Transcript Electron microscopy in the Department of Materials

Electron microscopy in the
Department of Materials
The electron-microscopy group Web site:
http://www-em.materials.ox.ac.uk/
Department of Materials
University of Oxford
Modular courses
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A variety of modular courses in different aspects of electron
microscopy are held throughout the year. The local-access
section of the Web site gives details of forthcoming courses.
Those without prior experience should start with Basic SEM or
Basic TEM, as appropriate.
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It is important to get the timing right. These courses involve
considerable investment in effort and time. A common mistake is
to take a modular too soon, before specimens are available. The
basic courses are repeated twice each term, towards the
beginning and end of term. Plan accordingly. Some courses are
not given each term.
Department of Materials
University of Oxford
Basic SEM and TEM in Michaelmas
Term 2006
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SEM: Weeks 1 (9th/10th Oct) and 7 (22nd, 23rd
Nov) – next week
TEM: Weeks 2 (10th Oct) and 8 (27th Nov)
Sign up by contacting me as soon as possible –
deadline for week 1SEM and week 2 TEM
tomorrow.
Copy katherine.hartwell@materials
Only do these if you need instruction urgently.
You must commit the full time (2 days for SEM, at
least 4 for TEM initially).
Department of Materials
University of Oxford
To apply for other modular courses
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Discuss with your supervisor which course(s)
are appropriate. You will find details on the
EM group website.
Download a modular course request form
from the Website.
Return completed form to Katherine Hartwell
(preferably electronically):
[email protected]
Department of Materials
University of Oxford
Modular courses in Michaelmas Term
Modular training courses in electron
microscopy
Provisional dates
(Michaelmas Term 2006)
Introduction to Scanning Electron
Microscopy
(offered twice per term)
Dr M.L. Jenkins
G Chapman
Weeks 1 and 7
Given also in mid-September
Introduction to Transmission Electron
Microscopy
(offered twice per term)
Dr M.L. Jenkins (coordinator)
Dr J.L. Hutchison
G Chapman
Weeks 2 and 8
Given also in mid-September
Specimen preparation
Dr M L Jenkins, C Salter
Week 3
Energy-Dispersive X-Ray Analysis
Dr M.L. Jenkins, G Chapman
Week 4
FIB
Dr Y Huang
Week 5
WDS X-ray Analysis
Mr C.J. Salter
Week 9
EELS
Dr J L Hutcison,
Dr C.J.D. Hetherington
Week 6
High Resolution Electron Microscopy
Dr J.L. Hutchison
Week 7
Electron Backscattering Diffraction
(EBSD)
Dr A J Wilkinson
Week 6
Department of Materials
University of Oxford
Access to microscopes
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We have many instruments, ranging from basic to very sophisticated.
Details of the instruments and their capabilities are also given in the local
access section of the Web page.
To gain access to particular instruments, you (together with your
supervisor) will have to complete an access request form – which can be
downloaded from our Web site.
You will be required to describe your project and what you hope to
achieve. This helps us to ensure that you get the right advice and training.
For example, if you will need to use the sophisticated JEOL 3000F
FEGTEM you will first need to become an approved user of a more basic
instrument, then you will need to attend appropriate advanced training
modules, combined with one-on-one training.
Department of Materials
University of Oxford
Certificate of Competence in
Electron Microscopy
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The Certificate of Competence in Electron Microscopy is awarded to
researchers (including DPhil students, and post-doctoral researchers)
who successfully complete an approved set of graduate lectures and
modular training courses on a selection of electron microscopy (EM)
techniques.
The course includes a specified number of hours of practical work,
and in some cases the use of advanced techniques.
The certificate is not a formal requirement for those undertaking
training in electron microscopy techniques, but is an additional
qualification for researchers to gain during their time at Oxford, if they
wish to do so.
The time required to complete the certificate is flexible, it may be
completed within a year, but equally can be spread over the course of
a whole DPhil project or period of postdoctoral research.
Department of Materials
University of Oxford
The Course Structure (1)
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The exact title of your specialty will vary depending on
the area of specialisation you have chosen. In order to
successfully pass the Certificate, you must achieve the
following standards:
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pass at least two practical training modules, and one
relevant lecture course in the area or areas of specialisation
become an approved user of at least one microscope in the
area of specialisation, with at least 100 hours of
independent use. If you choose more than one area of
specialisation) you will need to log an additional 50 hours
for each additional specialisation
submit a portfolio of your work to the Director of EM
Facilities or his nominee, such work to be adjudged
competent.
Department of Materials
University of Oxford
The Course Structure (2)
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It is possible to obtain a certificate in more than one area
of specialisation – there are currently three areas: SEM,
TEM and analytical microscopy.
In such cases, you complete further complementary
training modules and lectures, or undergo individual
training in advanced techniques and the certificate will
state in which area or areas you have been deemed
competent.
The certificate will also detail modules and lecture
courses attended, and advanced training given.
Department of Materials
University of Oxford
Required training modules and lecture courses
Area of
specialisation
Practical training modules
Relevant lecture
courses
Microscopes for
approved user
status
Scanning Electron
Microscopy
Introduction to Scanning
Electron Microscopy
Scanning
Electron
Microscopy
Any SEM
IT for electron microscopy
Focussed ion-beam thinning
Electron Backscattering
Diffraction (EBSD)
Department of Materials
University of Oxford
Required training modules and lecture courses
Area of
specialisation
Practical training
modules
Relevant
lecture
courses
Microscopes
for approved
user status
Transmission
Electron
Microscopy
Introduction to
Transmission Electron
Microscopy
TEM Image
Interpretation
Any TEM
Focussed ion-beam
thinning
IT for electron
microscopy
Specimen preparation
techniques
Dislocation analysis
Weak-beam electron
microscopy
Department of Materials
University of Oxford
Required training modules and lecture courses
Area of
specialisation
Practical training
modules
Relevant
lecture
courses
Microscopes for
approved user
status
Analytical
Electron
Microscopy
Energy-Dispersive X-Ray
Analysis
WDS and Quantitative Xray Analysis
Electron Energy Loss
Spectroscopy and
Imaging
Analysis of Electron
Energy Loss Spectra
Advanced analysis
module
STEM and
Microanalysis
Advanced
microscopy
and
microanalysis
JXA 8800
JEOL 3000F
JEOL 2200FS
VG HB501
Department of Materials
University of Oxford
Registering for the Certificate
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All researchers wishing to undertake the
Certificate must register with Mrs Katherine
Hartwell by returning to her the registration
form found on the EM-group website :
(http://www-em.materials.ox.ac.uk/)
Researchers who register part the way through
their EM training will not necessarily qualify for
the Certificate.
Department of Materials
University of Oxford