Transcript Document

New generation of Space
grade Analogue ICs
Nicolas Chantier
AMICSA 2006
October 3rd
National’s Space Capabilities
• Continuously Supplied ICs to the space industry since Space
electronics exist.
• Long TiD experience, including ELDRS guarantee at 10mrad/s.
• German designed libraries of SEL immune CMOS cells to
enable low power, high performance space worthy ICs.
• Choice of Space grade packaged IC or Space grade die
products.
• Self funded R&D, roadmap execution and EU job creation
through creation of value for Space customers.
© 2006 National Semiconductor Corporation
National’s Analog Capabilities
National’s analogue capabilities in Space applications :
• High Speed Signal Path.
– Telecommunication payloads.
– Radar / Lidar for scientific missions.
• Precision Signal Path.
– Attitude and Orbit Control System
– Travelling Wave Tube Amplifiers.
– Power management and distribution units
• Advanced CCD Analog Front Ends.
– Push-broom optical remote sensing.
© 2006 National Semiconductor Corporation
High Speed Signal Path
• Objective :
To enable significantly higher revenue per kg in orbit for satellite
operators!
Elimination of RF downconverters in L-Band payloads using ADCs with Ultra wide
input bandwidth.
Highest possible ENOB to minimize the ADC resolution to the minimum necessary nb
of bits.
Increased number of FDMA channels in Nyquist zone, thus increased revenue per kg
for satellite operators.
Advanced Space grade Package design to minimize lead inductance and resistance,
matched impedance lines in signal path, planes on the supply rails to minimize
noise induced by digital switching. Improved thermal characteristics.
© 2006 National Semiconductor Corporation
ADC08D1000WG-QV
5962-0520601VZA
• 8-bit dual, 1 GSPS, low power, CMOS ADC
– 8 bits output – 7.4bit ENOB at 500MHz input
– DNL : +/- 0.15LSB
– Bit Error Rate 10-18
– Interleave mode (2x sample rate)
– 800mW/channel at 1GSPS from single 1.9V
supply (3.5mW in power down)
– Multiple ADC Synchronization capability
– Fine adjustement of input full-scale range and
offset.
– Internal sample-and-hold function
– Guaranteed no missing codes
© 2006 National Semiconductor Corporation
ADC08D1000WG-QV
5962-0520601VZA
– Radiation tolerance solid – see reports.
– Available in Military and Space level versions
• Available January 2007
• Ceramic flat package with matched impedance lines,
ground plane, supply plane.
© 2006 National Semiconductor Corporation
ADC08D1000WG-QV
5962-0520601VZA
For more details see :
- ADC08D1000 datasheet
- Euro DesignCon 2004 paper
« Unique 1.6GSPS CMOS 8-bit 1.8V ADC delivers 7.26ENOB past Nyquist »
Robert Taft; Maria Rosaria Tursi, Chris Menkus; Valerie Pons; Paul McCormack
© 2006 National Semiconductor Corporation
Package of
ADC08D1000WG-QV
© 2006 National Semiconductor Corporation
ADC14155
• 14 bit 155MSPS CMOS ADC
– ENOB = 11.5 bits
– Low power consumption = 940 mW
– Dual supplies: 1.8V and 3.3V
– Solid radiation tolerance
– Available in Military and Space level versions
• Available July 2007
• 48 pin cerquad package (with short straight leads)
© 2006 National Semiconductor Corporation
Precision Signal Path
LMP2012
• High Precision Rail to Rail Output
Operational Amplifier
– Complete cancellation of 1/f noise in
amplifiers for DC and near-DC signals such as
AOCS sensors, thermistors.
– Guaranteed low offset drift over time
<0.006µV/Month; <2.5µV over lifetime.
– Guaranteed low offset drift over temperature.
– Power consumption : 930µA
© 2006 National Semiconductor Corporation
Precision strain gauge
Av = 60dB
CMRR > 108dB (with resistor tolerance given below)
Supply current = 930µA / Amplifier
½ LMP2012
+
-
½ LMP2012
+
-
R1
10k, 0.1%
R2
R2
2k, 1%
2k, 1%
R1
10k, 0.1%
R3
20Ω
© 2006 National Semiconductor Corporation
Precision Signal Path
ADC124S101
• 4 Channel, 1MSPS, 12 bit ADC
– 12 bits up to 1MSPS.
– 4 : 1 input MUX.
– 2.2 mW when sampling, 0.14µW in stand by.
– High Z outputs and CS function for MUX.
– Light weight 10 pin device.
© 2006 National Semiconductor Corporation
Bringing A to D conversion
closer to the sensors
ADC Sampling Clock
Serial Data IN (MUX select)
Serial Data OUT
N analog lines
from sensors
ADC124S101
Pressure
IR bolometers
Thermistors
etc…
x ADC
CS lines
Logic
decoder
4
ADC Selection
Large Nb of analog sensor
Measurement are digitised
early in the signal path.
4:1 MUX and serial output minimises
ADC pin count and thus nb of
interconnects
ADC addressing through through CS
and decoder minimises consumption
No compromise on precision when
Combined with LMP2012.
ADC124S101
© 2006 National Semiconductor Corporation
CCD Analog Front Ends for
Pushbroom Remote Sensing
• National’s technology enabled a very high number of
scanned pages per minute at any resolution in heavy
duty copiers.
• This intellectual property is now offered to Space
customers who need to achieve superior pixel rates.
• Objective : To double the current levels of pixel rate
in Pushbroom systems, allowing for significant
increase of picture resolution.
© 2006 National Semiconductor Corporation
CCD Analog Front Ends for
Pushbroom Remote Sensing
CCD Board
Current
Gen.
CMOS Timing
CCD
Analog Data
ASIC Board
AFE
Discrete
build
ASIC
LVDS clk
Future
Gen.
CCD
1 die
AFE+TG
ASIC
LVDS Data
• Integrates AFE and CCD Timing Generator.
– Enables Higher Page Rates, and faster CCDs.
– Reduces EMI Due to CMOS Clocks
• Allows the AFE to move closeer to the CCD sensor.
© 2006 National Semiconductor Corporation
CCD Analog Front Ends for
Pushbroom Remote Sensing
• National’s AFE integrates :
– Correlated Double Sampling.
– Sample and Hold
– CCD input biasing
– 3 channels; multiple operation modes.
– For each channel :
• 14 bit ADC for each channel.
• 9bit PGA
• Black level offset DAC.
– Fully programmable timing generator.
Preliminary datasheets available to customers under
Non-disclosure agreement.
© 2006 National Semiconductor Corporation
Questions ?