Transcript Presentation

Center of Excellence POEMES, IEES (CLEPS), BULGARIAN
ACADEMY OF
XRD in battery technology –
paste preparation
Source: S. Vasilev, to be published
SCIENCES
Center of Excellence POEMES, IEES (CLEPS), BULGARIAN
XRD in battery technology - paste processing
3BS
cured
Source: S. Vasilev, to be published
formed
bPbO2
ACADEMY OF
SCIENCES
Center of Excellence POEMES, IEES (CLEPS), BULGARIAN
ACADEMY OF
SCIENCES
Segments of the XRD patterns
for 4BS pastes prepared by the
semi-suspension technology
Source: D. Pavlov and S. Ruevski, J. Power Sources, 95 (2001) 191.
Center of Excellence POEMES, IEES (CLEPS), BULGARIAN
ACADEMY OF
SCIENCES
SGT positive plate structure
Sub-layers in the SGTP electrode and sample collecting points
PAM
Pb strap grid
interface
- sample
collecting point
Pb
CL
AMCL
PAM
5 - 7 samples
per cross section
XRD determinations in PAM/AMCL/CL
phase composition and average crystallite size
Source: B. Monahov, A. Kirchev and D. Pavlov, Influence of the current collector/PAM interface on the performance of VRLA batteries in the
partial state of charge duty, presented at the STORE conference, Oct. 20-21, 2003, Aix-en-Provence, France
Center of Excellence POEMES, IEES (CLEPS), BULGARIAN
ACADEMY OF
SCIENCES
SGTP battery at the end of cycle life:
In-depth phase composition distribution in PAM
100
100
phase composition, %
interface
80
80
interface + PAM
60
60
b-PbO2
b-PbO2
40
a-PbO2/tet-PbO
40
a-PbO2/tet-PbO
PbSO4
PbSO4
20
20
0
0
0
0,5
1
1,5
distance from strap, mm
2
2,5
0
0,1
0,2
0,3
distance from strap, mm
 constant phase composition in PAM
 major phase composition changes in the interface (CL+AMCL)
 the interface resistance probably rises rapidly at discharge
Source: B. Monahov, A. Kirchev and D. Pavlov, Influence of the current collector/PAM interface on the performance of VRLA batteries in the
partial state of charge duty, presented at the STORE conference, Oct. 20-21, 2003, Aix-en-Provence, France
Center of Excellence POEMES, IEES (CLEPS), BULGARIAN
b / 2, deg (2q )
b -PbO2 , d = 0,350 nm
0,8
0,4
0,0
0,5
1
1,5
SCIENCES
In-depth crystallite size
distribution in PAM
1,2
0
ACADEMY OF
2
b-PbO2 crystal size decreases
markedly in the interface
distance from strap, mm
1,2
b / 2, deg (2q )
a -PbO2 / tet-PbO, d = 0,311 nm
0,8
a-PbO2 / tet PbO crystal size
decreases in the interface
0,4
0,0
0
0,5
1
1,5
2
distance from strap, mm
1,2
b / 2, deg (2q )
PbSO4 , d = 0,300 nm
0,8
PbSO4 crystal size does not change in
the interface and PAM
0,4
0,0
0
0,5
1
distance from strap, mm
1,5
2
Center of Excellence POEMES, IEES (CLEPS), BULGARIAN
ACADEMY OF
SCIENCES
Contributions to VRLAB based on the XRD method
(in combination with EC polarisation and SEM)
1. Membrane model of the Pb/PbSO4 electrode
2. Semiconductor model of the Pb/PbO/PbSO4 electrode
3. Gel-crystal model of the PbO2 electrode.
4. Models of the influence of additives of Sb, Sn, Ag etc. on the structure
of the Pb/PbOn/PbO2 electrode, the PAM and the corrosion layer.
5. Models of the corrosion mechanisms and the corrosion layer structure of
pure lead and its alloys in sulphuric acid.
6. Model of the in-depth structure profile of the positive battery plate.
7. Model of the influence of expanders on the NAM structure.
8. Development of technologies for paste preparation, drying, curing and
formation.
9. Models of the degradation processes in PAM and NAM.