Transcript L75 Laser - Apollo Instruments

Vielitzer Straße 43
95100 Selb
GERMANY
Linseis Inc.
20 Washington Road
P.O.Box 666
Princeton-Jct. NJ 08550
Tel.:
Fax:
Tel.:
Fax:
0049 9287 8800
0049 9287 70488
Email: [email protected]
(609) 799-6282
(609) 799-7739
Email: [email protected]
The Company
Since 1957 Linseis Corporation delivers outstanding service, know how and
leading innovative products in the field of thermal analysis and thermal physical
properties. We are driven by innovation and customer satisfaction. Customer
orientation, innovation, flexibility and last but not least highest quality are what
Linseis stands for from the very beginning. Thanks to these fundamentals our
company enjoys an exceptional reputation among the leading scientific and
industrial companies.
Claus Linseis
Managing Director
The Company
Linseis Germany
Vielitzerstr. 43
95100 Selb
Linseis USA
08550
Princeton Jct. / NJ
ASTM E 289
This test method covers the determination of linear thermal
expansion of rigid solids using either a Michelson or Fizeau
interferometer.
The precision of measurement of this absolute method (better
than ±40 nm/(m·K)) is significantly higher than that of
comparative methods such as push rod dilatometry (for
example, Test Methods D 696 and E 228) and
thermomechanical analysis (for example, Test Method E 831)
techniques. It is applicable to materials having low and either
positive or negative coefficients of expansion
Coefficient of Expansion
Definition of the Coefficient of Thermal Expansion
(CTE) The coefficient of thermal expansion is generally defined as
the fractional increase in length per unit rise in temperature. The
exact definition varies, depending on whether it is specified at a
precise temperature (true coefficient of thermal expansion) or over a
temperature range (mean coefficient of thermal expansion). The
former is related to the slope of the tangent to the length –
temperature plot, while the latter is governed by the slope of the
chord between two points on this curve. Considerable variation in
the value of the CTE can occur according to the definition employed.
L75 – LASER DILATOMETER
Features
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Michelson Principle Laser Dilatometer
Non contact expansion and shrinkage measurement
No calibration needed
Any solid sample material (reflecting & not reflecting)
Free choice of sample geometry
Sample preparation same as with conventional Dilatometer
Measurements under inert, oxid., red., vacuum
Maximum precision 0,3 Nanometer
temperature range -180 up to 1600°C (different furnaces)
Induction and heat resistance furnace possible
L75 – LASER
The System
Unmatched resolution and
absolute accuracy is now
possible due to the new
development of the Linseis
Laser Dilatometer of the Picoseries.
The system consists of three
main components:
• The Michelson Interferometer
• The measuring system
• The furnace
The Michelson Interferometer
The used double plane-mirror
interferometer is used for
simultaneously making pairs of
nanoprecision length
measurements.
The He-Ne lasers, which is
frequency stabilized on the
used model, was specifically
designed for making longer
length measurements, along
with corrections for
environmental shifts in laser
wavelength, thus providing the
basis for the unbeaten metric
precisions.
The Measuring System
Dilatometer of the Pico-series. As the
name indicates already the resolution
goes up to Picometers (0,3nm = 300
Picometer). That means resolutions
can be obtained which are up to a
factor 33,33 higher as the resolution
that were possible up to date. On top
the principle of interference
measurement give the possibility for
much higher accuracy’s, especially as
some special computer calibrations are
used. Up to now absolute accuracy’s of
1% were normal, with best accuracy’s
up to 100nm. The new method allows
accuracy’s up to 30nm.
L75 Laser 500LT
Laser Dilatometer with low
temperature furnace
Temperature : -150 …500°C
Interferometer
Furnace
Gas Control
Interferometer
Electronics
L75 Laser
Laser Dilatometer with Induction Furnace
Temperature :
-150 …1000°C
-150 …1600°C
Heat up and cool down speed 100K/s
Iron Sample
The Furnaces
Resistance Furnace
Induction Furnace
The system can be equipped with
conventional resistance furnaces
with a temperature range from:
The system can be equipped with
an induction furnaces with a
temperature range from:
• -150 …500°C
• RT …1000°C
• -150 …1000°C
• -150 …1600°C
Applications
Reproducibility of an INVAR Sample
An INVAR Sample was
evaluated four times
during heating in an air
atmosphere. The
temperature range was
room temperature up to
200°C. The difference of
the four measurements
was as low as 0.01% FS.
Applications
Measurement of fused silica, NIST SRM739
*“Soll” represents the NIST value
Applications
Measurement of sapphire, cutting angle 0° to C-Axis
*“Soll” represents the literature value
Applications
Measurement of Copper, NIST SRM736
*“Soll” represents the NIST value
Applications
Measurement of polycrystalline Al2O3, Purity 99.7%
*“Soll” represents the literature value
Applications
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Precision measurement of thermal expansion of low expansion
materials such as: carbon, graphite, composites, low expansion glass,
amber alloy, quartz glass, etc.
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Precision measurement of thermal expansion of semiconductor
materials.
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Quality control and quality inspection of materials of which thermal
expansion characteristics can be a problem, such as glass, sealing
materials, bimetals, materials for precision electronic instruments etc.