Transcript Document

2011 ITRS
Emerging Research Materials
[ERM]
December 11-14, 2011
Michael Garner – GNS
Daniel Herr – SRC
Paul Zimmerman, Intel
Work in Progress: Not for Distribution
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ERM Request of Korea ITRS Team
• Identify areas of common interest with ERM
• Identify new areas for potential ERM Focus
• Identify material & interface requirements
– Most critical requirements
– Status of materials and interfaces to meet requirements
• What is the best way to collaborate?
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Face to face meetings (Limited)
Teleconferences (Morning in Korea: How early?)
Polls* (Yes)
Review documents or positions
• 2013: Feedback on ERM Drafts
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ERM Potential 2012 Focus Areas
Device Materials
• Memory Device Materials
– Redox
– Select Device Materials (Desirable Non-linearities)
– Updates on other Memory Materials
• Logic Device Materials
– N-Ge & p-III-V Materials
• Processing
– Graphene & CNT Progress
– Nanowire Progress
• Beyond CMOS Materials
– Spin Materials
– Complex Oxide Properties
– Other
Work in Progress: Not for Distribution
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ERM Potential 2012 Focus Areas
Cont.
• Litho Materials
– Directed Self Assembly Progress
– Novel Resist
• FEP & PIDS Materials
– Monolayer and Deterministic Doping
– Gate leakage & interfaces
• Interconnect Materials
– Molecular Cu Barrier layers
– Carbon Interconnect Materials (CNT & Graphene)
• Contact Resistance
Work in Progress: Not for Distribution
• Resistance
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ERM Potential 2012 Focus Areas
Cont.
• Assembly & Package Materials
– Novel Polymers & Fillers
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Thermal conductivity
Mechanical Properties (CTE, Modulus, etc.)
Moisture Absorbance
Adhesion Properties
– High Thermal Conductivity Materials
– Interchip Electrical Interconnects
• Nanosolders (Low temperature)
• CNT Interconnects
– Energy scavenging
Work in Progress: Not for Distribution
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Next Steps
• ERM needs to identify Research Goals vs.
Production Goals
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Selector Device
• 2 Terminal Challenges
– Materials compatible with memory cell
– Non-linearity mechanism understood
• On/Off ratio (High current density)
• Thermal stability of mechanism
• Reproducibility of mechanism
– Interface films
• Contact resistance (big issue!! How low can we go??)
– Diode Switching Materials
– Resistive
• Metal Insulator
Transition
Work in Progress:
Not for Distribution
• Threshold switch
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Back-up
Work in Progress: Not for Distribution
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ERD Materials
• Memory Materials
– ERD
– STT for PIDS & FEP
• Logic Materials
– Alternate Channel Materials
– Beyond CMOS: Charge Based
– Beyond CMOS: Non-Charge & NonFET
• Potential ERM Workshops
Work in Progress: Not for Distribution
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Memory Materials
• Memory Materials
• Storage Class Memory Materials
• Select Devices
Work in Progress: Not for Distribution
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Memory Materials
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Ferroelectric Memory
Nanoelectromechanical (NEMM)
Redox RAM
Mott Memory
Macromolecular
Molecular
Work in Progress: Not for Distribution
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