Transcript cp-progress

Cluster Processor Chip
• Requirements
70 trigger towers
160 Mbit/s
Din[107:0]
(BC Multiplexed)
– Capture and synchronise
– BC-De mux and error checking
Reset-DLL
– e/g, t/h Algorithm
System Clock-1
• Cluster Hits
• RoIs
– Readout of RoIs
Read out via VME
System Clock-2
En-Cal
Reset-Global
Error
Serial to
Parallel
Converter
&
Synchronisation
to LHC Clock
BCID De-Mux
& Error Detect
Threshold Registers
DLL
x4
Clock Alignment
Logic
Reset/Load
-Countes
Wr Address
18
(L)
18
(R)
Dual Port RAM
(40 X 128 deep)
Rd Address
Load-ShiftReg
Hits[31:0]
e/g, t/h
Trigger
Logic
&
ROI
Logic
Zero Hits
Saturation
• 108 at 160 Mbit/s
Data Monitor
'Scan Path'
(Second Configuration)
En-Scan
Error
– Process 4 x 2 x 2 TT Window
– Receive BC multiplexed data
Offset
En-Read-out
(L)
(R)
FIFO-FF
Data-VME[15:0]
20 bit ROI
ROS
Addr-VME [9:0]
20 bit ROI
FIFO (40 x 64 deep)
VME
CS*
Rd/Wr*
FIFO-EF
RoI-Data_L
0
Shift register @ 40MHz
RoI-Data_R
Rd/Wr-Strobe
0
DAQ/Level-2
data via ROD
JTAG Port
4
RAL
Instrumentation
System Design Group
Shift register @ 40MHz
RoI Read-out Logic
Viraj Perera
2-March-01
Cluster Processor Chip
• Requirements
– Set-up and diagnostic Logic (second configuration)
108 trigger towers
(BC Multiplexed)
System Clock
En-Cal
Serial to
Parallel
Converter
&
Synchronisation
to LHC Clock
432 bits
Data Monitor
'Scan Path'
160 Mbit/s
Din[107:0]
DLL
x4
Clock Alignment
Logic
Data-VME[15:0]
1- 16 registers (16 time slices)
Scan-Enable
JTAG Port
4
RAL
Instrumentation
Scan path readout
System Design Group
Viraj Perera
2-March-01
Cluster Processor Chip
• CP Chip Status
 All logic blocks designed and integrated
 Serial to Parallel conversion and Synchronisation
 BCID De-multiplexing logic
 Algorithm
 Readout logic
 Set-up and diagnostic logic implemented as a second configuration
– More simulations to be done
• Test vectors supplied by Steve Hillier
RAL
Instrumentation
System Design Group
Viraj Perera
2-March-01
Cluster Processor Chip
• Device
– Fits in XCV1000E-6
• Latency
– Seven, 40 MHz clock ticks (-6 device)
RAL
Instrumentation
System Design Group
Viraj Perera
2-March-01