Transcript Orbitrap Fusion MS Instrument Control Software v - orsburn

WiSIM DIA Method Set-up
Orbitrap Fusion MS
MS Instrument Control Software v.1.1 SP1
Proprietary & Confidential
The world leader in serving science
1
WiSIM DIA, how does it work?
• Unique to the Orbitrap Fusion MS:
• Three HR/AM SIM are used to cover precursors ions from 400 to 1000
m/z
MS1 ultra high resolution quantification
• In parallel with each HR/AM SIM scan, 17 sequential Ion Trap CID
MS/MS with 12 amu isolation windows are acquired to cover the
associated 200 amu HR/AM SIM mass range
MS2 confirmation
tSIM Orbitrap
SIM 400-600 amu
SIM 600-800 amu
SIM 800-1000 amu
tMS2 Ion Trap
406 418 430 442
2
598
606 618 630 642
898
806 818 830 842
998
Ion Trap
OT
240k
3
1st MS1
MS2 No. 1
…
…
…
…
…
…
MS2 No.17
2nd MS1
MS2 No. 1
…
…
…
…
…
…
MS2 No.17
3rd MS1
MS2 No. 1
…
…
…
…
…
…
MS2 No.17
SIM 400 – 600 m/z
17 Windows of
12 amu each
SIM 600 – 800 m/z
3.6 sec
Ion Trap
OT
240k
Ion Trap
OT
240k
WiSIM DIA, how does it work?
17 Windows of
12 amu each
SIM 800 – 1000 m/z
17 Windows of
12 amu each
WiSIM DIA Method Set-up at a glance:
6 experiments:
SIM
X3
X3
4
•
•
•
•
•
•
400-600, 600-800, 800-1000 m/z
200 amu ion trap isolation width
Resolution@ 240 000
AGC: 3e4
50 ms Max injection
Profile
tMS2
•
•
•
•
•
•
•
12 amu quadrupole isolation
150-1850 m/z mass range
Ion Trap detection
AGC: 5e4
35 ms Max Injection
CID 30
Rapid Scan rate
406
514
606
714
806
914
418
526
618
726
818
926
430
538
630
738
830
938
442
550
642
750
842
950
454
562
654
762
854
962
466
574
666
774
866
974
478
586
678
786
878
986
490
598
690
798
890
998
502
702
902
WiSIM DIA Method Set-up:
6 experiments:
-Three HR/AM tSIM
-Three Ion trap tMS2 CID
5
Experiment 1:
SIM 400-600 amu
406 418 430 442
6
SIM 600-800 amu
598
606 618 630 642
SIM 800-1000 amu
898
806 818 830 842
998
Experiment 2:
SIM 400-600 amu
406 418 430 442
7
SIM 600-800 amu
598
606 618 630 642
SIM 800-1000 amu
898
806 818 830 842
998
Experiment 2:
SIM 400-600 amu
406 418 430 442
8
SIM 600-800 amu
598
606 618 630 642
SIM 800-1000 amu
898
806 818 830 842
998
Experiment 3:
SIM 400-600 amu
406 418 430 442
9
SIM 600-800 amu
598
606 618 630 642
SIM 800-1000 amu
898
806 818 830 842
998
Experiment 4:
SIM 400-600 amu
406 418 430 442
10
SIM 600-800 amu
598
606 618 630 642
SIM 800-1000 amu
898
806 818 830 842
998
Experiment 4:
SIM 400-600 amu
406 418 430 442
11
SIM 600-800 amu
598
606 618 630 642
SIM 800-1000 amu
898
806 818 830 842
998
Experiment 5:
SIM 400-600 amu
406 418 430 442
12
SIM 600-800 amu
598
606 618 630 642
SIM 800-1000 amu
898
806 818 830 842
998
Experiment 6:
SIM 400-600 amu
406 418 430 442
13
SIM 600-800 amu
598
606 618 630 642
SIM 800-1000 amu
898
806 818 830 842
998
Experiment 6:
SIM 400-600 amu
406 418 430 442
14
SIM 600-800 amu
598
606 618 630 642
SIM 800-1000 amu
898
806 818 830 842
998
WiSIM-DIA advantages
• Low detection limits, high selectivity is achieved using
240,000 SIM scan.
• High sensitivity Ion Trap CID MS2 is used for confirmation of
the low abundant components.
• Unsurpassed speed with 2 detectors working in parallel
allows for 3.6 s cycle.
• LOD and LOQ down to 10 attomole.
• CVs are better than 15 % for 85 % of compounds, better than
20% for 95% of compounds.
• Linear dynamic range up to 4 orders of magnitude.
15
For More details, please see
http://planetorbitrap.com/orbitrap-fusion-tips
And:
Application Note 600
16