Transcript D8 DISCOVER with GADDS

This is powder diffraction!
Calcite, Aragonite, Brucite
12000
11000
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Lin (Counts)
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2-Theta - Scale
Calcite, A ragonite, B rucite - File: m1.R A W - Type: 2Th/Th locked - S tep: 0.020 ° - S tep time: 10.0 s - Theta: 1.000 °
Operations: Import
Peter J. LaPuma1
© 1998 BRUKER AXS, Inc. All Rights Reserved
This is powder diffraction!!!!
Calcite, Aragonite, Brucite
12000
11000
10000
Lin (Counts)
9000
8000
7000
6000
5000
4000
3000
2000
1000
0
10
20
30
40
50
60
70
2-Theta - Scale
Calcite, A ragonite, B rucite - File: m1.R A W - Type: 2Th/Th locked - S tep: 0.020 ° - S tep time: 10.0 s - Theta: 1.000 °
Operations: Import
Peter J. LaPuma2
© 1998 BRUKER AXS, Inc. All Rights Reserved
D8 DISCOVER WITH GADDS
 Powders
 Speed
 Texture
 Versatility
 Micro-diffraction
 Power
 Stress
 Precision
 SAXS
 Accuracy
Peter J. LaPuma3
© 1998 BRUKER AXS, Inc. All Rights Reserved
Single Crystal Diffraction
Peter J. LaPuma4
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2-D Single crystal data
Peter J. LaPuma5
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Micro-Diffraction
Peter J. LaPuma6
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2-D Micro-diffraction data
Peter J. LaPuma7
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Diffraction of textured materials
Peter J. LaPuma8
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2-D Texture data
Peter J. LaPuma9
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Powder Diffraction
Peter J. LaPuma10
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Powder diffraction data
Peter J. LaPuma11
© 1998 BRUKER AXS, Inc. All Rights Reserved
General Area Detector Diffraction
Solution
 2-D position sensitive
detector
 Collects data from the entire
Debye ring without moving
 True Photon counter
 200 micron spatial
resolution
 Variable detector distances
50 - 300 mm for resolution
or intensity
Peter J. LaPuma12
© 1998 BRUKER AXS, Inc. All Rights Reserved
Point detector vs. area detector
Peter J. LaPuma13
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Point detector vs. area detector
Peter J. LaPuma14
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Point detector vs. area detector
Peter J. LaPuma15
© 1998 BRUKER AXS, Inc. All Rights Reserved
Point detector vs. area detector
Peter J. LaPuma16
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D8 DISCOVER with GADDS
 Real and useable intensity data from preferentially
oriented samples
 Single crystal, textured, and non-textured materials can be
collected simultaneously in minutes
 Small sample amounts can be measured quickly with real
intensities
 Large quantities of data and information with little or no
sample movement
Peter J. LaPuma17
© 1998 BRUKER AXS, Inc. All Rights Reserved
D8 Discover with GADDS - Applications
 Powder diffraction
 Texture
 Stress
 Micro-diffraction
 SAXS
Peter J. LaPuma18
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Basic Configuration - Beam Path
Peter J. LaPuma19
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D8 DISCOVER with GADDS
Basic Configuration
Peter J. LaPuma20
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Powder Diffraction
 Analyze 70 deg. of 2 theta
without moving the
detector
 Collect full patterns in
seconds
 Intensity integration
removes preferred
orientation effects
 Integration converts data
into 2theta vs. intensity
 Phase ID from small
sample amounts
Peter J. LaPuma21
© 1998 BRUKER AXS, Inc. All Rights Reserved
Powder diffraction - Analysis
 Advanced phase
identification with to PDF
database
 Quantitative analysis
 Percent crystallinity
 Crystallite size and strain
 Profile fitting
 Lattice parameter
indexing and refinement
 Direct cut and paste into
reports
Peter J. LaPuma22
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Texture analysis
a)
b)
c)
Peter J. LaPuma23
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Texture analysis - Speed
 Simultaneous measurement of single crystal, textured
and untextured materials
 Data for multiple pole figures are collected
simultaneously in minutes
 Chi motion not needed due to 2-D detector
 Peak height and background are collected
simultaneously in one frame
 Scintillation detector
– 1296 separate sample positions
– One pole figure
 D8 DISCOVER with GADDS
– 72 separate sample positions
– Multiple pole figures
Peter J. LaPuma24
© 1998 BRUKER AXS, Inc. All Rights Reserved
Texture data analysis
 User friendly analysis
software for pole figure
representation
 3-D and contour plot
representation of pole
figures
 Calculation of ODF
Peter J. LaPuma25
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D8 DISCOVER with GADDS
all purpose configuration
Peter J. LaPuma26
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Residual stress analysis does not
occur in 1-D
Peter J. LaPuma27
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Residual stress analysis - Full Debye
ring fitting
Peter J. LaPuma28
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Residual stress analysis - Full Debye
ring fitting
Peter J. LaPuma29
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Residual stress analysis - Textured
materials
Peter J. LaPuma30
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Residual stress analysis
 Most accurate stress measurements ever due to full
Debye ring fitting
 Stress in different directions measured with one set
of frames simultaneously
 Peak position height and background from 1 set of
frames
 Stress values with standard deviations as low as 3%
 Stress values from textured materials
Peter J. LaPuma31
© 1998 BRUKER AXS, Inc. All Rights Reserved
Residual stress analysis - Goebel
Mirrors and pinhole collimators
 Cross coupled Goebel
mirrors provide a highly
parallel highly intense Xray beam perfect for
stress analysis
 Pinhole collimators
reduce spot size down to
50 microns
 Coupled with laser /video
alignment system, stress
in sample can be mapped
a function of position
Peter J. LaPuma32
© 1998 BRUKER AXS, Inc. All Rights Reserved
Residual stress analysis - software
 Powerful - user friendly
software
 Easy display of all psi
angles
 Calculations of Sin
squared psi data
 Easy cut and paste into
reports
Peter J. LaPuma33
© 1998 BRUKER AXS, Inc. All Rights Reserved
Micro-diffraction - Beam Path
Peter J. LaPuma34
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D8 DISCOVER with GADDS
Micro-diffraction Configuration
Peter J. LaPuma35
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Micro-diffraction - Laser video
alignment
Peter J. LaPuma36
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Laser - Video Alignment
Peter J. LaPuma37
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Micro-diffraction
 Diffraction from points as small as 50 microns
 Easy sample alignment and positioning with X,Y,Z
stage and Laser-video microscope
 Laser-video image on the computer screen with cross
hairs
 Patterns with accurate relative intensities due to data
integration
 Highly parallel, highly intense X-ray beam due to
Goebel Mirrors
 Highly intense X-ray beam due to MonoCapTM
Collimator
 Diffraction data can be analyzed by phase
identification, profile fitting, quantitative analysis, etc.
Peter J. LaPuma38
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Small Angle X-ray Scattering
Peter J. LaPuma39
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Small Angle X-ray Scattering
Peter J. LaPuma40
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Small Angle X-ray Scattering
 Cross-coupled Goebel mirrors for highly intense
parallel beam
 Evacuated or He beam path for reduction of air scatter
 D8 DISCOVER with GADDS system measures isotropic
and anisotropic scattering
 SAXS has very low signals due to transmission
measurements - perfect for D8 DISCOVER with GADDS
Peter J. LaPuma41
© 1998 BRUKER AXS, Inc. All Rights Reserved
D8 Discover with GADDS
 More information faster
than ever before
 Pinhole collimators and
laser/video microscope
provide micro-diffraction,
micro-stress, microtexture, etc.
 Highly intense and highly
parallel X-rays with
MonoCapTM collimators
and Goebel mirrors
 Most powerful and user-
friendly software available
Peter J. LaPuma42
© 1998 BRUKER AXS, Inc. All Rights Reserved