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報告人:洪國慶
Outline
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INTRODUCTION
EXPERIMENTAL DETAILS
RESULTS AND DISCUSSION
CONCLUSION
REFERENCES
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INTRODUCTION
a well-known fundamental problem needs to be overcome,
namely the efficiency “droop,” which is the reduction in
efficiency as current density increases.
Different mechanisms such as dislocation densities , heat effects,
Auger recombination , and carrier leakage from active region
have been widely discussed to explain efficiency droop behavior.
However, the major mechanism for efficiency droop behavior is
still not very clear.
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