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Conclusion
•We have proposed a new method analyzing the 3-D current
spreading in LED chips and developed a design software tool.
•We confirmed that the distribution of the experimental light
intensity and the ESD-induced surface defects agree well with our
analysis of the results.
•It was also found that the electrode pattern affects the performance
of LEDs in view of light intensity distribution, saturation of light
power, and device reliability.
References
Sungmin Hwang and Jongin Shim, Member, IEEE,” A Method for
Current Spreading Analysis and Electrode Pattern Design in LightEmitting Diodes ,“IEEE TRANSACTIONS ON ELECTRON
DEVICES, VOL. 55, NO. 5, MAY 2008.