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ITRI Industrial Technology Research Institute Evaluation of Proficiency Testing Results with a Drifting Artifact – An Example of Standard Resistor Chen-Yun Hung Center for Measurement Standards (CMS), Industrial Technology Research Institute (ITRI) Taiwan July 31, 2014 2014 NCSL International Workshop and Symposium 1 Contents Introduction Stability Testing Performance Evaluation Confidentiality Conclusions 2014 NCSL International Workshop and Symposium 2 Introduction Proficiency testing (PT) is an effective way to verify a laboratory’s measurement capability Through PT activities, participants can understand the differences between their measurement capabilities and those of other laboratories PT often leads to improvement in measurement competence and quality control In Taiwan, CMS/ITRI organizes the PT which focuses on calibration laboratories 2014 NCSL International Workshop and Symposium 3 Why CMS/ITRI? Industrial Technology Research Institute The biggest non-profit organization in Taiwan Half budget supported by the government About 6,000 employees in most industrial fields Center for Measurement Standards CMS operates the National Measurement Laboratory NML is the NMI in Taiwan (like a small NIST) Maintain 120 national measurement standards Quality Engineering Department organizes quality management system in CMS QED is also a PT Provider operated in accordance with ISO 17043, accredited by TAF (P002) 2014 NCSL International Workshop and Symposium 4 Certificate of accreditation Accreditation Number P002 2014 NCSL International Workshop and Symposium 5 Introduction (Cont.) This paper will present a PT scheme for standard resistors to demonstrate the evaluation of PT results with a drifting artifact A PT of standard resistors numbered “PT2012-KF01” was performed from October 2012 to February 2013 A total of 16 laboratories participated Two standard resistors with nominal values of 1 Ω and 10 kΩ were chosen as PT items Nominal Value 1Ω 10 kΩ Manufacturer Model Serial No. iET iET SRL-1 SRL-10k B2-9425105 B2-9425117 2014 NCSL International Workshop and Symposium 6 The flowchart of the PT scheme Start PT Orientation PT Parameter Sample Monitoring PT Item Data Retrieval Stability Testing Data Analysis PT Plan Final Report PT Instruction End 2014 NCSL International Workshop and Symposium 7 Stability Testing Ensure the PT items will not undergo any significant changes during the PT process If not, the stability should be quantified and regarded as an additional component of the uncertainty The criterion for allowing stability in PT2012-KF01 usta 0.3 u 2 lab, min u 2 ref Based on the guidelines for limiting the uncertainty of the assigned value in ISO 13528 where usta is the standard uncertainty of stability testing ulab, min is the minimum standard uncertainty of the participants’ results uref is the standard uncertainty of the reference laboratory’s result 2014 NCSL International Workshop and Symposium 8 Stability Testing (Cont.) The criterion for allowing stability in PT2012-KF01 usta 0.3 u 2 lab, min u 2 ref If the criterion is met The stability uncertainty will not affect the evaluation of the participants’ performance If the criterion is not met The stability should be regarded as an additional component of the uncertainty associated with the assigned value More than one assigned values would be provided to limit the effect of the uncertainty on the performance evaluation In some cases, PT items would be replaced based on technical expert judgment 2014 NCSL International Workshop and Symposium 9 Stability Testing for PT2012-KF01 Two months for stability testing before the PT was initiated Measured Value(Ω) Measured Value(kΩ) Nominal Value(1 Ω) 0.9991798 0.9991794 10.000755 Measured Value Max = 0.9991793 Ω min = 0.9991784 Ω 1Ω Nominal Value(10 kΩ) Measured Value Max = 10.000753 kΩ min = 10.000751 kΩ 10 kΩ 10.000754 10.000753 0.9991790 10.000752 0.9991786 Criterion for Allowing Stability 10.000751 PASS 0.9991782 10.000750 Date Uncertainties Nominal Value 1Ω 10 kΩ 2012/9/30 2012/9/28 2012/9/26 2012/9/24 2012/9/22 2012/9/20 2012/9/18 2012/9/16 2012/9/14 2012/9/12 2012/9/8 2012/9/10 2012/9/6 2012/9/4 2012/9/2 2012/8/31 2012/8/29 2012/8/27 2012/8/25 2012/8/23 2012/8/21 2012/8/19 2012/8/17 2012/8/15 2012/8/13 2012/8/9 2012/8/11 2012/8/7 2012/8/5 2012/8/3 10.000749 2012/8/1 2012/9/30 2012/9/28 2012/9/26 2012/9/24 2012/9/22 2012/9/20 2012/9/18 2012/9/16 2012/9/14 2012/9/12 2012/9/8 2012/9/10 2012/9/6 2012/9/4 2012/9/2 2012/8/31 2012/8/29 2012/8/27 2012/8/25 2012/8/23 2012/8/21 2012/8/19 2012/8/17 2012/8/15 2012/8/13 2012/8/9 2012/8/11 2012/8/7 2012/8/5 2012/8/3 2012/8/1 0.9991778 Date usta 0.00000020 0.0000004 ulab, min Ω kΩ 0.000008 0.00005 2014 NCSL International Workshop and Symposium uref Ω kΩ 0.00000015 0.0000015 Ω kΩ 10 Assigned Value Calibration values reported by NMI were used as assigned values in this PT scheme National Measurement Laboratory (NML) PT items were calibrated for three times by NML to ensure their stability If the differences between the three calibration values are all within the expanded uncertainty Assigned Value: Median of three calibration values If not Assigned Value: Average of the calibration values 2014 NCSL International Workshop and Symposium 11 Assigned Value for PT2012-KF01 Measured Value(Ω) Nominal Value(1 Ω) The differences between the three calibration values were larger than the expanded uncertainty 0.9991812 0.9991808 0.9991804 1Ω 0.9991800 0.9991796 0.9991792 0.9991788 0.9991784 2012/10/01 E120519A 2012/12/07 E120641A 2013/03/08 E130072A Date/Report No. Assigned Value (X): Average of the calibration values Two assigned values were provided One was the average of the first and second calibration values One was the average of the second and third calibration values Expanded Uncertainty of Assigned Value (Uref) Combine the reported uncertainty of the reference laboratory and the uncertainty of the difference between two calibration values 2014 NCSL International Workshop and Symposium 12 Assigned Value for PT2012-KF01 (Cont.) Measured Value(kΩ) Nominal Value(10 kΩ) The differences between the three calibration values were smaller than the expanded uncertainty 10.000760 10.000758 10 kΩ 10.000756 10.000754 10.000752 10.000750 10.000748 10.000746 10.000744 2012/10/01 E120520A 2012/12/07 E120642A 2013/03/08 E130073A Date/Report No. Assigned Value (X): Median of three calibration values Expanded Uncertainty of Assigned Value (Uref) The reported expanded uncertainty of the median Group Nominal Value I X II Uref X Uref 1Ω 0.9991795 Ω 0.0000004 Ω 0.9991801 Ω 0.0000005 Ω 10 kΩ 10.000752 kΩ 0.000003 kΩ 10.000752 kΩ 0.000003 kΩ 2014 NCSL International Workshop and Symposium 13 Performance Statistic En was chosen as the performance statistic En (x X ) 2 2 U lab U ref where x is the participant’s result X is the assigned value Ulab is the expanded uncertainty of the participant’s result Uref is the expanded uncertainty of the reference laboratory’s assigned value Criteria for performance evaluation |En| 1, “satisfactory” performance |En| > 1, “unsatisfactory” performance 2014 NCSL International Workshop and Symposium 14 PT Results for PT2012-KF01 PT results of the 1 Ω standard resistor in group I Measured Value(Ω) 1.0030 1.0020 Nominal Value(1 Ω) Measured Value Assigned Value = 0.9991795 Ω |En| > 1 1.0010 1.0000 0.9990 0.9980 (x – X) & Ulabis large 0.9970 0.9960 0.9950 Ref Lab-I C D E G K L O Lab Code 2014 NCSL International Workshop and Symposium 15 PT Results for PT2012-KF01 (Cont.) PT results of the 1 Ω standard resistor in group II Measured Value(Ω) 1.0000 0.9998 Nominal Value(1 Ω) Measured Value Assigned Value = 0.9991801 Ω 0.9996 0.9994 0.9992 0.9990 0.9988 0.9986 0.9984 Ref Lab- A B F II H I J M N P Lab Code Note: The value of Lab J is not available. 2014 NCSL International Workshop and Symposium 16 PT Results for PT2012-KF01 (Cont.) PT results of the 10 kΩ standard resistor Nominal Value(10 kΩ) Measured Value(kΩ) 10.0060 10.0050 Measured Value Assigned Value = 10.000752 kΩ 10.0040 10.0030 10.0020 10.0010 |En| > 1 10.0000 9.9990 9.9980 9.9970 9.9960 • CMS/ITRI only provided the PT results and suggestions Ref A B C D E F G H I J K L M N O P Lab Code • Did not judge whether the participants were qualified laboratories 2014 NCSL International Workshop and Symposium 17 Confidentiality Each laboratory is given a code that is mailed to the laboratory in a sealed envelope ISO/IEC 17043 4.10.1 The identity of participants shall be confidential and known only to persons involved in the operation of the PT scheme Only knows its own laboratory code The confidentiality should especially be considered when the assigned value of a drifting artifact is determined More than one assigned values are provided The number of assigned values should be controlled to avoid fewer participants in one group Using linear regression to predict the assigned value on a given day The transfer schedule is not publicly available PT items should be transferred to participants by PT provider 2014 NCSL International Workshop and Symposium 18 Conclusions CMS/ITRI has performed PTs in Taiwan for more than 10 years with the focus on calibration laboratories Ensuring the stability of artifacts always has been given a high priority CMS/ITRI shares a PT of standard resistors with quantified criterion for stability testing using statistical methods Most of standard resistor calibration laboratories in Taiwan have good measurement competence Although the PT items drift over time, it will not affect the evaluation of the participants’ performance by a welldesigned method 2014 NCSL International Workshop and Symposium 19 ITRI Industrial Technology Research Institute Thanks for your attention Chen-Yun Hung Email: [email protected] 2014 NCSL International Workshop and Symposium 20