Transcript poster

A Diagnostic Test Generation System and a Coverage Metric
Yu Zhang and Vishwani D. Agrawal
Auburn University, Dept. of ECE
Auburn, AL, 36849, USA
1. Exclusive test
• C0: A fault free circuit
• C1: CUT with fault f1
• C2: CUT with fault f2
An exclusive test is a test that
detects only one fault from a
fault pair.
Exclusive
test vector
3. Diagnostic fault simulation
Example – 8 faults, 4 vectors
C1
CUT
fault f1
CUT
fault free
CUT
fault f2
D
C0
C2
sa0
CUT
fault free
C0
4. Coverage Metric
Number of detected fault groups
DC 
Total number of faults
C0  C1   C0  C2   1
Simplified:
C1  C2  1
Exclusive
test vector
5. Diagnostic Test Generation System
C1
CUT
fault f1
D
CUT
fault f2
sa0
C2
2. Exclusive Test Pattern Generation
1
sa0
10
3
22
20
2
14
16
11
6
21
15
7
23
6. Results for ISCAS’85 benchmarks
19
sa1
Detection test Generation
Circuit
y
Sa0 or Sa1
1
10
3
20
2
22
16
14
11
6
15
7
21
19
23
c17
c432
c499
c880
c1355
c1908
c2670
c3540
c6288
c7552
No. of Detecfaults
tion
vectors
22
524
758
942
1574
1879
2747
3428
7744
7550
7
51
53
60
85
114
107
145
29
209
FC
%
CPU
s*
DC
%
100.00
99.24
100.00
100.00
100.00
99.89
98.84
100.00
99.56
98.25
0.031
0.032
0.032
0.047
0.046
0.047
0.110
0.125
0.220
0.390
95.45
91.99
97.36
92.57
58.90
84.73
79.10
85.18
85.32
85.98
*Intel Core 2 Duo 2.66GHz, 3GB RAM.
Contact email: [email protected], [email protected]
Diagnostic test Generation
Excl. AboEquv.
vect- rted
pairs
ors pairs
1
18
0
10
2
20
43
29
108
87
0
0
12
0
453
247
397
433
842
904
DC
%
CPU
s*
0 100.00 0.030
13 100.00 0.031
0
98.40 0.031
55 100.00 0.051
287 72.57 0.131
54 88.96 0.066
98 89.62 0.336
111 92.69 0.420
172 86.87 7.599
236 86.85 2.181