Transcript CARBONS FOR STEELMAKING - National Institute of Technology

Prodding Magnetic Properties Of Electrodeposited Nickel
By Magnetic Force Microscope (MFM)
Arpita Das, A.Mallik, B.C.Ray
[email protected]
[email protected]
[email protected]
DEPARTMENT OF METALLURGICAL AND MATERIALS ENGINEERING
NATIONAL INSTITUTE OF TECHNOLOGY
ROURKELA
769008
Out lines
Why
The
Electrodeposited Nickel
Electrochemistry Principle
Acoustic
Principle
Cavitation
of Magnetic Force Microscope (MFM)
Experimental/

Conclusion
Results and Discussion
Why Electrodeposited Nickel?
Electronics:
MICRO CHIPS
MEMS GEAR
Magnetic Applications:
 Audio,
Video, computer memories
 Magnetic read/ write heads
SENSOR
INTEGRATED CIRCUIT
The Electrochemistry Principle
Electrochemistry on other methods:

Speed and accuracy.

Highly dense deposits.

Relatively low cost of application .

Selectivity and Specificity.
Deposition Parameters:

Current density, Potential

pH, Bath composition

Electrolyte circulation rate

Temperature, Pressure
Acoustic cavitation
Bubble
Bubble Collapse due
to Implosion
Fragmented Particle
Particles
•
Extreme fast mass transport
•
Affects the crystallization process
•
Degassing at the electrode surface
Principle Of Magnetic Force Microscope



Small cantilever is used to detect the magnetic
force between the tip and the sample.
Senses the stray magnetic field above the
surface of the sample.
Magnetic domain structure of the sample
achieved up to 50nm resolution.
Force between tip and sample
is given by
MFM modes
2
1
3
(Phase mode)
(Amplitude mode)
(TM Deflection)
Nickel Deposition ( Chronoamperometry)
0.000
0.000
-0.002
-0.002
-1V
-1.3V
-1.5V
-0.004
Current (A)
-0.006
Current (A)
-1.3V
-1V
-1.5V
-0.004
-0.008
-0.010
-0.012
-0.006
-0.008
-0.010
-0.014
-0.012
-0.016
-0.018
-0.014
0
5
10
15
20
0
Time (Sec)
5
10
15
20
Time (Second)
(Silent)
(Ultrasonic)
Table-I: Characteristic kinetic parameters of current transients with and without sonication
Potential
(V)
(10-2
Imax
A/cm2)
D × 10–14
(cm2 s–1 )
Tmax
(S)
Q (C)
N×1014
(cm–2)
SL
US
SL
US
SL
US
SL
US
SL
US
-1
-0.16
-0.065
3.989
0.09
0.5
20344
0.018
6
0.000
002
0.03
0.01
-1.3
-0.72
-2.2
4.0
3.4
1.25
94560
0.000
74
0.000
12
0.13
0.20
-1.5
-0.69
-1.3
0.39
0.48
1.01
45806
0.105
3
o.o11
8
0.05
0.25
XRD Analysis:
1200
1400
Ni(112)
Ni(311)
Ni(101)
Ni
1000
Intensity(arb.unit)
C(004)
1200
Intensity(a.u)
1000
C(211)
800
600
400
-1V
-1.3V
-1.5V
Ni(221)
1100
-1V
-1.3V
-1.5V
C(122)
900
800
C(003)
700
600
500
400
200
300
0
200
40
50
60
70
80
90
100
40
50
60
70
2(Degree)
(Silent)
(Williamson–Hall formula)
80
2(degree)
(Ultrasonic)
Table-2: Calculated Crystallite size and Stain of Ni deposits:
Potential (volt)
Silent
Crystallite size (nm)
-1
Ultrasonic
Strain(%)
Crystallite size (nm)
Strain(%)
132
0.005
78
0.008
-1.3
60
0.002
86
0.006
-1.5
22
0.032
23
0.02
90
100
SEM Analysis:
Ultrasonic
Silent
-1V
-1.3V
-1.5V
MFM analysis
Deposits in silent conditions
−1.3 V
−1.5 V
Deposits in sonicated conditions
MFM analysis
−1.3 V
−1.5 V
(Silent)
(Sonication)
Conclusions

From the XRD analysis it was found that the crystallite size decreases with ultrasonic
irradiation.
 Again
as the negative potential increases there is a grain refinement confirmed from
the SEM analysis. Again with increase in negative overpotential surface coverage is
more.

The magnetic domain structures are more uniform on the surface and the surface
roughness decreases with ultrasonic irradiation.

Our current understanding of the driving forces responsible for this transient behavior is
still inadequate and need more accurate measurement before close to a final conclusion.
References
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Thank You