Transcript Lecture 1
ELEC 5970-001/6970-001 (Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic Circuits Introduction Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University http://www.eng.auburn.edu/~vagrawal [email protected] 8/18/05 ELEC 5970-001/6970-001 Lecture 1 1 Course Objective • Low-power is a current need in VLSI design. • Learn basic ideas, concepts and methods. • Gain hands-on experience. 8/18/05 ELEC 5970-001/6970-001 Lecture 1 2 Low-Power Design • Design practices that reduce power consumption at least by one order of magnitude; in practice 50% reduction is often acceptable. • General topics – – – – – 8/18/05 Algorithms and architectures High-level and software techniques Gate and circuit-level methods Power estimation techniques Test power ELEC 5970-001/6970-001 Lecture 1 3 VLSI Chip Power Density Source: Intel Sun’s Surface Power Density (W/cm2) 10000 Rocket Nozzle 1000 100 8086 Hot Plate 10 4004 8008 8085 386 286 8080 1 1970 8/18/05 Nuclear Reactor 1980 P6 Pentium® 486 1990 Year 2000 ELEC 5970-001/6970-001 Lecture 1 2010 4 Specific Topics on Low-Power • Power dissipation in CMOS circuits • Device technology – Low-power CMOS technologies – Energy recovery methods • Circuit and gate level methods – Logic synthesis – Dynamic power reduction techniques – Leakage power reduction • System level methods – Microprocessors – Arithmetic circuits – Low power memory technology • Test Power • Power estimation 8/18/05 ELEC 5970-001/6970-001 Lecture 1 5 Power in a CMOS Gate VDD iDD(t) Ground 8/18/05 ELEC 5970-001/6970-001 Lecture 1 6 Power Dissipation in CMOS Logic (0.25µ) Ptotal (0→1) = CL VDD2 + tscVDD Ipeak + VDDIleakage CL %75 8/18/05 ELEC 5970-001/6970-001 Lecture 1 %20 %5 7 Power and Energy • Instantaneous power (Watts) P(t) = iDD(t) VDD • Peak power (Watts) Ppeak = Max {P(t)} • Average power (Watts) T Pav = [ ∫0 P(t) dt ]/T • Energy (Joules) T E = ∫0 P(t) dt 8/18/05 ELEC 5970-001/6970-001 Lecture 1 8 Components of Power • Dynamic – Signal transitions • Logic activity • Glitches – Short-circuit • Static – Leakage 8/18/05 ELEC 5970-001/6970-001 Lecture 1 9 Power of a Transition R VDD Power = CVDD2/2 C R Ground 8/18/05 ELEC 5970-001/6970-001 Lecture 1 10 Logic Activity and Glitches 1 2 3 6 d=2 8/18/05 5 4 7 d=1 d=1 d=1 ELEC 5970-001/6970-001 Lecture 1 11 Low-Power Design Techniques • Circuit and gate level methods –Reduced supply voltage –Adiabatic switching and charge recovery –Logic design for reduced activity –Reduced Glitches –Transistor sizing –Pass-transistor logic –Pseudo-nMOS logic –Multi-threshold gates 8/18/05 ELEC 5970-001/6970-001 Lecture 1 12 Low-Power Design Techniques • Functional and architectural methods – Clock suppression – Clock frequency reduction – Supply voltage reduction – Power down – Algorithmic and Software methods 8/18/05 ELEC 5970-001/6970-001 Lecture 1 13 Test Power • Power grid on a VLSI chip is designed for certain current capacity during functional operation: – Average current → heat dissipation – Peak current → noise, ground bounce • Problem – Tests like scan or BIST are nonfunctional and may cause higher than the functional circuit activity; a functionally good chip can fail the test. 8/18/05 ELEC 5970-001/6970-001 Lecture 1 14 Power Estimation Methods • Spice: Accurate but expensive • Logic-level – Event-driven simulation – Statistical – Probabilistic • High-level: Hierarchical 8/18/05 ELEC 5970-001/6970-001 Lecture 1 15 Student Evaluation • • • • 8/18/05 Homework (30%) – almost 1/week Class Project (30%) Student presentation (10%) Final Exam (30%) ELEC 5970-001/6970-001 Lecture 1 16