Transcript Document
Recent Polarized Photocathode R&D at SLAC
D.-A. Luh, A. Brachmann, J. E. Clendenin, T. Desikan, E. L. Garwin, S. Harvey, R. E. Kirby, T. Maruyama, and C. Y. Prescott Stanford Linear Accelerator Center, Stanford, CA 94025 R. Prepost Department of Physics, University of Wisconsin, Madison, WI 53706
Highlights
• Current cathode in use (high-gradient-doped strained GaAsP) • Growth and preparation techniques for photocathodes and their weakness • Possible solutions/improvements and current progress
High-Gradient-Doped Strained GaAsP 25 ) 20 15 10 5 0 0 50 Laser pulse length : 100 ns Laser wavelength : 805 nm 100 150 Laser Intensity ( J) 200 250 • • • • Currently used in the accelerator Peak polarization ~82% @805nm QE ~0.4% @ 805nm No charge limit effect with available laser energy
High-Gradient-Doped Strained GaAsP • • • Cathode Growth Grown by Bandwidth Semiconductor Metal-Organic-Chemical-Vapor Deposition (MOCVD) Zn-doping 10nm 90nm • • • • • • • • Cathode preparation Anodized at 2.5V to form a ~3 nm oxide layer Waxed to a glass for cutting Degreased in boiling Trichloroethane.
Stripped surface oxide layer by NH Transferred into loadlock immediately.
Heat-cleaned at 600 Activated by Cs/NF 3 ° C for one hour co-deposition Heat-cleaned and activated twice 4 OH 2.5
m 2.5
m 0.25
m GaAs Surface Layer Active Layer GaAs 0.95
P 0.05
Dopant Concentration (cm -3 ) 5 10 19 5 10 17 GaAs 0.66
P 0.34
5 10 18 Graded GaAs 1-x P x x = 0 0.34
GaAs Buffer Layer GaAs(100) Substrate 5 5 10 10 18 18
Weakness of Current Cathode Growth and Preparation Techniques • MOCVD – The base pressure of MOCVD growth chamber is in high-vacuum range, compared with ultra high-vacuum in other techniques.
– MOCVD requires higher growth temperature.
– MOCVD growth mechanism is complicated.
• Zn-doping – The diffusion coefficient of Zn in GaAs is high at the heat-cleaning temperature we use.
– The heat-cleaning capability of Zn-doped cathodes is limited.
• Single strained layer – Strain relaxation in thick strained layers causes lower polarization.
Dopant Loss during Heat-Cleaning 0 • High-gradient-doped cathode shows charge limit effect after three activations at 600 C.
100 Time (ns) 200 300 2.5x10
12 2.0
1.5
1.0
0.5
0.0
0 2 activations 3 activations 4 activations 5 activations 100 200 300 Laser Intensity (uJ) 400 500
SIMS Analysis • SIMS (Secondary Ion Mass Spectroscopy) analysis confirms Zn dopant loss after repeated heat-cleaning at 600 ° C.
10 20 6 5 4 3 2 10 19 6 5 4 3 2 10 18 6 5 4 3 2 0 20 unused heat-cleaned for 5 hours at 600°C 40 Depth (nm) 60 80
Strain Relaxation in Thick Strained Layers • • • Strained layers start relaxing beyond critical thickness (~10nm).
Strained layers relax partially until reaching practical limit (~100nm).
Strain relaxation Lower polarization MO5-5868 MO5-6007 Active Layer Thickness (nm) 90 170 Polarization (%) ~82 ~70
Possible Improvements on Cathode Growth and Preparation • MBE (Molecular Beam Epitaxy) growth – High quality films – Ultra-high-vacuum environment – Lower growth temperature and simpler growth mechanism – More choices on dopants • Be/C doping – better heat-cleaning capability – Lower impurity diffusion coefficients in GaAs at high temperature • As-capped cathodes -- Lower heat-cleaning temperature • Atomic-hydrogen cleaning – Lower heat-cleaning temperature • Superlattice structure – Preserve strain in active layers polarization higher
MBE vs. MOCVD • Both SVT-3982 and MO5-5868 are high-gradient-doped strained GaAsP.
• SVT-3982 is MBE-grown Be-doped (SVT Associates).
• MO5-5868 is MOCVD-grown Zn doped (Bandwidth Semiconductor).
• Preliminary result shows that MBE grown cathode has better performance.
• Heat-cleaning capability of Be doped cathodes need to be determined.
100 80 60 SVT-3982 M05-5868 40 20 0 650 700 750 800 Wavelength (nm) 850 10 1 0.1
0.01
Atomic-Hydrogen Cleaning • The goal: to achieve good QE with lower heat-cleaning temperature • Thanks to Matt Poelker of Jefferson Lab for many discussions and helps.
• Cathodes are atomic-hydrogen cleaned, and then transferred into activation chamber through loadlock.
Preliminary Results from Atomic-Hydrogen Cleaning System • GaAs Reference Cathode: stripped its surface oxide by NH 4 OH, heat-cleaned, and activated • GaAs Test Cathode: No NH 4 OH stripping. Cleaning procedures are indicated in the figure.
• Atomic-hydrogen cleaning shows promising results. Cleaning condition needs to be optimized.
14 12 10 8 6 4 2 0 Atomic-hydrogen cleaned @ ~350°C, then heat-cleaned @450°C GaAs Reference Cathode GaAs Test Cathode Heat-cleaned @ 450°C 450 500 550 Heat-Cleaning Temperature (°C) 600
Superlattice Photocathodes • Critical thickness (~10nm) limits the size of strained active region. • Multiple quantum wells to preserve strain – Strained layers sandwiched between unstrained layers – The thickness of single strained layer is less than critical thickness.
• Band structure calculation to determine cathode structure parameters (well width, barrier width, and phosphorus fraction, etc.) • X-ray diffraction to characterize cathode structure (layer thickness, composition, and strain, etc.) • Photoluminescence to check cathode band structure
Superlattice Band Structure Calculations • • •
k •p
transfer matrix method (S. L. Chuang, Phys. Rev. B 43 9649 (1991))
D m
: transmission and reflection at interfaces,
P m
: propagation and decay in layers 1 2 3 4 N+1 N+2
A
1
B
1
T
T
A N B N
2 2
D
1 .
P
2
D
2 .
P
3
D
3 ...
P N
1
D N
1 • • Set
A N+2 = 1
,
B N+2 = 0
; Change incident electron energy, and look at
1/A 1
transmittivity.
for Transmittivity maximum Resonant tunneling Energy level
Multiple Quantum Well Simulation
Multiple Quantum Well Simulation • • QE ~ Band Gap Polarization ~ HH-LH Splitting widthBarrier = 50nm
Effective Band Gap HH-LH Splitting
X-Ray Diffraction -- Theory • • • • Bragg’s Law:
n
= 2
d
sin All lattice planes contribute to Bragg diffraction Every layer contributes a Bragg peak Repeating series of thin layers causes additional peaks
d
X-Ray Diffraction – Rocking Curves • • Test cathode: strained GaAs (004) scan – distance between layers GaAs Bulk Graded GaAs 1-x P x GaAs 0.64
P 0.36
Strained GaAs
Strained Superlattice GaAsP SVT-3682 and SVT-3984 GaAsP Strained GaAs 1000 Å 25 m 25 m Active Region GaAs 0.64
P 0.36
Buffer GaAs (1-x) P x Layer Graded GaAsP Strained GaAs GaAsP Strained GaAs GaAs Substrate 30 Å 30 Å T. Nishitani et al, SPIN2000 Proceedings p.1021
Strained superlattice GaAsP SVT-3682 and SVT-3984 CB1 1.65 eV 0.86 eV GaAsP GaAs GaAsP GaAs GaAsP • Photoluminescence confirms the simulation prediction HH1 LH1
Rocking Curve (004) scan from SVT-3682 Graded GaAs 1-x P x GaAs Bulk • Both SVT-3682 and SVT-3984 are superlattice cathodes: – MBE grown Be-doped (SVT Associates).
– Barrier width: 30Å – Well width: 30Å – Phosphorus fraction in GaAsP: 0.36
– Layer number: 16 – Highly-doped surface layer thickness: 50 Å Additional peaks from superlattice structure GaAs 0.64
P 0.36
• XRD analysis on SVT-3682 – Well Width = Barrier Width = 32Å – Phosphorus fraction in GaAsP: 0.36
Superlattice Cathode Performance • • • Peak polarization > 85% Good QE SVT-3984 was tested in Gun Test Lab at SLAC, and there was no charge limit effect with available laser energy.
100 80 60 40 SVT-3984 SVT-3682 20 0 640 660 680 700 720 Wavelength (nm) 740 760 780 1 0.1
0.01
Conclusion • • • MBE-grown Be-doped cathodes show equal or better performance than MOCVD-grown Zn-doped cathodes.
Preliminary test of atomic-hydrogen cleaning shows promising result.
First strained superlattice cathodes show very good performance.
To do • • • • Study the heat-cleaning capability of Be-doped and C-doped cathodes.
Optimize the process of atomic-hydrogen cleaning.
Study As-capped cathodes.
Test superlattice cathodes with different structure parameters