The COROT CCD test bench. 1 : Observatoire de Meudon, LESIA. JT Buey 1, P.

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Transcript The COROT CCD test bench. 1 : Observatoire de Meudon, LESIA. JT Buey 1, P.

Slide 1

The COROT CCD test bench.
1 : Observatoire de Meudon, LESIA.

JT Buey 1, P. Bernardi 1, V. Lapeyrere 1, D. Tiphène 1 , B LeRuyet 1, R. Schmidt 1, J. Parisot 1

Meudon Observatory is involved in the development and making use of a CCD test bench dedicated to high precision photometry.
We are now testing the flight model, at least 10 chips, to :
* Check the measurements done by E2V (former Marconi, former EEV…).
* Realize specific calibrations : response versus the temperature ( and others).
* Establish criteria to choose the CCDs (4 over 10) for the flight.
CNES is responsible for the contract for the CCD flight model. E2V is the manufacturer of the CCD.
The Meudon observatory is responsible for the CCD test bench, the flight camera and electronics.
Current CCD 4280 in test with ZIF connector and
flex-ribond cable.
2k*2k of sensible area // 2k*2k of memory area

Main CCD characteristics :
• Thinned and backside illuminated : 90% of quantum
efficiency at 650nm..
• AIMO mode : dark current equals 0.5e/s at -40°C.
• Frame-Transfer : 0.225s for image transfer.
• Two outputs register : 10ms for a digitalized pixel.
• 30µm pic-to-pic flatness.
• Pixel size : 13.5*13.5µm. 2k*4k pixels.
• 3 sides buttable : 1.25mm between the sensitive area.

Main goals of the test bench :
•Technological test on the chip.
• Measurement of characteristics in function of
irradiation.
• Readout electronic and timing optimization.
• CCD Electrical Model characterization.
• CCD Flight Model characterization.
• Validation of high precision photometry.

The CCD test bench

*Temperature range : -55 to +40°C.
*Stabilization : < 0.05°C/hour.
*5 temperature probes : CCD and electronics.
* 3 axes motorized with 1 µm of precision.

The whole test bench : optics,
electronics, cryogenics... and the CCD!

The CCD 4280 inside the cryostat.
Temperature probe

CCD is read in windows (10) or all pixels.
Digitized pixel : 10µs.
Non digitized pixel : 1µs
Transfer line : 100µS
Read noise : < 10e-

Optical bandwith : 450-950nm
Spectral resolution : 10 or 1nm.
Optical source : pinhole or flat illumination.
We can simulate : different illuminations, temperature drift, jitter, defocusing...

The PRNU

The pixel response is a function of the wavelength, we show 3
typical images corresponding to 3 physical characteristics of the
CCD .

Quantum efficiency

In our application the Local PRNU on small surface is the most important
characteristic. It is calculated on 4096 windows of 32*32 pixels as the
standard-deviation (1s) of the pixels response of the different windows.
The PRNU is strongly dependant of the wavelength.
Local PRNU vs wavelength

Quantum efficiency

The quantum efficiency of the 10
flight models has been measured at
E2V, we plot here the mean value.

100
90
80
70
Qe (%)

60
2,50
2,30

40

2,10

Loc al PRNU

50

1,90

30

1,70

20

1,50

10

1,30

0
200

1,10

In the red (950nm)
---> Fringing

In the blue (420nm)
---> state surface and
AR coating.

CCD gain (µV/e-)

500

550

600

Voie droite

650

700

750

800

850

LinŽ
aire (Voie droite)

700

4500
3500
2500

500

The temperature dependence
of the quantum efficiency shows
great variation in the blue and red
part of the spectrum.

600

700

800

900

With typical target the variation of
the global response will be around
few 10-3 for 1°C variation.

10000
9000
8000
7000
6000
5000
4000
400

500

600

700
Wav elength (nm)

1000

y = -0,0046x + 4,0982

Parameters to choose the CCD

4,00
3,90
-52

-42

-32

-22

-12

-2

8

18

Comparison of 2 CCDs (flight models).

28

T (¡C)

The Full Well Capacity is measured on the 10 CCDs
In different configurations :
•With flat illumination (comparison withE2V results).
•With spot illumination, at different positions and with
2 different PSF (exoplanet and asteroseismology)

Dark Current and irradiation

Aton

From the images acquired on the bench we use modelisation to determine the useful arae on the
CCD. We show here the process to calculate the jitter noise.
Flat fields

Convolution with the PSF

Dark

350-550 nm
sum
Calculation of the jitter noise

550-750 nm

Jitter
750-950 nm

At beginning of life the dark current is less than
0.5e-/s at -40°C.
After irradiation :
• Mean dark current is from 3 to 10e-/s at -40°C.
• Defects appear : 1 pixel over 10.000 (>100e-/s).
The effects of irradiation do not impact significantly
on the other characteristics of the CCD.

1000

11000

4,20
y = -0,0048x + 4,1152

900

Temperature Coefficient of the Quantum Efficiency

Wav elength (nm)

4,30

4,10

800

900

We also measured the variation of the
video signal with the different
polarization
The sensitivity is about 1e/1mv of bias
voltage.

500
400

LinŽ
aire (Voie gauche)

600

W avelength (nm)

1500

Voie gauche

4,40

450

5500

FG/FG (ppm/¡)

CCD Gain vs temperature
4,50

0,50
400

Temperature coefficient of the CCD Response

Global response
with temperature

500

0,70

CCD Response

Gain versus the temperature
Full Well Capacity

400

Wav elength (nm)

Qe/Qe (ppm/¡)

In the green (700nm)
---> « center » of silicon

300

0,90

We obtain an image, each pixel
indicates the jitter noise at that position
We can choose the PSF for
seismo or exo field

Parameters priority
• For exoplanets :
• For seismology :
– Dark noise (will change!)
– Pixel capacity
– Jitter noise map
– Jitter noise map
– Quantum efficiency
– Quantum efficiency
– Pixel capacity
– Temperature coefficient
– Temperature coefficient

A way to show the different
parameters, the surface under the
curve increases with the quality of
the CCD.

All parameters

Best CCD!!

Benu

800

900

1000