Transcript Slide 1
Imaging without lenses S. Marchesini, H.N. Chapman, S.P. Hau-Riege, A. Noy H. He, M. R. Howells, U. Weierstall, J.C.H. Spence Current x-ray diffractive imaging methods require prior knowledge of the shape of the object, usually provided by a low-resolution “secondary” image, which also provides the low spatial-frequencies unavoidably lost in experiments. Diffractive imaging has thus previously been used to increase the resolution of images obtained by other means. We demonstrate experimentally here a new inversion method, which reconstructs the image of the object without the need for prior knowledge or “secondary images”. This new form of microscopy allows three-dimensional aberration-free imaging of dynamical systems which cannot provide a secondary low resolution image. UCRL-JC-153571 This work was performed under the auspices of the U.S. Department of Energy by the Lawrence Livermore National Laboratory under Contract No. W-7405-ENG-48 and the Director, Office of Energy Research, Office of Basics Energy Sciences, Materials Sciences Division of the U. S. Department of Energy, under Contract No. DE-AC03-76SF00098. SM acknowledges funding from the National Science Foundation. The Center for Biophotonics, an NSF Science and Technology Center, is managed by the University of California, Davis, under Cooperative Agreement No. PHY0120999. Experiment Layout of the diffraction chamber used for this experiment at BL 9.0.1 at Advanced Light Source, LBL Long WD External Optical Microsocope Phosphor Mirror 1 Removable Photodiode 1, Absorption filter. Undulator Sample Gold balls on SiN. Mirror 2 and PT 2 Sample Sample: 50 nm gold balls randomly distributed on SiN window (~100nm thickness and 22 m2) Au 50nm SiN 100nm Beam stops 80 mm. Zone plate monchromator 25 mm Energy dispersion Field limiting aperture. slit . 25 microns 5 microns Si substrate Side view of sample 105 mm =2.1nm (588 eV) Detector: 1024 1024 Princeton back-illuminated CCD Phase retrieval with blind support F (k ) I (k ) known, j unknown b=0.9 feedback s=2 gaussian width (pixels) s support estimated from Patterson function p(r) FFT (I(k )) j random support Amplitude constraint Missing low frequency components are treated as free parameters. t=0.2 threshold Every 20 iterations Hybrid Input Output Every 20 iterations we convolve the reconstructed image (the absolute value of the reconstructed wavefield) with a Gaussian to find the new support mask. The mask is then obtained by applying a threshold at 20% of its maximum. new support image reconstruction with shrink-wrapping support Measured x-ray diffraction pattern SEM 1 x-ray 20 100 Object support constraint Object 1000 Iterative reconstruction techniques require a known shape (support) of the object. Previous work has obtained that by xray microscopy. We reconstruct the support and the object simultaneously. No prior knowledge is needed. The reconstruction gives a better estimate of the support. The better support gives a better reconstruction. 300 nm This will enable single-molecule diffraction and high-resolution imaging of dynamic systems. Clusters of gold spheres 3D single cluster 5-7 clusters This particular 3D cluster was chosen to have a small number of balls for visualization purposes the algorithm also works with a much larger number of balls. Single clusters 2-4 clusters These simulations show that the algorithm works not only for twoclusters objects 8 clusters Gray-scale images and complex objects Rec. Rec. Orig. image Supp. image Histogram bugs with different histograms Without beamstop With beamstop The greyscale image demonstrates that the algorithm does not depend on any “atomicity” constraint provided by the gold balls. Number of electrons for a given density The use of focused illumination will allow users to select either one or two-part objects (which may be complex) from a field. Original object (each ball is multiplied by a constant phase) Complex probe Amplitude after probe The complex object is of particular interest since it is well known that the reconstruction of complex objects is much more difficult than real objects, but is possible using either disjoint, precisely known or specially shaped supports. Comparison of the reconstructed, support and original object amplitudes the real part is shown, blue is negative, red/yellow is positive. Shrink-wrap vs HIO 1 (iter) 0 50 75 2, σ=5 2 4 6 8 10 12 14 1 Supports 1, σ=0.5 0.5 0 0 σ indicates the size in pixels of the gaussian used to obtain the low resolution version HiO error Supports obtained by thresholding a low resolution version of the original object. 1-xcorr Original object adjusting support Support 1 Support 2 Support 3 Support 4 0.5 0 0 2 4 6 8 10 12 14 1 125 500 Rfact 250 Even for low noise, HIO can achieve a reasonable reconstruction only if the 16 support mask is set to the boundary known at essentially the same resolution to which we are reconstructing the object. The noise level at which our algorithm fails to reconstruct occurs when the noise in real space becomes larger than the threshold used to update the support. At this noise level the estimate of 16 the support will be influenced by the noise, and the algorithm will be unable to converge to the correct boundary. Notice that for complex objects, both the R-factor (error in reciprocal space) and the HIO errors do not correspond to the real error (1Xcorr) 0.5 2000 3, σ=25 4,Patterson adjusting support 0 0 2 4 6 8 10 12 14 16 increasing noise level (log2 scale, a.u.) We just performed 3D diffraction-imaging experiments •Complete coverage of reciprocal space by sample rotation •Use a true 3D object that can be well-characterized by independent means •Will use diffraction data to test classification and alignment algorithms Silicon nitride pyramid decorated with Au spheres Silicon nitride window with hollow pyramid Silicon Silicon nitride film 10 m 1 m Cross-section Compact, precision rotation stage Sample, prealigned on rod Precision v-groove experiment simulation We collected a complete data set with over 140 views with 1° angular spacing. Analysis is under way Conclusions The combination of an apparatus to measure large-angle diffraction patterns with our new method of data analysis forms a new type of diffraction-limited, aberration-free tomographic microscopy. The absence of inefficient optical elements makes more efficient use of damaging radiation, while the reconstruction from a three-dimensional diffraction data set will avoid the current depth-of-field limitation of zone-plate based tomography. The use of focused illumination will allow users to select either one or two-part objects (which may be complex) from a field. The conditions of beam energy and monochromatization used in these preliminary experiments are far from optimum for diffractive imaging and can be greatly improved to reduce recording times by more than two orders of magnitude. We expect this new microscopy to find many applications. Since dose scales inversely as the fourth power of resolution, existing measurements of damage against resolution can be used to show that statistically significant images of single cells should be obtainable by this method at 10 nm resolution in the 0.5-10 m thickness range under cryomicroscopy conditions. Imaging by harder coherent X-rays of inorganic nanostructures (such as mesoporous materials, aerosols and catalysts) at perhaps 2 nm resolution can be expected. Atomic-resolution diffractive imaging by coherent electron nanodiffraction has now been demonstrated. The imaging of dynamical systems, imaging with new radiations for which no lenses exist, and single molecule imaging with X-ray free-electron laser pulses remain to be explored. [1] S. Marchesini, et al. arXiv:physics/0306174 [3] H. He et al. Phys. Rev. B, 174114 (2003) [4] H. He, et al. Acta Cryst. A59, 143 (2003)