Transcript Tech Mgr - Elecfans

Revolution in RF Test
Formula LitePoint
Black Ma
2014-Apr
LitePoint Confidential
© 2012 LitePoint , A Teradyne Company. All rights reserved.
LitePoint
Confidential
Who is LitePoint
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•
LitePoint is
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LitePoint
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LitePoint
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LitePoint Delivers…
Innovation at the Intersection of
Wireless Technology
and Mass Production
Source: Earth 911, Info Dingo
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Confidential
Tablets
Smart
Appliances
Smart
Phones
Consumer
Electronics
Companies
Audio
& Video
Manufacturers
LitePoint
Consumer
Electronics
Smart
Appliances
Smart
Power
Grid
Chipset
Makers
Billions
of Devices
Consumer
Electronics
Consumer
Electronics
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What LitePoint matters with you
--Speed to Market & Cost Savings
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Innovation Drives Speed to Market
VS
VS
VS
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Maximize Lifetime Value
OPERATING
EXPENSES
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THROUGHPUT
TIME TO
MARKET
Quality
Don’t Sacrifice Quality
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Competitors
Throughput
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Why LitePoint
-- Formular LitePoint
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#1 Cellular multi-DUT Parallel Tester – Y2011
First Parallel Testing Solution
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Utilization Maximizing Technology (UMT)
•
Smart Multi-DUT Testing Architecture
- Optimized resource usage – best utilization
- Optimized hardware and software integration – highest throughput
•
Key Elements
- Dynamic Signal Control (DSC)
- Intelligent Signal Processing
- Smart Data Export
Built in Calibration
Point to Point Connections
Synchronized
Dynamic Reference Level Control
Captures
Per DUT Signal Detection
Dynamic
Signal
Control
DUTs
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Parallel Processing
Pipelined Data Transfer
Data
Capture
Smart Data Export
Data
Data
Processing
Data
Processing
Data
Processing
Processing
Data Export
Multi-Channel Measurement Architecture
Traditional
Test Architecture
supports only one measurement at a time
PWR
EVM
setup
setup
measure
ACLR
setup
measure
fetch

OBW
setup
measure
fetch
measure
fetch
fetch
IQxstream Architecture
Multiple instrument channels support multiple, simultaneous measurements
setup
setup
…
setup
setup
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PWR
Data
EVM
Data
OBW
Data
ACLR
Data
Capture
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Better Test Coverage, Less Test Time
W-CDMA
TX test example
Power Level 1
ILPC
ACLR
EVM
Power Level 2
I/Q Imb.
ACLR
EVM
I/Q Imb.
Time
I/Q Imb.
ACLR
I/Q Imb.
EVM
Power Level (dBm)
EVM
ACLR
ILPC
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Time
Slot
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Sequence-Based Test Programming
Methods require sending instructions to (“setup”) the DUT at the
beginning of each measurement in a series of tests
Traditional
Test Time
Traditional Non-Signaling
DUT + TE setup

meas
#1
TE setup
meas
#2
meas
#3
TE setup
TE setup
meas
#N
IQxstream Method:
 pre-program a “sequence” (several SCPI commands) only once
 IQxstream and then execute many times with one command
Sequence Based Non-Signaling
DUT setup
meas
#1
meas
#2
meas
#3
DUT setup
meas
#1
meas
#2
meas
#3
Execute test sequence
Load the test sequence
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IQxstream Enables Fastest Throughput
Tester “x” 1 DUT
signaling

IQxstream 1 DUT
non-signaling
IQxstream 4 DUT
non-signaling

 
Test Speed
>2X Improvement
Test Speed
>6X Improvement
6X More Throughput!
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Throughput -- more than RF Test Speed
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Offering Flexibility in Manufacturing
(And a smooth transition to automated, multi-DUT testing)
Automated Loading /
Panel Test
Manual Loading
Manual Loading
1-DUT Sequential
(1x1 ping-pong)
Multi-DUT Asynchronous
(4 devices in semi-parallel)
Multi-DUT Synchronous
(4 devices in 1 chamber)
Now
When you’re ready
2013 and before
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Why Does APT Work? (Example: TX Calibration)
1-DUT
0%
DUT control, settling time, NV write
70% Idle
30% Utilized
2-DUT
0%
60% Utilized
3-DUT
40% Idle
0%
90% Utilized
4-DUT
0%
10%
100%
Nearly 100% Utilized
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100%
APT Integration Requirements
• LitePoint APT easily PnP in any ATE SW with
minimal changes required
• Keys:
1. “Turn off” tester when DUT fails
2. “Turn off” tester when DUT passes
3. “Turn off” tester when DUT finishes (before NVs written)
• Upper S/W layer does not need to need to be:
1. “Multi-DUT aware” – just starts multiple 1-DUT programs
2. Aware of any other DUT program – all handled through in-box tokens
3. Thread safe
Zero Risk to any ATE SW
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Maximum performance using APT
•
Asynchronous Parallel Test drivers benefits
• Application side driver is written as a single threaded driver
• No shared memory, or application side synchronization required
• Works with 1 – …n DUT’s.
• Plugs into existing API’s from any test framework without any architecture
changes required.
• Maximum performance achieved with simple API call to turn off the
Generator when testing is completed. (Pass, Fail, Abort, Prior to NVM)
• Works for both calibration and verification
• Common core driver can operate in multiple modes of operation
• Exclusive Resource
• Maximum distribution
• Shared Resource
• Cadence Enforced Mode ( CEM-1, CEM-2, CEM-4)
• CEM-1 = 1x1x1
• CEM-2 = 1x2x2
• CEM-4 = 1x4
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“Asynchronous” Does Not Mean “Chaotic”
•
New token priority system helps manage asynchronous test processes
•
Key benefits:
- Ensures maximum operator efficiency in the factory – minimal idle time
- Asynchronous processes do not need to be aware of other processes
Unmanaged Asynchronous Processes
Maximum Asynchronous Distribution
DUT #1
DUT #1
DUT #2
DUT #2
DUT #3
DUT #3
DUT #4
DUT #4
Time
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Synchronizing Asynchronous Processes
How do we go from:
…to here?
Here
DUT #1
DUT #1
DUT #2
DUT #2
DUT #3
DUT #4
Asynchronous
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DUT #3
DUT #4
Synchronous
Combining APT & SPT
•
By leveraging token prioritization, the test program can automatically align
multiple asynchronous processes
•
Key benefits:
- Same operational benefit of APT, and eliminates wait time between Cal and Ver
- Again, asynchronous processes do not need to be aware of other processes
Asynchronous Processes
Synchronous Processes
DUT #1
DUT #1
DUT #2
DUT #2
DUT #3
DUT #3
DUT #4
DUT #4
Time
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Technology Trends: Multi-DUT and Panel Test
4 / 8 DUT, Asynchronous & Synchronous Parallel Test
1-DUT / Ping-Pong
4 / 8-DUT Asynchronous
4 / 8-DUT Synchronous
     

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LitePoint – Continuous Throughput Improvement
Throughput
Test innovation enabled through
close cooperation with chipset
providers and OEMs
•
4 / 8 DUT Parallel
Test (WiFi / BT)
IQxel-M
•
First in Multi-DUT
Parallel Test (2G/3G/4G)
IQxstream
•
•
MPS
FAST PER
IQ2010
2008
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2011
2013
2014
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Concurrent Test vs. Serial Test
Traditional approaches
test multiple radios
serially (“one at a time”)
WiFi
Bluetooth®
GPS / GNSS
Serial testing requires long test times
FM
Serial Tester
WiFi
BT
GPS
GN
SS
FM
Test time
IQxel-M offers
concurrent testing
of multiple radios
WiFi
Bluetooth®
WiFi
GPS/GNSS
FM
GPS
FM
BT
GN
SS
Concurrent testing
Significantly reduces
test time
Up to 50%
Test time
* DUT O/S must support concurrent test
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Multi-DUT Configuration
Connectivity
VSG
Signal
Routing
Connectivity
VSA
Broadcast
VSG
Navigation
VSG
•
Example set up of 4 smart phones for WLAN/BT, GPS / GLONASS and FM test
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Flexible Multi-DUT Testing
Manual Loading
Manual Loading
Automated Loading
1-DUT Sequential
(1x1 ping-pong)
Multi-DUT Asynchronous
(4 devices in semi-parallel)
Multi-DUT Synchronous
(4 devices in full parallel)
Now
When you’re ready
2013 and before
a smooth transition to automated, multi-DUT testing
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Formula LitePoint – Real Cases
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META Turbo for MTK
Fromula LitePoint
DUT
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DUT1
DUT2
DUT3
DUT4
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CFT Turbo for SpreadTrum
Fromula LitePoint
DUT
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DUT1
DUT2
DUT3
DUT4
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META Turbo Promotion
Cal + Verf，MTK ATE
GSM 3bands，WCDMA 2bands
Boot up
148s
Test time/DUT
25s
104s
Test Time
25s
55s
123s
81s
55s
*Turbo
approcah hide
all boot up
time cost
UPH: 1.7x higher
Same Tool, same operation
Less stations, operators,
and PCs.
UPH
2.7
1.0
1.4
65pcs
24pcs
AG8960
(1-DUT)
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34pcs
IQXS
(1-DUT)
IQXS
(4-DUT)
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Before: you have to
Many manufacturers still rely on
stacks of large outdated devices, that
are expensive and hard to manage.
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Today: You and LitePoint
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Providing Best Test Economics
Focus on the problem
- Purpose-built for manufacturing to achieve lowest test cost, highest reliability,
and best test yield
- Operational innovation through Continuity Fault Detection and automated
path loss calibration
Minimize test costs – maximize product quality
- Reduce test times while increasing test coverage
Pioneering multi-DUT test
- Maximizing parallelism with minimal resource idle time
- Future-looking test techniques with concurrent test engines
Support
- Providing wireless measurement expertise – not just instrument support
- Providing total chipset solutions, enabling optimal performance
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Global Footprint, Local Support
Copenhagen
Gumi
Chicago
Sunnyvale
San Diego
Chengdu
Haifa
Shenzhen
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Tokyo
Shanghai
Taipei