Transcript MNCF August Update

Micro and Nano Characterization Facility
Girish Kunte
June 10th 2013
Agenda
• Equipment Usage Statistics
• MNCF – Updates
• MNCF – New Installations
Instrument Usage Statistics – Electrical Lab
Equipment Utilization Chart
500
450
400
Total hrs
350
300
250
200
150
100
50
0
NonDC PS1
office
Total
207 544
Unavailable 0
0
Downtime
0
0
Not Used
144 529
Used
63 15
DC PS Non2 office
207 544
0
0
0
0
9 490
198 54
DC PS NonDC PS Non
Non
RF PS
3 office
4 Office
Office
207 544 0 243 544 0 207 544
0
0
0
0
0
0
0
0
0
0
0
0
197 544
207 544
142 544
10
0
0
36
0
65
0
Instrument Usage Statistics – Mechanical Lab
Equipment Utilization Chart
500
450
400
Total hrs
350
300
250
200
150
100
50
0
AFM - NonBrukeroffice
Total
207 544
Unavailable 0
0
Downtime 189 508
Not Used
5
29
Used
13
7
NonMSA
office
207 544
0
0
0
0
88 527
119 17
NonUTM
office
0
0
207 544
0
0
0
0
202 544
5
0
NonSAM
office
0
207 544
0
0
0
0
207 544
0
0
Opt
NonProfilo
office
meter
0 207 544
0
0
0
0
193 544
14
0
Instrument Usage Statistics – Materials Lab
Equipment Utilization Chart
500
450
400
Total hrs
350
300
250
200
150
100
50
0
SEM - NonEDS office
Total
207 544
Unavailable 0
0
Downtime
0
0
Not Used
14 450
Used
193 94
SEM - NonCL office
207 544
0
0
104 291
36 213
67 40
FIB
207
0
72
79
56
Nonoffice
544 0
0
168
376
0
0
Zeta NonPALS office
207 544
0
0
0
0
151 544
56
0
XPS
207
49
0
47
111
Nonoffice
544
422
0
57
65
Instrument Usage Statistics – Optical Lab
Total hrs
Equipment Utilization Chart
500
450
400
350
300
250
200
150
100
50
0
mRaNonmanoffic
& PL e
SolarNonSimuoffic
lator e
NonFT_I
offic
R
e
Total
207544
Unavailable 0 0
Downtime 0 0
Not Used 95 501
Used
112 43
211544
0 0
0 0
168534
43 10
207537
0 0
207537
0 0
0 0
XRDXRDNonNon- powNonNonfour
SPMoffic Q Effoffic der/offic
offic
circl
e
e
Thin e
e
e
Film
0 207544 0 205544 0 207544 0 207 544
0 0
0 0
0 0
0 0
0 0
0 0
0 0
0 0
207544
203544
96 479
190 527
0 0 0
2 0
111 65
17 17
MNCF Updates
• AFM Issues:
– Issues with some modes in Bruker AFM – high noise etc.
– Issues worsened with time
– Found the AFM scanner has physical damage. Also AFM controller has
problems – Correct voltages not being sent to scanner
– AFM scanner and controller needs to be sent to Bruker Singapore for
repair.
MNCF Updates
• Login System:
– Kamal’s login system implemented
• Issues – Easy to bypass
– 2 Interns in MNCF – Developed similar system
• Earlier issues addressed
• Currently under test
• Will be implemented across MNCF next week by 10th
August
MNCF Updates
• Weekly Calibration / Test Reports
– Weekly test reports on each instrument to be generated in
MNCF
– Check all modes / capabilities of machines
– Will help identify potential problems, etc
MNCF – New Installations
• UV Visible Spectrometer is installed and
available for booking.
Thank You!