Transcript Standard SPM Technology is not Optically Friendly
Nanonics Renishaw NSOM/Raman Combination 12.01.2003
Nanonics NSOM/SPM Systems Are The Only Scanned Probe Microscopes :
Capable Of Being Integrated With
• Renishaw Standard microRaman Systems which, like all microRaman systems, are generally based on upright microscopes which are preferred for their high light throughput
Capable Of Being Used to Obtain:
• Patented Shadow NSOM Raman TM NSOM Raman TM & Scattering Combined with Photon Tunneling
Capable Of Being Configured to Be Used Also With:
• Infrared Microscopes & SEMs, TEMs & FIBs
WHY?
Nanonics Renishaw NSOM/Raman Combination 12.01.2003
Standard SPM Technology
is not
microRaman, Optical or Electron/Ion Beam Friendly From The Top or Bottom or Both
Lens Cylindrical Piezo Probe Sample
Nanonics Renishaw NSOM/Raman Combination 12.01.2003
Fiber AFM Probes All Nanonics SPM Technology is microRaman & Optically & Electron/Ion Beam Friendly 1996 Photonics Circle of Excellence Award The Award Winning NSOM/SPM-100 Confocal TM World of Integrated Imaging 3D Flat Scanner
TM • >20 mm clear optical axis • 7 mm thin scanner • mms of rough scanning and >70 micron of fine scanning in
X
,
Y and Z
directions
Nanonics Renishaw NSOM/Raman Combination 12.01.2003
3D Flat Scanning Technology Permits SPM Possibilities Not Previously Achievable
Tip & Sample Scanning 3D Flat Scanners
All Nanonics’ Systems have the Hallmark of a
Free Optical or Electron/Ion Optical Axis
They also permit new avenues of flexibility both in terms of SPM instrumentation and probes
Nanonics Renishaw NSOM/Raman Combination 12.01.2003
Nanonics’ Provides the Only Systems Completely Compatible with Any Available SPM Sensor Standard Silicon Cantilevers Cantilevered Protruding Tip Optical Fiber Probes Cantilevered Nanoparticle Probes Cantilevered Multichannel & Multiwire Glass Probes 70 V 0 V Deep Trench Probe Cantilevered Nanopipettes for Gas & Liquid Chemical Delivery
Nanonics Renishaw NSOM/Raman Combination 12.01.2003
Nanonics Systems are the Only SPMs that Allow for Transparent Integration of The Previously Separate Worlds of
Raman and SPM
2002 Photonics Circle of Excellence Award
Nanonics Renishaw NSOM/Raman Combination 12.01.2003
Renishaw & Nanonics Provides For Full Integration of Instrumentation, Software & Photonic Signals
What new possibilities does this combination permit?
Nanonics Renishaw NSOM/Raman Combination 12.01.2003
Lens
Shadow NSOM Raman
TM
Can Only Be Performed by the Complete Renishaw/Nanonics Integration
Lens
•Raman Spectroscopy with CCD detection is ideal for difference spectroscopy •Nanonics has produced AFM sensors with an opaque nanoparticle exposed to the optical axis •Shadow NSOM Uses the Best Attributes of the Renishaw miroRaman with the Nanometric Positioning Ability of an On line AFM
Nanonics Renishaw NSOM/Raman Combination 12.01.2003
Lens
Scattering NSOM Raman
TM
Can Only Be Performed by the Complete Renishaw/Nanonics Integration
• Only the complete
Lens
integration that Renishaw and Nanonics Provides allows for Evanescent Field NSOM Raman TM • No fiber connection or software connection allows for such measurements
Nanonics Renishaw NSOM/Raman Combination 12.01.2003
In addition
to these New Modalities of NSOM/Raman
Only
a Fully Integrated Raman/AFM Allows Integrating AFM & Raman Imaging •
Correlate, As in the AFM Image & Spectra Above, Silicon Strain with Topographical Position in a NanoIndentation
•
Correlate Carbon Nanotube AFM Topography and Electrical Properties with Raman Signature Bands
•
Correlate Protein Pulling with Amide I and Other Vibrational Modes
•
Correlate Polymer Elasticity and Other Mechanical Properties with Vibrational Frequency
Nanonics Renishaw NSOM/Raman Combination 12.01.2003
All Nanonics Platforms Allow The Integration of the W
orlds of Electron and Ion Optics with SPM Another
First for Nanonics
Nanonics Sample Scanning Obstruction Free SPM Platform Viewing the AFM sensor on- line in a SEM