Transcript EN/ICE/PLC

Time Stamping and archiving
of PLC data
II Workshop on PLC-based interlocks systems
ITER, Dec 2014
Jeronimo ORTOLA VIDAL
CERN Engineering Department, Industrial Controls Group
Industrial Controls
Engineering Department
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UNICOS CPC overview
TSPP overview
TSPP manager
Performance
Highlights
Outline
J. Ortola (CERN, EN/ICE)
December, 2014
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Industrial Controls
Engineering Department
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UNICOS CPC provides libraries (control and
supervision layers)
A well defined set of standard device types (objects),
modeling most of the equipment and needs of
continuous processes and the relationships between
them
A formalized way of :
• Define the control units of a process (ISA-88
standard: Batch processes)
• Programming the specific process logic for those
units
UNICOS CPC
J. Ortola (CERN, EN/ICE)
December, 2014
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Industrial Controls
Engineering Department
• TSPP. Time Stamp Push Protocol
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UNICOS CPC middleware
Time stamp at source (from NTP server)
Event driven
High performance
Available for redundant PLC architectures.
• Currently available for
• Siemens S7 300, S7 400 (S7 1200, S7 1500 in preparation)
• Schneider
• Beckhoff (Codesys)
TSPP overview
J. Ortola (CERN, EN/ICE)
December, 2014
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Industrial Controls
Engineering Department
• TSPP requisites
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S7 driver for S7 PLCs
Modbus driver for Schneider and Beckhoff
TSPP layer at the SCADA level (currently only WinCCOA)
OPC UA client (coming soon) with SimaticNET
TSPP overview
J. Ortola (CERN, EN/ICE)
December, 2014
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Industrial Controls
Engineering Department
TSPP PLC manager
J. Ortola (CERN, EN/ICE)
December, 2014
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Industrial Controls
Engineering Department
Redundancy
J. Ortola (CERN, EN/ICE)
December, 2014
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Industrial Controls
Engineering Department
Performance tests
J. Ortola (CERN, EN/ICE)
December, 2014
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Industrial Controls
Engineering Department
Performance
J. Ortola (CERN, EN/ICE)
December, 2014
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Industrial Controls
Engineering Department
• Time Stamp at source per UNICOS CPC object (same for
each table)
• Data filtered and encapsulated in the PLC.
• Large buffer of events to prevent data loss.
• Reliability
• High performance
Highlights
J. Ortola (CERN, EN/ICE)
December, 2014
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