Transcript Document
P326 Gigatracker Pixel Detector • Requirements – material budget, time resolution, radiation hardness,... • • • • Hybrid pixels: sensor, readout chip, bump bonding Electronics system (Mechanics and) Cooling Resources - Workplan • Possible interest in R&D for CLIC 04/10/06 G. Stefanini/LC WG/P326/GTK 1 P326 Proposal • 10-11 branching ratio • high intensity K beam • high background rejection • ≈ 5.1012 K decays/year • ≈ 100 events by 2011 04/10/06 G. Stefanini/LC WG/P326/GTK 2 P326 Beam Tracking, momentum, time stamp • • • • modified NA48 K12 beam line 3.1012 protons on target (400GeV) ==> 60% pions, 20% protons, 14% electrons, 6% kaons overall particle rate ≈ 0.8GHz ==> “Gigatracker” beam cross-section ≈ 12cm2 at GTK 04/10/06 G. Stefanini/LC WG/P326/GTK 3 GTK Si Pixels P. Riedler 04/10/06 G. Stefanini/LC WG/P326/GTK 4 Required Gigatracker time resolution P(>1hit in Dt) =1-exp(-Dt*rate) Dt ( ±2s) @0.8GHZ @1GHZ 400 27% 33% 500 33% 39% 600 38% 45% K+ p+p0 Dependence of the signal to background (from K+ p+p0 ) as a function of the gigatracker time resolution 04/10/06 5 Material Budget Requirements • Full GEANT simulation • Impact of GTK material budget – – – – beam momentum resolution angular beam resolution vertex resolution missing mass • No significant degradation at ≈ 0.5%Xo per plane 04/10/06 G. Stefanini/LC WG/P326/GTK 6 Radiation Levels in Gigatracker (GTK) • Calculated fluence ≈ 2. 1014 (1 MeV neq cm-2) 100 days • For comparison: • ATLAS SCT/CMS TK ≈ 1.5 1014 (1 MeV neq cm-2) 10 years • Safety factors in estimates 04/10/06 G. Stefanini/LC WG/P326/GTK 7 GTK Hybrid Pixel Design Parameters (Preliminary) hybrid pixels • Pixel cell size • Sensor thickness 300mm x 300mm 200mm – charge collection time vs signal amplitude • • • • • Pixel chip thickness Bump bonding Material budget Operating temp. Cooling 04/10/06 ≤ 100mm Pb-Sn ≈ 0.4% X0 (each station) T ≤ 5 °C (in vacuum) ≈ 120mm CF radiator/support with peripheral cooling G. Stefanini/LC WG/P326/GTK 8 Si Sensors • Radiation effects – type inversion (higher Vb required) – leakage current increase DIvol=a fne (a ≈ 5 x 10-17 A/cm) Remedies – M-CZ material (to be studied) – operation at low(er) temp (in vacuum...) I exp(-Eg/2kT) (up to ≈ 200mA/cm2 @ 25 °C ) DI reduction ≈ 16x @ 0 °C – periodic replacement of station 04/10/06 G. Stefanini/LC WG/P326/GTK 9 GTK Pixel ASIC • Technology: CMOS8 (0.13mm) – speed, density, power, (radiation hardness) – availability/obsolescence, MPW access – cost (prototyping, engineering run) – frame contract at CERN for applications within the HEP community • Conceptual study well advanced – definition of system architecture – noise (mixed-signal application) – upcoming MPW submission of functional blocks (amplifier, discriminator, TDC, ...) ALICE pixel ASIC (CMOS6 0.25mm) 8,192 pixel cells 04/10/06 G. Stefanini/LC WG/P326/GTK 10 Bump Bonding • Bump bonding of 150mm pixel chips to 200mm sensors: in volume production (ALICE SPD 107 pixels) – Pb-Sn (VTT/Finland) • Thinning of pixel wafers (D=200mm) is done after bump deposition • Thinning/bb to 100mm (or less) requires prototyping • Preliminary test under way with ALICE pixel dummy wafers • Key issue: flatness of sensors 04/10/06 G. Stefanini/LC WG/P326/GTK Pb-Sn ~20-25µm ©VTT 11 Readout Wafer Thinning 200mm Si wafer thinned to 150 mm J. Salmi/VTT BOND’03 CERN 04/10/06 G. Stefanini/LC WG/P326/GTK 12 Chip Size - Power Management • Power dissipation up to 2W/cm2 (preliminary estimate) • Material budget constraints on coverage of beam area • Lowest material budget with only pixel matrix in beam – I/O pads and cooling at periphery • This leads to power management problems • Beam cross section adjusted (≈ rectangular) to ease matching of optimized chip layout – without degradation of beam quality 04/10/06 G. Stefanini/LC WG/P326/GTK 13 Configuration I • Highest rate QuickTime™ and a TIFF (Uncompressed) decompressor are needed to see this picture. Pads for power supplies and clock (additional material budget) 04/10/064 July, 2006 A. Kluge 14 Configuration II Max rate on one chip, but chip smaller QuickTime™ and a TIFF (Uncompressed) decompressor are needed to see this picture. 04/10/064 July, 2006 A. Kluge 15 Configuration IV 60 mm 6 mm 12 mm Quic kTime™ and a TIFF ( Unc ompres s ed) dec ompr es sor are needed to s ee this pic ture. 04/10/064 July, 2006 A. Kluge 24 mm 16 Time Stamp • Fast discriminator with time walk compensation is key element • TDC bin size 100ps • TDC options – one TDC per pixel cell (linear discharge) • cell area, power dissipation, dead time – group multiplexed TDC • efficiency loss (must be limited to <2%) 04/10/06 G. Stefanini/LC WG/P326/GTK 17 Chip size/data rate • With a beam of 24 x 60 mm -> 2 x 5 chips • Assume chip matrix of 40 rows x 40 columns: 12 mm x 12 mm = 144 mm2 • Pixel size 300 um x 300 um – => 40 x 40 pixels = 1600 pixels • Avg Rate of center column: ~ 96 MHz/cm2 – => 86 kHz/pixel – => 138 MHz/chip – => 138 MHz/chip * ~ 32 bit = ~4.4 Gbit/s 04/10/064 July, 2006 A. Kluge 18 Cooling • • • • • Power dissipation (pixel plane) ≈ 20W Operating temperature < 5 °C (==> sensor leakage current) CF radiator fins coupled to cooling circuit Adhesive/filler (≈ 50mm) thermal conductivity ≈ 1 W/(m K) Cooling system options – fluid coolant – evaporative cooling • C4F10 • C4F8 – Peltier cell ? 04/10/06 G. Stefanini/LC WG/P326/GTK 19 Carbon Fibre (CF) Composites • CTE (ppm/K) ≈ -1.5/+12 • Th. conductivity (W/m K) ≈ 150 ≈ 1,000 ≈ 390 ≈ 145 • Density (g/cm3 ) ≈ 1.9/2.2 • X0 (g/cm2) • • 2-ply radiator thickness ≈ 42 04/10/06 ≈ 120 mm G. Stefanini/LC WG/P326/GTK (M55J) (K-1,100) (Cu) (Si @ T=300K) (≈ 21 cm) (≈ 9.36cm for Si) 20 Initial Situation • Case A: without cooling plane • Case B: with cooling plane and with different thermal contact resistances between the solids Case Cooling plane Thermal conductivity k [W/(cm K)] B1 Toray M55J 1.5 B2 Carbon-Carbon 2.5 B3 Thornel 8000X panels 8.0 B4 Thornel K-1100 10.0 • Total Heat Load of 2 W/cm² 04/10/06 21 Results with ideal contact between materials Case A B1 B2 B3 B4 04/10/06 22 Temperature gradient of the Silicon Pixel detector in dependence of the thermal conductivity of the cooling plane 80 70 60 50 Temperature gradient [K] 40 30 20 10 0 0 2 4 6 8 10 12 14 Thermal conductivity, cooling plane [W/(cm K)] 04/10/06 23 Results with thermal resistance between materials 04/10/06 24 Influence of the thermal resistance • It is quite difficult to calculate the real thermal resistance of the contact surfaces between the materials. • Differences between hand calculation and CFD-Simulation, show the influence of the bumps. Case A B1 B2 B3 B4 ΔT, hand calculation 72.0 54.0 46.3 25.9 22.3 ΔT, CFD-Simulation 80.0 59.6 49.5 26.6 23.7 ΔT with thermal contact resistance Rt,c= 0.2 x 10-4 m2K/W -- -- -- 33.9 28.4 ΔT with thermal contact resistance Rt,c= 0.9 x 10-4 m2K/W -- -- -- 37.5 31.6 04/10/06 25 Detector Development Team (Very preliminary) Sensors Analog electronics Electronic system & integration CERN INFN Ferrara CERN INFN Torino CERN INFN Ferrara INFN Torino 1 Phys Staff, 1 Fellow 1 PostDoc (tbc) 1 Eng, 1 Fellow (but...) 2 Eng 1 Eng (tbd) (tbd) • CERN staff (sensors and system) for the time being fully committed to LHC activities (ALICE SPD) ==> 2 FELL/DOCT student required (1 already available) • Mechanics & cooling 04/10/06 CERN), Ferrara G. Stefanini/LC WG/P326/GTK 26 Planning (Preliminary) • • • • • • System architecture def. & simulation Small scale prototype submission Engineering run 1 submission Engineering run 2 submission Production of final chip Detector assembly H1 YR1 ≈ Q3 YR1 ≈ Q2 YR2 ≈ Q2 YR3 ≈ Q1 YR4 ≈ Q3 YR4 • YR1 start of PH support & funding 04/10/06 G. Stefanini/LC WG/P326/GTK 27