway on the net
H=>
0
Antifuse between two horizontal tracks
V=>
0
Antifuse between two vertical tracks
W=>
15
X=>
1774
Antifuse between horizontal segment & freeway
5813
High Programming Current Dynamic Antifuses
Antifuse between horiz segment & 2nd freeway on the net (old-style freeway)
14737 Total Dynamic Antifuses
J=> 44219
Antifuse between input & horizontal NVCC or NGND
M=>
24
Antifuse for I/O configuration options
Q=>
11
Silicon Signature afuse in silicon signature words
Y=> 15021
Antifuse between horizontal segment & vertical NVCC or NGND
Z=>
Antifuse between freeway & horizontal NVCC or NGND
6095
65370 Total Static Antifuses
80107 Total Antifuses
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
18
High B-Antifuse Stress Experiments
A54SX72A-PQ208 UMC 24 MHz
Expt
Vcca
(V)
TA/TJ (ºC)
T0
160h
500h
1000h
2000h
UMA
w/HiBS +
SAL
2.5
105/145
108/108
108/108
9/28/05
10/19/05
12/7/05
UMA
w/HiBS +
SAL
3.0
95/145
108/108
108/108
9/28/05
10/19/05
12/7/05
UMA
w/HiBS +
SAL
3.25
83/145
108/108
9/10/05
9/28/05
10/19/05
12/7/05
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
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Aerospace Space Qualification
Based on Shape Factor of A54SX72A (UMC)
Aerospace Long Term Experiment (ALTE)
B Antifuse ASQ Design Weibull
0.04
0.035
0.03
Percent Failure
0.025
0.02
0.015
0.01
0.005
0
1
10
1000
100
10000
100000
Hours
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
20
B-Antifuse FIT CALC for 32S
Aerospace Space Qualification
0.0307 to 0.0458 in 100K Hours = 307 - 458 FIT
 50 – 60% Confidence
5X for 0.2eV
 Tj = 150ºC
5X for Utilization
 Single B-Antifuse utilization 645 vs 3232
2.5X for Visibility
 5X < 10ns
 1X > 10ns
FITs = 307 to 458 / 67.5 = 4.6 to 6.8 FIT in 10
Years
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
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Aerospace Space Qualification
MAPLD 2005: Actel A54SX-A and RTSX-SU Reliability Testing Update
Paper #1028
September 7th - 9th, 2005
22