Transcript Document

Interconnect Reliability Testing
by
Dr. John W. Sofia
Analysis Tech
Phone: (781) 245-7825
Fax: (781) 246-6257
Email: [email protected]
Website: www.analysistech.com
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Trends in Electronic Interconnects
•
Larger numbers of interconnects / signals
•
Smaller (less robust) mechanical size interconnects
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Trends in System Costs
•
Decreasing cost-performance ratio
•
Increasing cost of system failure to end user
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Major Causes of Electronic Failures
Source: U.S. Air Force
Avionics Integrity Program
Reynell, M. 1990
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Event Detectors:
Test Systems for Interconnect Reliability Measurement
• Solder joints
• Separable connectors
• Crimp interconnects
• All advanced interconnects
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Joint Failure Mechanism:
Solder Joint Stress / Strain from Thermal Cycles
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Joint Failure Mechanism:
Solder Joint Stress / Strain from Vibration
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Event Detector Applications:
• Interconnect design and development
• Product evaluation for reliability
• Process control and quality monitoring
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Event Detector Application Industries
• Telecomunications:
Motorola, Lucent, Ericson, Nokia, …
• Automotive:
Ford, Chrysler, General Motors, …
• Computer:
Intel, Sun, IBM, AMD, Compaq, …
• Aerospace
Boeing, Lockheed, Rockwell, Hughes
• Medical:
Medtronic, …
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Event Detector Features
• 100% continuous electrical monitoring
• Conforms to testing standards:
(Stds: IPC-785, ASTM)
• Sensitive to very short duration events
• Ignores environmental noise (EMI, RFI)
• Easy long-term unattended operation
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Event Detector System Schematic
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Scanning–Channel System Schematic
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Event Detector Resolution
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Scanning-Channel System Resolution
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STD Event Detector Sensitivity / Noise Spectrum
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Comparison of High / Low Compliance
Event Detector Modes
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Gaussian Distribution Plot
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Failure Distribution Plot
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Weibull Plot
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Temperature Cycle Plot
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Temperature Cycle Plot With Failures
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