Transcript Slide 1
Directly patterning ferroelectric films by nanoimprint lithography with low temperature and low pressure K.C. Hsieh and H.L. Chien Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan C.H. Lin National Nano Device Laboratories, Hsinchu, Taiwan C.Y. Lee Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan Journal of Vacuum Science & Technology B 24(6). Nov/Dec 2006, p3234-3236. Joanne Yim EE C235/NSE C203 M 2007 March 19 EE C235/NSE C203 1 Outline • Background – Why ferroelectric materials? – Conventional nanoimprint lithography – Direct nanoimprint on metals • Method – Gel precursor – Au/gel bilayer • Results • Summary/Questions Remaining M 2007 March 19 EE C235/NSE C203 2 Why ferroelectric materials? • Apply electric field to induce electric dipole moment • Used for: – Memory, sensors, actuators, optoelectronics • Large-area patterns • Examples: BaTiO3, PbZrTiO3 M 2007 March 19 EE C235/NSE C203 3 Conventional NIL • Shape, then harden some soft material into relief of desired pattern • Transfer pattern to substrate by etching • Processing speed/resolution limited by etching M 2007 March 19 EE C235/NSE C203 4 Direct nanoimprint – previously… • Semiconductor material – Excimer laser-assisted – Requires high power and high pressure • Metal films – 100MPa – Imprinted onto “soft” film • DIRECT = shape material, not some buffer – Must be malleable – Use “sharper” mold to reduce pressure M 2007 March 19 EE C235/NSE C203 5 Method 1 • MOD (metal organic decomposition) solution of Pb(Zr0.52Ti0.48)O3 with excess Pb • Spin coat ~200nm onto Si substrate • 120°C anneal to remove solvent, make gel & maximize hardness difference • Si mold apply at RT, 10-20MPa • Dry @ 120°C, pyrolyze @ 450°C, anneal @ 650-800°C to obtain perovskite phase • (higher T anneal = more complete perovskite structure) M 2007 March 19 EE C235/NSE C203 6 Method 2 • FE require some metal contact to apply electric field • Apply metal thin film and shape along with FE layer • Better – Less sticking – Less relaxation after mold release M 2007 March 19 EE C235/NSE C203 7 Results – FE gel • After imprint, features ~60nm high, much less than ~500nm mold height and gel depth • gel sticks to mold M 2007 March 19 EE C235/NSE C203 8 Results – FE gel + Au film Depth by AFM •14MPa (top) : 90nm •20MPa : 300nm M 2007 March 19 EE C235/NSE C203 9 Summary/Questions remaining • Malleable precursor can be directly imprinted • Combining with top metal film improves transfer • Thickness of Au film? – When will cracking begin? • Applicability to other material systems? M 2007 March 19 EE C235/NSE C203 10