Transcript PowerPoint

A Transverse Profile Imager for SwissFEL
Rasmus Ischebeck
A Transverse Profile Imager for SwissFEL
> Profile measurement in FELs
> Imaging scintillating crystals
> Applications
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Transverse Profile Monitors
Rasmus Ischebeck
University of Illinois 3
Profile Measurement in FELs
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Coherent OTR
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Joe Frisch 5
Coherent OTR
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Joe Frisch 6
1-Dimensional Profile Monitor
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Gian Luca Orlandi, Prajwal Mohanmurthy 8
x-y Correlations
> Intrinsic correlation
> Explicit x-y dependency introduced by RF deflector
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A Transverse Profile Imager for SwissFEL
> Profile measurement in FELs
> Imaging scintillating crystals
> Applications
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2-Dimensional Profile Monitors
> Optical transition radiation (OTR)
> Scintillation
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Imaging Scintillators
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Electron Beam Profile Monitors
Scintillators, OTR Screens & Wire Scanners
Installed scintillators
• Ce:YAG
• 5 µm
• 20 µm
• 200 µm
• Ce:LuAG
• 200 µm
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Electron Beam Profile Monitors
Visual Light Optics
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OTR screen / scintillator is at an angle of 45º to the optical
axis
For overview camera (1:5.3 demagnification)
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Use Scheimpflug criterion to correct image plane
orientation
For 1:1 imaging
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Perspective control lens is not available commercially
Only central part (~1…2 mm) of the screen can be
imaged within depth of field
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Design Considerations
> Scheimpflug imaging principle
Observation of the Scheimpflug imaging principle
allows to image the entire screen without depthof-field issues.
To avoid astigmatism, the lens is not tilted, but
the detector is tilted. For a 1:1 imaging, we tilt
the CMOS sensor by 15º.
> Snell’s law of refraction
The YAG / LuAG scintillators are observed at such
an angle that Snell’s law of refraction is observed.
As a consequence, we can image beams that are
smaller than the thickness of the scintillator.
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Imaging Scintillating Crystals
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Imaging Scintillating Crystals
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Imaging Scintillating Crystals
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Imaging Scintillating Crystals
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Trigonometry…
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Observed Beam Size
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Ideal Observation Angle
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Measurement Principle
> Combination of two monitors:
> Scintillating crystal
> Optical transition radiation
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Implementation
(coherent)
OTR
to camera
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Screen Monitor
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A Transverse Profile Imager for SwissFEL
> Profile measurement in FELs
> Imaging scintillating crystals
> Applications
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Quadrupole Scan
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Beam Transmitted Through Slit
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Slice Emittance Measurements
> Slice emittance measurement of a 1.3 pC beam
Measurement performed by
Eduard Prat & Marta Divall
200 µm
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Slice Emittance Measurement
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Eduard Prat
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Slice Emittance Measurements
> Core slice emittance as a function of charge
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Measurements performed by
Eduard Prat & Marta Divall
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A Transverse Profile Imager for SwissFEL
> A transverse profile imager that considers
> Snell’s law of refraction in the scintillating crystal
> The Scheimpflug imaging condition
> Prototype installed at the SwissFEL Injector Test Facility
> Resolution measured with this prototype: σ ≲ 10 µm, ε ≲ 30 nm
> Sensitivity: Q ≲ 1 pC
Next Plans
> Prove immunity to coherent OTR
> Start series production
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Thank You to…
> Hansueli for the technical design
> The AMI team for manufacturing the components
> Markus for the assembly
> Markus, Albert & the vacuum group for installation
> Eduard the emittance measurement software, and for using the new profile monitor
extensively for emittance measurements
> Gian Luca, Marta, Simona, Carlo, Thomas & Eduard for the measurements presented in
this talk
> Vincent for help with optical design
> Andrea for support with patenting the design, and with connections to industry
> Helge for camera server software, and Babak for synchronized data acquisition
> The entire Commissioning and Operations crew
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Rasmus Ischebeck