Transcript Slide 1

Application of the DRS Chip for
Fast Waveform Digitizing
Stefan Ritt
Paul Scherrer Institute, Switzerland
Question ?
4 channels
5 GSPS
1 GHz BW
8 bit (6-7)
15k$
March 14th, 2009
4 channels
5 GSPS
1 GHz BW
11.5 bits
1k$
USB Power
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Switched Capacitor Array
0.2-2 ns
Inverter “Domino” ring chain
IN
Waveform
stored
Clock
Shift Register
Out
FADC
33 MHz
“Time stretcher” GHz  MHz
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Switched Capacitor Array
• Cons
Dt
Dt
Dt
Dt
Dt
• No continuous acquisition
• Limited sampling depth
• Nonlinear timing
• Pros
• High speed (6 GHz) high resolution (11.5 bit resol.)
• High channel density (9 channels on 5x5 mm2)
• Low power (10-40 mW / channel)
• Low cost (~ 10$ / channel)
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DRS4
• Differential inputs,
differential outputs
• Sampling speed
500 MHz … 6 GHz,
PLL stabilized
• Readout speed
30 MHz, multiplexed
or in parallel
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PLL
WSRIN
DENABLE
DWRITE
REFCLK
IN0
DTAP A0 A1 A2 A3
LVDS
DOMINO WAVE CIRCUIT
MUX
CHANNEL 0
OUT0
CHANNEL 1
OUT1
CHANNEL 2
OUT2
CHANNEL 3
OUT3
CHANNEL 4
OUT4
CHANNEL 5
OUT5
CHANNEL 6
OUT6
IN7
CHANNEL 7
OUT7
IN8
CHANNEL 8
IN1
IN2
IN3
IN4
IN5
IN6
WRITE CONFIG REGISTER
• 8+1 ch. each 1024 cells
AGND AVDD DSPEED PLLOUT PLLLCK
ENABLE
• UMC 0.25 mm
1P5M MMC process
(UMC), 5 x 5 mm2,
radiation hard
FUNCTIONAL BLOCK DIAGRAM
WRITE SHIFT REGISTER
• Designed for the MEG
experiment at PSI,
Switzerland
WSROUT
STOP SHIFT REGISTER
RSRLOAD
SRIN
SRCLK
READ SHIFT REGISTER
MUX
OUT8/
MUXOUT
O-OFS
BIAS
ROFS
SROUT
RESET
CONFIG REGISTER
DVDD DGND
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How to minimize dead time ?
• Fast analog readout: 30 ns / sample
• Parallel readout
• Region-of-interest
readout
AGND AVDD DSPEED PLLOUT PLLLCK
PLL
WSRIN
DENABLE
DWRITE
REFCLK
LVDS
DOMINO WAVE CIRCUIT
IN0
DTAP A0 A1 A2 A3
MUX
ENABLE
• Simultaneous
write / read
FUNCTIONAL BLOCK DIAGRAM
CHANNEL 1
OUT1
CHANNEL 2
OUT2
CHANNEL 3
OUT3
CHANNEL 4
OUT4
CHANNEL 5
OUT5
CHANNEL 6
OUT6
IN7
CHANNEL 7
OUT7
IN8
CHANNEL 8
IN1
IN2
IN3
IN4
IN5
IN6
WRITE SHIFT REGISTER
OUT0
WRITE CONFIG REGISTER
CHANNEL 0
WSROUT
STOP SHIFT REGISTER
RSRLOAD
SRIN
SRCLK
READ SHIFT REGISTER
MUX
AD9222
12 bit
8 channels
OUT8/
MUXOUT
O-OFS
BIAS
ROFS
SROUT
RESET
CONFIG REGISTER
DVDD DGND
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ROI readout mode
delayed trigger
normal
stop
trigger stop after latency
Trigger
Delay
stop
33 MHz
e.g. 100 samples @ 33 MHz
 3 us dead time
 300,000 events / sec.
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readout shift register
Patent pending!
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Daisy-chaining of channels
Domino Wave
clock
Domino Wave
clock
1
enable
input
Channel 0
0
enable
input
Channel 0
0
enable
input
Channel 1
1
enable
input
Channel 1
1
Channel 2
0
Channel 2
0
Channel 3
1
Channel 3
1
Channel 4
0
Channel 4
0
Channel 5
1
Channel 5
1
Channel 6
0
Channel 6
0
Channel 7
1
Channel 7
DRS4 can be partitioned in: 8x1024, 4x2048, 2x4096, 1x8192 cells
Chip daisy-chaining possible to reach virtually unlimited sampling depth
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Simultaneous Write/Read
FPGA
0
1
Channel 0
0
1
Channel 1
1
0
Channel 2
0
Channel 3
0
Channel 4
0
Channel 5
0
Channel 6
0
Channel 7
readout
8-fold
analog multi-event
buffer
Expected crosstalk ~few mV
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Trigger an DAQ on same board
DRS4
trigger
DRS
MUX
• DRS readout (6 GHz samples)
though same 8-channel
FADCs
analog front end
• FPGA can make local trigger
(or global one) and stop DRS
upon a trigger
FADC
12 bit
65 MHz
FPGA
global trigger bus
• Using a multiplexer in DRS3, input signals can simultaneously digitized
at 65 MHz and sampled in the DRS
LVDS
SRAM
“Free” local trigger capability without additional hardware
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DRS4 Performance
Test Results
Bandwidth
Bandwidth is determined by bond wire and internal
bus resistance/capacitance:
850 MHz (QFP), 950 MHz (QFN), ??? (flip-chip)
QFP package
final
bus width
850 MHz (-3dB)
Simulation
Measurement
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Timing jitter
• Inverter chain has transistor
variations
 Dti between samples differ
 “Fixed pattern aperture jitter”
• “Differential temporal nonlinearity”
TDi= Dti – Dtnominal
• “Integral temporal nonlinearity”
TIi = SDti – iDtnominal
• “Random aperture jitter” = variation
of Dti between measurements
Dt1 Dt2 Dt3 Dt4 Dt5
TD1
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TI5
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Fixed jitter calibration
• Fixed jitter is constant over time,
can be measured and corrected
for
• Several methods are commonly
used
• Most use sine wave with random
phase and correct for TDi on a
statistical basis
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Sine Curve Fit Method
i
500 1024
   ( y ji  (a j sin(i
2
j 0 i 0
2
  j  i )  o j ))2  min
fj
yji
: i-th sample of measurement j
aj fj j oj : sine wave parameters
i
: phase error  fixed jitter
“Iterative global fit”:
• Determine rough sine wave parameters
for each measurement by fit
• Determine i using all measurements
where sample “i” is near zero crossing
• Make several iterations
j
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S. Lehner, B. Keil, PSI
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Fixed Pattern Jitter Results
• TDi typically ~50 ps RMS @ 5 GHz
• TIi goes up to ~600 ps
• Jitter is mostly constant over time,
 measured and corrected
• Residual random jitter 3-4 ps RMS
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Applications of the DRS4 Chip
What can we do with this technology?
Flash ADC Technique
PMT/APD
Wire
Q-sensitive
Preamplifier
Baseline
Shaper Restoration
PMT/APD Transimpedance
Preamplifier
Wire
FADC
60 MHz
12 bit
Amplitude
TDC
Time
FADC
5 GHz
12 bit
•
•
•
•
Digital
Processing
Shaper is used to optimize signals for “slow” 60 MHz FADC
Shaping stage can only remove information from the signal
Shaping is unnecessary if FADC is fast enough
All operations (CFD, optimal filtering, integration) can be done digitally
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How to measure best timing?
Simulation of MCP with realistic noise and different discriminators
J.-F. Genat et al., arXiv:0810.5590 (2008)
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On-line waveform display
S848
PMTs
“virtual oscilloscope”
template
fit
click
pedestal
histo
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Pulse shape discrimination
Example: /g source in liquid xenon detector (or: g/p in air shower)

g
(t  t 0 ) /τ s
(t  t 0 )/τ d 
 (t  t 0 ) /τi
V(t)  A e
 Be
 Ce
θ(t  t 0 )  [...]θ..  t 0  t r )


Leading edge
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Decay time
AC-coupling
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Reflections
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t-distribution
t = 21 ns
tg = 34 ns

Waveforms can
be clearly
distinguished
g
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Template Fit
• Determine “standard” PMT pulse by
averaging over many events  “Template”
 Experiment
500 MHz sampling
• Find hit in waveform
• Shift (“TDC”) and scale (“ADC”)
template to hit
• Minimize 2
• Compare fit with waveform
• Repeat if above threshold
• Store ADC & TDC values
Pile-up can be detected if two hits are
separated in time by ~rise time of signal
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Timing Big Systems I
LMK03000 Clock Conditioner
(National Semiconductor)
Jitter: 400 fs
Global
Clock
~20 MHz
Reference
Clock for
DRS4 PLL
2.5 MHz
Reference
Clock for
timing
channel
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Timing Big Systems II
Experiment wide
global clock
LMK03000
PLL
Domino Wave
DRS4
Chip
Channel 0
Channel 1
• Global clock locks all
Domino Waves
to same frequency and phase
Channel 2
Channel 3
Channel 4
Channel 5
• Residual random jitter: 25 ps
Channel 6
• Even better timing can be
obtained by clock sampling
Channel 8
Channel 7
• MEG Experiment: Single LVDS
clock distributed over 9 VME
crates
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Experiments using DRS chip
MEG 3000 channels DRS2
upgraded to DRS4 soon
MAGIC-II 400 channels DRS2
BPM for XFEL@PSI
1000 channels DRS4 (planned)
MACE (India) 400 channels DRS4 (planned)
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PET
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Availability
• DRS4 can be obtained from PSI on a “non-profit” basis
• Delivery “as-is”
• Costs ~ 10-15 USD/channel (1000-1500 JPY)
• USB Evaluation board as reference design
• VME boards from industry in 2009
32-channel
65 MHz/12bit digitizer
“boosted” by
DRS4 chip to 5 GHz
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Conclusions
• Fast waveform digitizing with SCA chips will have a big
impact on experiments in the next future
• DRS4 has 6 GHz, 1024 sampling cells per channel, 9
channels per chip, 11.5 bit vertical resolution, 4 ps timing
resolution
• ~4000 DRS channels already used in several experiments,
hope that other experiments can benefit from this
technology
http://drs.web.psi.ch
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Datasheet
http://drs.web.psi.ch/datasheets
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Signal-to-noise ratio (DRS3!)
0.52
SNR:
Crosstalk from trigger signal
ANALOG OUTPUT [V]
“Fixed pattern” offset error of 5 mV RMS
can be reduced to 0.35 mV by offset
correction in FPGA
0.51
0.5
0.49
1 V linear range / 0.35 mV = 69 dB (11.5 bits)
0.48
200
200
180
180
140
120
100
80
80
40
20
20
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0.51
0
0.48
0.52
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1000
100
40
0.5
OUTPUT VOLTAGE [V]
800
120
60
0.49
400
600
BIN NUMBER
140
60
0
0.48
200
160
OCCURENCE
Offset
Correction
160
OCCURENCE
0
0.49
0.5
OUTPUT VOLTAGE [V]
0.51
0.52
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Interleaved sampling
delays (167ps/8 = 21ps)
6 GSPS * 8 = 48 GSPS
G. Varner et al., Nucl.Instrum.Meth. A583, 447 (2007)
Possible with DRS4 if delay is implemented on PCB
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Constant Fraction Discr.
Delayed
signal
Inverted
signal
Sum
+
S
Latch
+
Latch
Latch
Latch
Latch
12 bit
Latch
Clock
<0
0
MULT
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