Transcript RoHS -Potential Reliability Issues
Reliability Issues and Mitigation Strategies for RoHS Compliant Assemblies
Dan Amiralian
RoHS -Potential Reliability Issues
RoHS – The EU Mandate to eliminate lead and enhance the recycling of electronics has generated seemingly equal amounts of concern and confusion. This presentation is intended to be a BRIEF overview of major reliability concerns and real-world mitigation strategies.
Don’t Let This Happen to YOU
Knowledge Overcomes Fear
Widespread Technical Concerns
Component Plating Connector Plating Board Plating Black Pad Kirkendall Voiding Board Flexing Fillet Cracking Ceramic Capacitors Tin Whiskers Fretting Corrosion Long-Term Storage Solder Wetting Electromigration Mechanical Shock Pad Liftoff PCB Material Creeping Corrosion Stress Relaxation Champagne Voiding Tin Pesting Solder Contamination Insufficient Hole Fill Popcorning (MSD) Conductive Anodic Filaments
What do the experts say?
"There are three kinds of lies: lies, damn lies, and statistics."
– Mark Twain
Range of Opinion
Lead-free (SAC) is better than lead SAC is no different than lead SAC has issues, but they can be overcome SAC has issues that present real-world problems that require mitigation We need to go back to lead
Which Watch Swiss Swatch Switch
Is applying for exemption to go back to SN63/37 due to reliability issues 30% Failure Rate Crystals Shorting Sub 32mil (.8mm) parts shorting 5% field failure rate to date This is not a unique experience
Keep it Simple – Two Major Concerns
Process Alloy used to solder Process Parameters Specific Concerns SMT BGA PTH Components Potential Contamination Inability to withstand process Finishes Unacceptable number of variables
A Reasoned Approach
RoHS isn’t going away There
IS
a reason High-Reliability electronics are exempt There ARE ways to mitigate reliability issues
Focusing on the Real World
Not enough attention paid to COMPONENT issues Most mitigation plans do not fit the real world Too much academic information and propaganda – not enough “in the trenches” information.
Component Issues
The Most Common failures are with the MOST COMMON Components Highest Incidence of Failures: Capacitors, PEMs and PCBs Inventory Control issues can lead to Pb contamination BGAs Package Sizes and Finishes are a concern
Chip Capacitors Major Concern
UMD study of field failures from 70 companies revealed 30% of ALL failures were Capacitors – mainly MLCCs
Multi-Layer Chip Capacitor Failure Characteristics
Faults not recognized by normal screening techniques Most likely in high capacitance devices of low voltage rating Not visible on the outside of the device Capacitance does not change but the leakage current may change dramatically
Why Do MLCC Fail at a Greater Rate with Pb Free Alloys?
Pb-Free alloys are stiffer More stress on component Pb-Free alloys require higher temperature and longer dwell times Cooling rate needs to be tightly controlled MLCCs may have inherent problems On cutting edge of material use
How Do I Mitigate MLCC Cracking in the Real World?
Existing Designs: Review Design and Access Potential Limit Requirement for Reworking MLCCs Develop Reserve New Designs: Place on top side only – be mindful of stress Select more Robust Components Limit Requirement for Reworking MLCCs Develop Reserve
# 2 PEMs
Plastic Encapsulated Microelectronics Tin Whiskers (Matte Finish) Popcorning Wire Bonds Flux Process Compatibility Wetting (Ag Pd) Process Cycles Processes and Practices Previously Permissible with SN63 need to be revisited
Mitigating PEM Failures
Review Allowed Processes Wavesolder Heat Cycles Review Component Specifications MSD Peak Temperature and Dwell Lead Frame Scoring vis à-vis Wavesolder
Develop Valid Failure Reporting and Reserve
RoHS Printed Circuit Board (WEEE Compliant)
A variety of RoHS Compatible Finishes OSP ENIG Silver Tin SAC HASL Material RoHS FR4 ISOLA Polyclad Special Issues Shelf Life Environment Appearance
Printed Circuit Board
Finish Survey – EU 31% ENIG 30% Don't Know 12% Pure Sn 9% Silver 9% Other 6% Sn Ag Cu 3% Pd/Au
Pad Finish, Tg, Td and Z-Axis Expansion are Important Factors Traditional FR4 after RoHS Processing
PCB Recommendations
ENIG Long History Best Overall Performance ISOLA 410 / 620 or Equivalent Designed for RoHS Best overall characteristics
Through Hole Considerations
RoHS Alloys do not act like SN63 MUCH longer wetting time Higher Temperature – STIFFER Material
Poor up-flow, Cracking and Pad Lift are real concerns
Mitigation of PTH Concerns
PROCESS MUST BE MORE FINELY DESIGNED AND CONTROLLED Trade-Offs need to be accessed Aspect Ratio to Specification Performance has to be reconciled Board FLEX / SHOCK
Ball Grid Array Concerns
RoHS Concerns -Ball Grid Array
Voiding Solder Fragility Thermal Issues Mechanical Shock Issues Plastic Devices High Pin Count Devices Process Cycles
Mitigation of BGA Concerns
PROCESS VALIDATION LIMIT VARIABLES Understand Risk
Over Time it will become obvious that High Pin Count BGAs and Multi Cycled BGAs processed RoHS WILL fail much more often, especially under certain conditions
The BEST Mitigation Strategy for RoHS Compliant Assemblies is Choosing the RIGHT PARTNER
Dan Amiralian