Transcript Title

KTH and my research
Jing Rao
Masters student
Benevento 2006 Summer school on ADC and
DAC Meterology
• System embedded pipelined ADC calibration
Jing Rao
KTH
Benevento 2006
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Royal Institute of Technology
(KTH)
• Located in Stockholm, Sweden
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12 500 Students
1 500 Ph. D. Students
3 300 Employees
36 Masters programs
Technical University
Jing Rao
KTH
Benevento 2006
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System Embedded Calibration
error
pilot
IFFT
DAC
Channel
ADC
FFT
pilot
f
f
• ADC error is measured based on errors in the
pilot tones
E frame
on pilot bins

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 R pilot  R pilot  pl  pl  WN
on pilot bins
• Use the errors in the pilot tones as the references to
adapt the parameters in the ADCs
Jing Rao
KTH
Benevento 2006
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My work (commencing)
• Calibrate errors due to residual
amplifiers in the pipelined ADC
• Utilize the system redundancy
---- Pilot tones
Extract and measure the errors in the
pilot tones
Low circuit complexity, low power, fast!
Jing Rao
KTH
Benevento 2006
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Thank you for your
attention
Questions?
[email protected]