Transcript (ppt)

GLAST LAT Project
Gamma-ray Large
Area Space
Telescope
October 1st, 2004
TART recommendations
implementation and qualification
program results
Alessandro Brez
INFN - Pisa
[email protected]
GLAST LAT Tracker Anomaly Resolution Team
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GLAST LAT Project
October 1st, 2004
Agenda
Summary of the TART recommendations and their implementation
Peel test results
Test articles description
Thermo-vacuum test results
Conclusions
GLAST LAT Tracker Anomaly Resolution Team
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GLAST LAT Project
October 1st, 2004
TART recommendation 1
Qualification program
The qualification program has addressed the recommendations of the TART:
Main activities:
1.
2.
3.
4.
Tests and analysis of the materials and their compatibility to 3M2216
Revision of the assembly procedures and of the assembly environment
Construction of 3 tests articles to test different solutions implementing
the new procedures in a improved environment
Thermo-vacuum tests of the test articles
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GLAST LAT Project
October 1st, 2004
TART recommendation 2
Tungsten surface preparation
Recommendation:
Etch the tiles surfaces by MIL-HDBK-961B process (degrease +
acid bath) and prime with BR-127
Test the results with peel tests
Actions:
2 processes have been investigated:
GSFC adopted MIL-HDBK-961B and primed the tiles with BR-127
Vaiarelli (Venaria, Turin) Company process + Plyform BR-127 priming
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GLAST LAT Project
October 1st, 2004
Tungsten preparation: GSFC results
Verify BR-127 Primer Material and Process
with lap shear strength tests using 3M2216
and EA9309
Good results close or better than
manufacturer declared values with Al 6061
samples and 0.7mm W tiles
Check Cleanliness of 100m W Etched per
Modified MIL-HNBK-961B
Some silicone contamination on 0.1mm tiles
(bags?), no contamination from etched
surfaces after 120oC heating
Evaluate HF Etch on 100m W
Very poor peel tests results
(~1lb/inch=0.17N/mm). HF etching
abandoned
Evaluate Kapton Surface Preparation: tests
with abraded and unabraded kapton samples
Tests in progress
Generate Bell test samples Plyfrom style to
compare sand blasted tiles results
Tests in progress
Evaluate ammonium biflouride etch on
100m W
Some 2216 started to fail cohesively but specimens
tore in W due to rough edges.
Specimens have to be re-made with smooth edges
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Tungsten preparation: GSFC analysis of W tiles
Analysis Performed by: Debbie Thomas, Code 541/ Swales, 301-286-8577
Stringers
Figure 3. Cross section of tungsten foil showing
“stringers” of included material.~ 200X
Included
Material
Figure 5. SEM photograph of included material.
EDS revealed very high carbon, low tungsten content
in included material as opposed to tungsten base material
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Tungsten preparation: GSFC analysis of W tiles
Figure 6. The photograph on the left was taken on the metallograph (~ 200X) and the one on the
right was taken on the SEM. Both show an unusual expansion of the base material
(compare the photo on the left to the one in Figure 3 taken at the same magnification).
No clear conclusions.
The 120oC bakeout did not reveal extrusion of material from the W tiles.
Delamination of the W tiles themselves never observed
The anomalies can be related with the synterization process used for W tiles
The thick W tiles are from a W alloy (kulite alloy K1750) to have smooth and
machinable tiles
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Peel test of sand blasted tiles
First action:
W sand blasting : controlled and uniform roughness of the tiles
Qualification test: peel test
material
1N/mm~6lb/inch
F
sand
paper
Al oxide sand blasting
roughness Ra (um)
0.45
0.5
0.87
0.88
0.95
peel strenght (N/mm)
1.7
2.2
2.8
2.7
2.9
Thickness (mm)
Al
1.6
Hysol 934A
~0.1
W
0.1
3M2216
~0.1
Kapton
0.1
Hysol 934A
~0.1
Al
0.6
The debonding pattern at 1mm roughness was better:
At Ra=0.5m film left on Kapton
At Ra=1.0m film left part on Kapton and part on W
Tray MID 48 assembled with sand blasted tiles gave acceptable results
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October 1st, 2004
Peel tests of Turin etched tiles
The sand blasted coupons were cured at RT in normal atmosphere with a not quantified
mechanical pressure. Bond thickness 0.1mm. The Kapton foils were not abraded.
The etched coupons were cured at RT in a vacuum bag. Bond thickness ~60m. The
Kapton foils were abraded.
4 tests have been performed with etched and primed tiles
Results: in 1 case the adhesive layer was left part on W, part on bias circuit. Peel
strength=2.1N/mm, comparable with the sand blasted tiles taking into account the
different adhesive thickness.
In 3 cases there was a complete failure on the Kapton side with rather low and
disperse peel strength values (from 0.2 to 1.4 N/mm)
3 tests have been performed with etched tiles without primer.
In 2 cases the failure was on kapton side, peel strength=0.8,0.9N/mm
In 1 case some of the adhesive, in the central part of the tile, was left on bias circuit.
Observed a non uniform glue thickness. Strange pattern. Peel strength=1.4N/mm
Conclusions (qualitative)
The adhesion of the 3M2216 to the W tiles was generally good
The adhesion of the 3M2216 to the Kapton was often bad  need of
comparison tests of abraded and unabraded Kapton foils
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TART recommendation 3
Bias circuit preparation
•Roughen surface with Scotch Brite pads until sheen is removed
•Clean (acetone wipe + IPA wipe)
•Bake 60oC for 12hours
•Clean (acetone wipe + IPA wipe)
•Wait 30 min
•Bond
The process has been implemented in Plyform (INFN_LAT_MECH_008_2)
After the ambiguous results of peel the tests 2 sets of peel tests coupons have
been prepared with abraded and unabraded kapton foils glued on Al specimens
with 3M2216.
Peel strenght of unabraded samples = 1.1N/mm 0.5N/mm
Peel strenght of abraded samples = 3.5N/mm 0.35N/mm
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GLAST LAT Project
October 1st, 2004
TART recommendation 4,5
Tungsten bonding
The recommendation describes in details the W tile bond process and the
preparation of the adhesive with degassing.
The recommendations have been implemented
INFN_LAT_MECH_009_02
Adhesive preparation
INFN_LAT_MECH_006_02
Tungsten and bias circuit bonding
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GLAST LAT Project
October 1st, 2004
TART recommendation 6
Grounding of Tungsten tiles
Test article 2
Test article 2
Planarity 170m
Planarity 224m
A wire sticks out from
the tray after gluing
Grounded tile
MCM front
Not grounded tile
MCM front
Aluminum gold plated 55m wires
Test article 2
Planarity 139m
A wire sticks out
from the tray
after gluing
Conclusions:
The system does not guarantee the
tiles grounding
The vacuum extracts the wires to the
edge of the tray, very dangerous!
The wires seem to compromise the
final planarity of the tray
MCM front
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GLAST LAT Project
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Do we need W tiles grounding?
GFSC primed W tile
0.06mm 3M2216 film
(cured 15h at 40oC)
Al base
A
Any buildup charge will
disappear in few seconds
I
1.4
1.2
V
1
C=6nF
R=~1GW at 1V
t~6s
Giga-Ohm
Keythley 467
0.8
Breakdown
to 1.4KW
0.6
0.4
0.2
0
0
100
200
300
400
500
600
Volts
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TART recommendation 7,8
Process cleanliness, QA control
A detailed list of manufacturing rules have been dictated.
These rules have been incorporated in INFN-LAT-MECH-007-01
INFN personnel made detailed revision of all the Istruzioni di
Lavoro (Work Instructions) and will directly overlook the
construction of the first trays.
The real main effort to satisfy the request of a clean area
insulated from the rest of the Plyform activities, has been the
purchase of a clean-tent dedicated to GLAST tray assembly.
The tent will be ready to work on October 4th.
Mandatory inspection points have
been introduced:
1. Tile cleanliness and priming with
routinely peel results
2. Kapton preparation
3. Adhesive preparation and
deposition with hardness tests
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GLAST LAT Project
October 1st, 2004
TART recommendation 9
Non use of grid blasted tungsten
The 0.1mm sand blasted tiles are no more flat.
We cannot use them in any case  segregated
TART recommendation 10
Bond joint compression
steel vacuum chucks
tray
A possible cause of bubbles:
The Kapton is hold flat by
Bias circuit the tool during adhesive
curing. A local depression of
3M2216
the tray surface (50m or
more) could cause a bridge
effect
Proposed solution:
Add a compliant pad between tool and bias circuit to compensate the tray
irregularities.
A suitable material has not found up to now.
The test of this solution will be addressed again if needed.
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GLAST LAT Project
October 1st, 2004
TART recommendation 11
Alternate bond cure protocol
Cure the 3M2216 adhesive at 35oC in a oven for 18hours
Pro:
•Better controlled cure cycle.
•The whole cure cycle is under vacuum.
•At the beginning the adhesive is more fluid + higher temperature =>
better outgassing
Contra:
•Possible deformation of the tray due to CTE mismatch
2 test articles have been produced at 35oC
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GLAST LAT Project
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TART recommendation 12
Examine bonding integrity of the EM tower
Only one tray of the EM tower is representative:
The TOP TRAY has the W thin tiles + the final version of the bias circuit,
with the continuous Cu layer insulated by a smooth Kapton layer.
The TOP EM tray is equipped with dummy ladders
After the optical inspection, taping the tray and the ESPI test, we had
NO evidence of defects
726Hz,
first tray resonance mode
1251Hz,
Second tray resonance
mode
GLAST LAT Tracker Anomaly Resolution Team
2443Hz,
first ladder resonance
mode
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GLAST LAT Project
October 1st, 2004
Test articles
Test article
#1 MID045
#2 MID042
#3 MID049
To etching
Y
Y
Y
Primer
Y
Y
N
RT
35oC
35oC
Cure temp.
An operator error in top
bias circuit assembly
caused a misalignment
of the bias circuit and a
not perfect adhesion
Notes
Thermo-vacuum cycles (P<10-2mBar, min P=50bar)
Test temp.
(oC)
45 oC
50 oC
55 oC
60 oC
65 oC
70 oC
75 oC
Test
duration (h)
1h10’
3h
12h
3h
3h
3h
3h
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Top faces behavior
October 1st, 2004
Very good results of bias circuit
adhesion on face sheet up to 75oC
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GLAST LAT Project
October 1st, 2004
Bottom face #3 NO primer
60oC development of a Ø25mm
delamination
65oC debonding over 3 whole tiles
70oC one more tile debonded
Perfect clean W tile
Very good and uniform 3M2216 film on bias circuit
Very good adhesion to the previous glue layer (no Frecot55 pollution)
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GLAST LAT Project
October 1st, 2004
Bottom face #1 primer RT
Temp
start
N. bubbles
0
45
1
50
1
55
8
GLAST LAT Tracker Anomaly Resolution Team
60
8
65
8
70
10
75
11
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GLAST LAT Project
October 1st, 2004
Bottom face #2 primer 35oC
The best result in terms of
n. of little bubbles and
temperature stability
Temp
start
N. bubbles
3
45
3
50
3
55
3
60
3
GLAST LAT Tracker Anomaly Resolution Team
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3
70
5
75
5
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GLAST LAT Project
October 1st, 2004
TART qualification program
indications
The best results have been obtained with the configuration
Tungsten preparation To etching + BR-127
Bias circuit
Abraded and baked
Grounding of W tiles NO
Used Plyform clean room, clean
Process clenliness tent for production
Cure cycle
T=35C for 18h min.
These options + the specific procedures to match the TART
recommendations are included in the LAT-DS-01584 procedure
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