Transcript スライド 1 - Tokyo Institute of Technology
Ch.3 Overview of Standard Cell Design
TAIST ICTES Program VLSI Design Methodology
Hiroaki Kunieda
Tokyo Institute of Technology
4.1 Design Style
Design Method
Standard Design -------- Full Custom Design ----- Design by maker’s spec.
Design of all masks by customer’s spec.
Manual Design Cell-Based Design Custom Cell/ Full Custom Design
Standard Cell Design
Semi Custom Design ---- Design of routing wire & logic functions by customer’s spec.
Gate Array FPGA Design
Standard Cell Design
Design Using Standard Cell, pre-design by professionals.
Cells includes Verilog, Circuit, Layout Information for NAND, NOR, D-FF Logic Design and Layout Design done by CAD.
Logic Design --- by use of Cells with specified delays Layout Design – by use of Cells Generated Data is mainly interconnection wires.
List of Standard Cells
Inverter Inverting Buffer Non-inverting Buffer Tri-state Non-inverting Buffer AND 2, 3, 4 inputs NAND 2,3,4 inputs OR 2, 3, 4 inputs NOR 2,3,4 inputs XNOR 2,3 inputs AND-OR AND-OR-Inverter OR-AND OR-AND-Inverter Multiplexer 2 to 1 Multiplexer 4 to 1 Decoder 2 to 4 Half Adder 1bit Full Adder 1bit Pos Edge DFF Neg Edge DFF Scan Pos Edge DFF Scan Neg Edge DFF RS NAND Latch High-Active Clock Gating Latch Non-inverting Delay line Pass Gate Bidirectional Switch Hold 0/1 Isolation Cell
Standard Cell Design
Logic gates, latches, flip-flops, or larger logic Routing channels
Layout
Place & Rout
Standard Cell Library
Circuit description at RTL level Layout description in GDSII format TLF Format Data Logical information Transistor and interconnect parastics Spice netlist Power information Process, temperature and supply voltage
4.2 Cell
Library Design Flow I
Layout Design Mask Data GDSII
Cell Information Technology information
Abstract Generator Library Data LEF Circuit Data Netlist Extraction
I/O delay paths Timing check values Interconnect delays
Analog Environment Circuit Data TLF
Library Design Flow II
Physical Layout (gdsII, Virtuoso Layout Editor) Should follow specific design standards eg. constant height, offsets etc.
Logical View (verilog description or TLF) Verilog is required for dynamic simulation. Place and route tools usually can use TLF. Verilog description should preferably support back annotation of timing information.
Abstract View (Cadence Abstract Generator, LEF) LEF: Contains information about each cell as well as technology information Timing, power and parasitics (TLF) Transistor and interconnect parasitics are extracted using Cadence or other extraction tools (SPACE). Spice or Spectre netlist is generated and detailed timing simulations are performed. Power information can also be generated during these simulations. Data is formatted into a TLF file including process, temperature and supply voltage variations.
Library Exchange Format (LEF)
An ASCII data format, used to describe a standard cell library includes the design rules for routing and the Abstract of the cells, no information about the internal netlist of the cells 1. Technology: layer, design rules, via definitions, metal capacitance a. type: Layer type can be routing, cut (contact), masterslice (poly, active), overlap.
b. width/pitch/spacing rules c. direction d. resistance and capacitance per unit square e. antenna Factor 2. Site: Site extension 3. Macros: cell descriptions, cell dimensions, layout of pins and blockages, capacitances .
Timing Library Format (TLF)
TLF is an ASCII representation of the timing and power parameters associated with any cell in a particular semiconductor technology. The timing and power parameters are obtained by simulating the cells under a variety of conditions and the data is represented in the TLF format 、 The TLF file contains timing models and data to calculate 1. I/O delay paths 2. Timing check values 3. Interconnect delays
Standard Cell I
Standard Cell II
Layout
Cell Design Flow
VHDL Model
Synopsys Design Compiler
Verilog Model
Cadence Design Planner
DEF File
Cadence Silicon Ensemble VHDL -> Verilog Conversion Standard Cell Placement Standard Cell Routing
DEF File
Cadence ICFB
Verilog Model
Modelsim Export to Other Formats, SPICE Verification Verilog Verification
Layout Condition
parameter
Cell height Power rail width Vertical grid
Symbol
H W1 W2
value
36λ 2λ 4λ
figure
900 nm 50 nm 100 nm Horizontal gird Nwell height W3 W4 4λ 20λ+α 100 nm 525 nm 45 nm Process (λ=25nm, Minimum wire width=2λ)
V OHMIN
DC Characteristic
slope -1 slope -1 V OLMAX 7/31/2001 V ILMAX V IHMIN WLT Low High V OHMIN V OLMAX
Propagation Delay with loads
4.2 LSI Design Procedure
Logic Design
RTL Logic Synthesis Synthesis Netlist Scan Path Design Scan Netlist RTL Simulation Functional Verification Functional Verification Timing Analysis
Layout Design
Netlist ATPG Test Pattern Layout Design Layout Netlist Mask Data Functional Verification Gate Level Simulatior DRC/LVS