Transcript 2001 ICDD CLINICS

2001
Denver X-ray Conference
Steamboat Springs, Colorado
50 Years of
Progress &
Development
50th Annual Denver X-ray Conference
Steamboat Springs, Colorado
July 30 – August 3, 2001
Sheraton Steamboat Resort and Conference Center
Attendance Figures
346
Registrations
74% US
26% non-US
Exhibit Figures
Exhibit Booths: 45
Tabletops: 4
Exhibiting
Companies: 37
Exhibitors: 200
15 Workshops
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W-1 Cement Analysis (Broton/Anzelmo)
W-2 Small Angle Scattering (Londono)
W-3 Intro to XRF (Jenkins/Croke)
W-4 Total Reflection (Zaitz/Wobrauschek)
W-5 Absorption Analysis (Rosenfeld)
W-6 Use of the Web as a Resource (Kottenhahn)
W-7 Maintenance and Calibration of X-ray
Fluorescence Spectrometers (Croke/Jenkins)
Workshops (con’t)
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W-8 Fundamental Parameters (Mantler)
W-9 Industrial Rietveld Applications (Morton/Simon)
W-10 Two-Dimensional XRD (Blanton/He)
W-11 Neutron Diffraction of Polymers (Gardner)
W-12 Specimen Preparation I (Broton/Anzelmo)
W-13 Maintenance, Alignment & Standards (Noyan)
W- 14 High Resolution XRD (Tanner)
W-15 Specimen Preparation II (Broton/Anzelmo)
Plenary Session
“Fifty Years of the Denver X-ray Conference”
Plenary Session
“Fifty Years of the Denver X-ray Conference”
THE VERY EARLY YEARS OF THE DENVER X-RAY CONFERENCE
W. Mueller, Colorado School of Mines, Golden, CO
THE DENVER X-RAY CONFERENCE: 1966 – 1979
J. B. Newkirk, Colorado Sports Equipment, Inc., Evergreen, CO
THE CHANGING YEARS: 1970 – 1980
C. Ruud, The Pennsylvania State University, University Park, PA
THE CHANGING YEARS: 1980 - 1997
P. K. Predecki, The University of Denver, Denver, CO
THE MODERN DENVER CONFERENCE
R. Jenkins, Emeritus, ICDD, Newtown Square, PA
14 Sessions
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C-1 New Developments in XRD & XRF Instrumentation
(Commercial) (Buhrke)
D-1 R.A. Young Rietveld Analysis (Stock/Snyder)
D-2 Pharmaceuticals & Combinatorial (Kidd)
F-1 John Criss Commemorative Session: Quantitative
XRF (Van Grieken/Gilfrich)
C-2 Synchrotron Applications (Macrander)
D-3 Industrial Applications – XRD (Chung)
D-4 Polymers I: Multi-Probe Studies (Gardner/Murthy)
Sessions (con’t)
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F-2 Capillary Optics (Havrilla)
C-3 Electron Beam (Goehner)
D-5 Stress Analysis I (Goldsmith/Sasaki)
D-6 Polymers II: 2DWAXS & SAXS Data Analysis / In Situ
Structure Development (Barton/Londono)
F-3 TXRF (Zaitz)
C-4 Microbeam Analysis (Janssens)
D-7 Stress Analysis II (Goldsmith/Sasaki)
Awards Presented
Barrett Award
Paul Predecki
presented the
2001 Barrett Award
to
David E. Cox
Emeritus, Brookhaven
National Laboratory
Jenkins Award
Bob Snyder
presented the
2001 Jenkins Award
to
Ron Jenkins
Emeritus, ICDD
Hanawalt Award
Cam Hubbard
presented the
Hanawalt Award
to
Ray Goehner &
Joseph Michael
Sandia National
Laboratory
Lecture: “Phase Identification Using Electron Backscatter
Diffraction in the SEM: A Powerful Tool for Materials Science”
Distinguished Fellows Award
Julian Messick
presented the
ICDD
Distinguished
Fellows Award
to
Ron Jenkins
Looking Ahead…
51st Annual Denver X-ray Conference
– Colorado Springs, CO
– 29 July –2 August 2002, at the Antlers Adam’s
Mark Hotel (Red Lion Hotel –overflow)
– Plenary Session: Applications of X-ray
Analysis to Forensic Materials, chaired by
David Rendle and Ron Jenkins
– Pick up your copy of the Call for Papers or see
the DXC 2002 poster
Looking Ahead…
52nd Annual Denver X-ray Conference
4-8 August 2003
Denver Tech Center Marriott, Denver, CO
Survey
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Conducting a survey to better understand the
impact that the choice of venue has on the
conference attendees
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Located on DXC website at
http://www.dxcicdd.com/02/2002survey.htm
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Tell us what you think!
Have an idea for a
workshop or session?
Let us know!
Send to [email protected]
The DXCOC plans the
program in March/April
of the year prior to the
conference.