Berkeley Nucleonics
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Transcript Berkeley Nucleonics
Berkeley Nucleonics
Instrumentation Since 1963…
Management Team
David Brown, President
Mel Brown, Director of Finance
35 Years, MS Electrical Engineering
Jim McQuaid, Director of Radiation Detection Applications
45 Years, MS Electrical Engineering
John Yee, Director of T&M Application
15 Years, BA Management
10 Years, BS Nuclear Physics
Robert Corsetti, Director of Sales
5 Years, BS Neuroscience
Test and Measurement
Industry Leading Specifications
Widest Range of Signal Generators
High Voltage, NIM, Optical, TTL, ARB, Pulse
Measurement Instruments
Amp Stability, Interface Options, Low Jitter
Scope, Digital Multimeter, Frequency Counter
Price / Performance
Channel Cost, Feature-Rich
Nuclear Detection
Radiation Detection Pagers and Identifiers
Spectroscopic Portal Monitors
Accredited Training Programs
Reachback and Program Support
US DoD, US DHS, Health Physics Certified
Domestic and International Support Offices
Life Sciences
Video Microscope
Feature-Rich Microscope
Academic, Research, Investigative, Industrial
High Voltage Stimulators
Neuroscience Research
Flagship Products
Test and Measurement
NIM Pulsers and Power Supplies
Radiation Detection
Scanning Microscopes
Special Function and Custom Development
Model 1105
Universal 400MHz Counter
Our new counter, the Model 1105, offers many modes of counting and
measurement. We offer Period, Frequency, Jitter and Time Interval counting. We
look at Min / Max and Average levels and Mean / Standard Deviation statistical
results.
Complementing our line of precision pulse and signal generators, the Model
1105 Universal Frequency Counter exceed the performance of existing counters
yet is manufactured using state of the art facilities and techniques. The result is
a budget stretching device for your application.
Model 1105
Features and Rear Panel
Ch3 —
Frequency —
Time Interval Resolution —
Duty Cycle —
Frequency Ratio —
DC Signals —
Temperature Stability —
Compliance—
up to 6GHz, standard
1mHz - 400MHz
40pS
Pulse Width >1nS
11 Digits / Second
15mV +2% of V
<1ppm
IEEE488.2 and USBTMC
Model 1105: Applications
Frequency Measurements
Math Functions to Compensate for Systematic Error
Pass/Fail Mode with Limit Testing
Production Testing
Ave, Min/Max and Standard Dev Test
Easy Control of Multiple Units with LAN
Production Testing